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IEEE Transactions on Reliability

Issue 1 • Date April 1982

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Displaying Results 1 - 25 of 62
  • [Front cover]

    Publication Year: 1982, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1982, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1982, Page(s): nil1
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  • Employee Participation

    Publication Year: 1982, Page(s): 1
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  • Why a R&M Program?

    Publication Year: 1982, Page(s): 1
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  • I Challenge Your Beliefs About Reliability Part I: Risky Beliefs

    Publication Year: 1982, Page(s):2 - 4
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (498 KB)

    This 5-part essay on misunderstandings in R&M (reliability, maintainability, and other `ilities) concepts addresses 22 specific practices and beliefs. Some of the conflicts in theory and application are ventilated frankly, and deliberate efforts are made to stimulate self-analysis by professional R&M specialists as steps toward improving credibility of these Risky Beliefs. This is followed by four... View full abstract»

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  • Landmarks in R&M Engineering: 15 On Interpreting Proposals

    Publication Year: 1982, Page(s): 4
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  • Universal Test Sets for the Standard Encryption Algorithm

    Publication Year: 1982, Page(s):5 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (850 KB)

    This paper describes the test sets that were devised at the US National Bureau of Standards (NBS) for hardware implementations of the standard encryption algorithm. These tests consist of a validation test set, which is being used at NBS to certify the correctness of vendors' implementations of the algorithm, and a maintenance test set, which can be used to ensure reliability in the operation of s... View full abstract»

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  • Testing for MOS IC Failure Modes

    Publication Year: 1982, Page(s):9 - 18
    Cited by:  Papers (25)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1916 KB)

    The failure modes of MOS technology are described with emphasis on recent trends in LSI. Failures are classified into short, open, degradation, and soft recoverable errors. The following failure modes are covered: oxide breakdown caused by static discharge and time-dependent effects; metallization failures caused by electromigration or corrosion; threshold voltage shifts caused by ionic contaminat... View full abstract»

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  • Call For Papers

    Publication Year: 1982, Page(s): 18
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  • Thermal Design of Electronic-Circuit Layout For Reliability

    Publication Year: 1982, Page(s):19 - 22
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (628 KB)

    A method for laying out electronic components on back board, which minimizes the maximum temperature rise of components is presented. This avoids hot spots on the board. Sensitivity analysis is adopted for optimal placement of components on the circuit board and certain relations are derived with a view to reduce the computational effort of sensitivity analysis. View full abstract»

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  • A Unified Formula for Analysis of Some Network Reliability Problems

    Publication Year: 1982, Page(s):23 - 32
    Cited by:  Papers (86)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1540 KB)

    A topological formula is derived for solving a variety of network reliability problems such as vertex-to-vertex communication from a source to a terminal; from a source to some specified subset of the vertices or else all vertices; between any given vertex-pair; between all vertex-pairs within a given subset of the vertices; or else between all vertex-pairs. The formula applies to networks consist... View full abstract»

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  • Recursive Disjoint Products: A Review of Three Algorithms

    Publication Year: 1982, Page(s):33 - 35
    Cited by:  Papers (40)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (593 KB)

    Disjoint Products (DP) applied to 2-terminal system reliability recursively partitions the logic polynomial into nonintersecting terms. Each step represents the incremental contribution of one minimal state. Three different DP algorithms for s-coherent systems were published. This paper develops the theory common to all three algorithms, and also shows those respects in which they differ from one ... View full abstract»

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  • Book Review

    Publication Year: 1982, Page(s): 35
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  • Improved Method of Inclusion-Exclusion Applied to k-out-of-n Systems

    Publication Year: 1982, Page(s):36 - 40
    Cited by:  Papers (26)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (783 KB)

    The method of inclusion-exclusion is represented in general form for reliability analysis. Applying it to the reliability of k-out-of-n system causes many cancelling terms. The method is improved to use only noncancelling terms in evaluating bounds on the reliability of k-out-of-n systems. These bounds are appreciably better, and converge to the exact system reliability in at most n ¿¿ k + 1 steps... View full abstract»

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  • Manuscripts Received

    Publication Year: 1982, Page(s): 40
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  • A Simple Technique for Computing Network Reliability

    Publication Year: 1982, Page(s):41 - 44
    Cited by:  Papers (30)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (637 KB)

    A tree construction technique to compute a reliability expression of a network is derived. The technique is straight forward and good for both directed and undirected graphs. It gives mutually disjoint success branches. The reliability expression of each branch can be directly written by a set of rules. The reliability of the network can then be obtained by taking the direct sum of the reliabiliti... View full abstract»

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  • Our Past Editors

    Publication Year: 1982, Page(s): 44
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  • An Improved Moment-Matching Algorithm for Evaluating Top-Event Probability Bounds

    Publication Year: 1982, Page(s):45 - 48
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (650 KB)

    This paper proposes improvements in the momentmatching algorithm developed by Apostolakis & Lee (A&L algorithm). The moment-matching method in the A&L algorithm evaluates reliability uncertainty by: 1) assuming that system reliability is governed by the Johnson SB distribution; and 2) calculating reliability bounds by using the moment-matching method, given the reliability mean value and variance.... View full abstract»

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  • Book Reviews

    Publication Year: 1982, Page(s): 48
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  • Quadrilateral-Star Transformation: An Aid for Reliability Evaluation of Large Complex Systems

    Publication Year: 1982, Page(s):49 - 50
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (305 KB)

    Although delta and star transformations are usually adequate for reliability evaluation, they can fail for some complex networks. Under these conditions the quadrilateral-star transformation introduced in this paper can be used with success. The quadrilateral-star transformation is not exact; however, it yields results having adequate accuracy. View full abstract»

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  • Comments on "A Compilation Technique for Exact System Reliability" - I

    Publication Year: 1982, Page(s):51 - 52
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (305 KB)

    First Page of the Article
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  • Comments on "A Compilation Technique for Exact System Reliability" - II

    Publication Year: 1982, Page(s): 52
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (135 KB)

    The K.K. Lee algorithm incorrectly evaluates system reliability when the system model contains replicated events. View full abstract»

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  • Consecutive-k-out-of-n: F Networks

    Publication Year: 1982, Page(s):53 - 56
    Cited by:  Papers (63)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (531 KB)

    This paper develops a counting scheme for determining the reliability of a consecutive-k-out-of-n:F network. An example of such a network, a set of tables, and a comparative example are provided. View full abstract»

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  • Book Review

    Publication Year: 1982, Page(s): 56
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu