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IEEE Transactions on Reliability

Issue 5 • Date Dec. 1980

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Displaying Results 1 - 25 of 52
  • [Front cover]

    Publication Year: 1980, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1980, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1980, Page(s): nil1
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  • Models For Failures

    Publication Year: 1980, Page(s): 353
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  • Born Different?

    Publication Year: 1980, Page(s): 353
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  • Methods for Probabilistic Analysis of Noncoherent Fault Trees

    Publication Year: 1980, Page(s):354 - 360
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1141 KB)

    Four methods for the probabilistic analysis of s-coherent fault trees are investigated concerning their applicability to noncoherent fault trees. The inclusion-exclusion and min-max bounds can be extended to noncoherent fault trees, while the minimal cut (path) set bounds cannot. When a fault tree is modularized, the application of the min-max bounds or the inclusion-exclusion upper bound to both ... View full abstract»

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  • Manuscripts Received

    Publication Year: 1980, Page(s): 360
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  • Probabilistic Evaluation of Prime Implicants and Top-Events for Non-Coherent Systems

    Publication Year: 1980, Page(s):361 - 367
    Cited by:  Papers (33)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1048 KB)

    This paper develops a rigorous method for obtaining 1) the existence probability (unavailability) and 2) the unconditional occurrence (failure) intensity (s-expected number of occurrences per unit time) for prime implicants and top-events of non-coherent systems. It is shown that repair and maintenance policies for non-coherent systems must be carefully formulated since, for example, component rep... View full abstract»

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  • Free proceedings

    Publication Year: 1980, Page(s): 367
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  • Recursive Disjoint Products, Inclusion-Exclusion, and Min-Cut Approximations

    Publication Year: 1980, Page(s):368 - 371
    Cited by:  Papers (27)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (724 KB)

    Three different ways to estimate the reliability of an s-coherent system are compared: 1) recursive disjoint products (DP), 2) recursive inclusion-exclusion (IE), and 3) minimal-cut approximations based on partial information. The following three points are made. 1. Recursive DP and recursive IE are mathematically identical and obtain the same numerical values at each step of the recursion, althou... View full abstract»

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  • A Cut Set Method for Reliability Evaluation of Systems Having s-Dependent Components

    Publication Year: 1980, Page(s):372 - 375
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (656 KB)

    The cut set method presently assumes components to be s-independent. This paper presents a method called MCS approach for extending the cut set approach to systems involving s-dependencies. The method is based on MCS theorem and consists in decomposing the system by cut sets and using the Markov processes for calculating terms in the cut set equations. The Markov process associated with only the m... View full abstract»

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  • Landmarks in R&M Engineering: #9 On Automation

    Publication Year: 1980, Page(s): 375
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  • State-Transition Monte Carlo for Evaluating Large, Repairable Systems

    Publication Year: 1980, Page(s):376 - 380
    Cited by:  Papers (24)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (695 KB)

    This paper presents a new Monte Carlo method to estimate unreliabilities of large, repairable systems which can be modeled by a stationary Markov transition diagram. Sequences of state transitions ending at absorbing states are generated, using random numbers. Times to transitions related to the state-sequences are not generated. Next, the probability of system failure occurring in a mission time ... View full abstract»

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  • Manuscripts Received

    Publication Year: 1980, Page(s): 380
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  • A New Technique for Depot and Sub-Depot Spares

    Publication Year: 1980, Page(s):381 - 386
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1057 KB)

    This paper presents work in analyzing the combined spares provisioning implementation for depot and sub-depots. A method was developed for obtaining the minimum number of depot plus sub-depot spares. Not only is the number of spares important, but their cost as well. In order for the sub-depot model to achieve the savings in spares, a large number of depots (depots plus sub-depots) will be require... View full abstract»

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  • Manuscripts Received

    Publication Year: 1980, Page(s): 386
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  • Logistics Availability for Sites with Periodic or Random Resupply

    Publication Year: 1980, Page(s):387 - 391
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (814 KB)

    Logistics Availability (AL), the probability that a system is not in a spares delay downstate at any instant of time, is a basic element of Operational Availability. Formulas for AL for serial systems of assemblies are derived. Each assembly has exponential times to failure and is supported by a spares inventory that is either periodically resupplied or resupplied as-needed (an order is placed fol... View full abstract»

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  • Book Review

    Publication Year: 1980, Page(s): 391
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  • Multi-echelon Multiple Criteria Spares Allocation

    Publication Year: 1980, Page(s):392 - 396
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (806 KB)

    This paper presents an approach for allocating spares on three echelons to increase system reliability and decrease plant down-time in a cost-effective manner. The usual assumptions are made: a) the demands for spares have the Poisson distribution with known demand rates, b) all the failures of plant parts are s-independent, c) for the plant to be operating, all parts must be operating, thus formi... View full abstract»

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  • Book Review

    Publication Year: 1980, Page(s): 396
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  • Confidence Regions for Distribution Bounds

    Publication Year: 1980, Page(s):397 - 400
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (613 KB)

    This paper considers the problem of constructing an s-confidence region for a pair of parameters which together mark the bounds of a distribution. The problem is solved, and a table provided, for a rectangular distribution; the solution is then generalized. View full abstract»

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  • Book Reviews

    Publication Year: 1980, Page(s): 400
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  • Admissible, Minimax and Equivariant Estimators of Life Distributions from Type II Censored Samples

    Publication Year: 1980, Page(s):401 - 405
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (748 KB)

    In life testing, the unique minimum variance unbiased estimator (MVUE) ¿ is often used when it exists. However it has been shown for certain distributions that an estimator of the form k¿ with uniformly smaller mean square error exists. Such extimators are derived here for a class of life distributions and are shown to be admissible, minimax, and (in most cases) equivariant. The underlying distr... View full abstract»

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  • Book Review

    Publication Year: 1980, Page(s): 405
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  • Prediction Intervals for IFR Distributions

    Publication Year: 1980, Page(s):406 - 409
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (659 KB)

    Several prediction intervals for the class of increasing failure rate distributions are obtained. They extend some known results on 1-or 2-parameter exponential distributions. The use of these results requires no new tables. View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu