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IEEE Transactions on Reliability

Issue 2 • Date June 1980

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Displaying Results 1 - 25 of 52
  • [Front cover]

    Publication Year: 1980, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1980, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1980, Page(s): nil1
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  • Editorial The Tyranny of Tools

    Publication Year: 1980, Page(s): 97
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  • A New Approach To Inference From Accelerated Life Tests

    Publication Year: 1980, Page(s):98 - 102
    Cited by:  Papers (21)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (838 KB)

    In a recent paper, the authors have proposed a new approach for making inferences from accelerated life tests. Their approach is appreciably different from those that have been considered in the past, and is motivated by what is actually done in practice. Prior information which is generally available to the engineer is incorporated by adopting a Bayesian point of view. The usual assumptions about... View full abstract»

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  • Manuscripts Received

    Publication Year: 1980, Page(s): 102
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  • Accelerated Life Testing - Step-Stress Models and Data Analyses

    Publication Year: 1980, Page(s):103 - 108
    Cited by:  Papers (196)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (996 KB)

    This paper presents statistical models and methods for analyzing accelerated life-test data from step-stress tests. Maximum likelihood methods provide estimates of the parameters of such models, the life distribution under constant stress, and other information. While the methods are applied to the Weibull distribution and inverse power law, they apply to many other accelerated life test models. T... View full abstract»

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  • Landmarks in R&M Engineering: No. 6

    Publication Year: 1980, Page(s): 108
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  • Acceleration Factors for IC Leakage Current in a Steam Environment

    Publication Year: 1980, Page(s):109 - 115
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1204 KB)

    Leakage current measurements were made across the surface of silicon test chips up to a temperature of 130°C (403°K) and 70% relative humidity (RH) to develop a more accelerated temperature-humidity-bias corrosion test. Several equations were fitted to the data in order to extrapolate the surface conductivity data to operating conditions. A smooth transistion from atmospheric pressure into the p... View full abstract»

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  • Practical Papers

    Publication Year: 1980, Page(s): 115
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  • MIL-STD-781C

    Publication Year: 1980, Page(s): 115
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  • Statistical Demonstration of Fault-Isolation Requirements

    Publication Year: 1980, Page(s):116 - 121
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (870 KB)

    Methods are developed for obtaining the best test for the attribute demonstration testing of fault isolation requirements. Because fault isolation requirements are generally stated in terms of the probabilities of several events the multinomial distribution is used. Tables of required sample sizes are given for numerous commonly used cases. It turns out that the normal approximation to the multino... View full abstract»

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  • Book Review

    Publication Year: 1980, Page(s): 121
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  • Dagger-Sampling Monte Carlo For System Unavailability Evaluation

    Publication Year: 1980, Page(s):122 - 125
    Cited by:  Papers (44)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (651 KB)

    Reliability problems usually result in rare-event simulations, and hence direct Monte Carlo methods are extremely wasteful of computer time. This paper presents a new application of ``dagger-sampling'', for calculating the system unavailability of a large complicated system represented by a coherent fault tree. Since a small number of uniform random numbers generate a number of trials, dagger-samp... View full abstract»

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  • A Powerful Numerical Method to Combine Random Variables

    Publication Year: 1980, Page(s):126 - 129
    Cited by:  Papers (19)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (790 KB)

    The paper proposes a numerical method to combine random variables. The method is based on representing a distribution by a histogram with equal probability intervals. This is an improvement on the Monte Carlo technique. An example is given to illustrate the use of the method in Reliability, involving the evaluation of the top event probability of a fault-tree with s-dependent cut sets. View full abstract»

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  • Manuscripts Received

    Publication Year: 1980, Page(s): 129
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  • Fault Trees, Prime Implicants, and Noncoherence

    Publication Year: 1980, Page(s):130 - 135
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (889 KB)

    The K&H algorithm for finding the p.i.'s of a noncoherent fault tree is too long and complicated for the purpose. The example that was used by K&H to illustrate the algorithm is reworked with known methods to show that alternatives are available that require less work. This correspondence is a series of four letters published as a sequel to a paper by Kumamoto & Henley (K&H) that presented an ``al... View full abstract»

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  • Decomposition Methods for Fault Tree Analysis

    Publication Year: 1980, Page(s):136 - 138
    Cited by:  Papers (24)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (603 KB)

    Some kinds of fault tree analysis are described for which cut set enumeration is inadequate. Modularization leads to more efficient computer programs, and also identifies subsystems which are intuitively meaningful. The problem of finding all modules of a fault tree is formulated as as extension of the problem of finding all ``cut-points'' of an undirected graph. The major result is a FORTRAN prog... View full abstract»

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  • Manuscripts Received

    Publication Year: 1980, Page(s): 138
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  • On Complementation of Pathsets and Cutsets

    Publication Year: 1980, Page(s):139 - 140
    Cited by:  Papers (23)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    This paper suggests a technique for generating the minimal cuts from the minimal paths, or vice-versa, for an s-coherent system. In this method, the path polynomial is expressed in a particular form and then complements of only simpler Boolean functions are required. Examples illustrate the method. View full abstract»

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  • Quantifying Software Validity by Sampling

    Publication Year: 1980, Page(s):141 - 144
    Cited by:  Papers (24)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (711 KB)

    The point of all validation techniques is to raise assurance about the program under study, but no current methods can be realistically thought to give 100% assurance that a validated program will perform correctly. There are currently no useful ways for quantifying how 'well-validated' a program is. One measure of program correctness is the proportion of elements in the program's input domain for... View full abstract»

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  • Book Review

    Publication Year: 1980, Page(s): 144
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  • Confidence Limits for Weibull Regression With Censored Data

    Publication Year: 1980, Page(s):145 - 150
    Cited by:  Papers (34)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (941 KB)

    The response variable in an experiment follows a 2-parameter Weibull distribution having a scale parameter that varies inversely with a power of a deterministic, externally controlled, variable generically termed a stress. The shape parameter is invariant with stress. A numerical scheme is given for solving a pair of nonlinear simultaneous equations for the maximum likelihood (ML) estimates of the... View full abstract»

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  • Book Review

    Publication Year: 1980, Page(s): 150
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  • Goodness-of-Fit Test for Extreme-Value Distribution

    Publication Year: 1980, Page(s):151 - 153
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (480 KB)

    A test of fit for the extreme-value distribution with unknown parameters is adapted from the work of Vasicek. This test, based on sample entropy, has desirable power compared with analogues of some nonparametric tests and the Mann test. The test statistic is easily calculated by use of the coefficient tables for the MVLUE. View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu