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Reliability, IEEE Transactions on

Issue 5 • Date Dec. 1979

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Displaying Results 1 - 25 of 48
  • [Front cover]

    Publication Year: 1979 , Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1979 , Page(s): nil1
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  • [Breaker page]

    Publication Year: 1979 , Page(s): nil1
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  • Engineers or Witch Doctors?

    Publication Year: 1979 , Page(s): 337
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  • What Time Is It?

    Publication Year: 1979 , Page(s): 337
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  • R & M of Socketed ICs

    Publication Year: 1979 , Page(s): 338 - 343
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    This study shows that sockets can be reliable enough in a relatively benign environment for the short-term. Criteria for failure-free performance include 1) operation in a controlled, non-vibration environment, 2) gold-plated, machined sockets, 3) either gold or tin-plated IC leads. Accelerated testing is required to estimate long-term reliability. Numerous federal and commercial systems use socketed integrated circuits (ICs) satisfactorily. Maintainability of circuit boards, ease of equipment upgrading, and simplifying transition from development to production are some of the advantages of sockets. View full abstract»

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  • Book Reviews

    Publication Year: 1979 , Page(s): 343
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  • A Fault Tree Approach to Quality Control by Variables

    Publication Year: 1979 , Page(s): 344 - 352
    Cited by:  Papers (1)
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    Based on the analogy between the events ``component failed'' (in reliability) and ``measurement out of tolerances'' (in quality control) acceptance sampling by variables is investigated when using the measurements made at several check-points for each device to be tested. The joint use of the fault-tree approach (especially in terms of min-cuts and min-paths) and of finite-sample hypothesis testing, leads to estimates of consumer and producer risks of a quality control procedure taking into account the internal design (functional diagram) of each device. As an example, a tuneable frequency multiplier is fully treated. View full abstract»

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  • An Efficient Bottom-up Algorithm for Enumerating Minimal Cut Sets of Fault Trees

    Publication Year: 1979 , Page(s): 353 - 357
    Cited by:  Papers (8)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (861 KB)  

    The paper improves the conventional bottom-up algorithm for enumerating minimal cut sets of fault tree. It is proved that, when the logical product of two reduced sum-of-product forms is expanded by the distribution rule, one need only check if each resulting term is absorbed by some terms of two original sum-of-product forms. The algorithm for executing this process is presented and illustrated by an example. The entire computer program is given in a supplement and the computational results for several examples are presented to demonstrate the efficiency of the algorithm. View full abstract»

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  • Manuscripts Received

    Publication Year: 1979 , Page(s): 357
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  • Calculation of System Reliability by Algebraic Manipulation of Probability Expressions

    Publication Year: 1979 , Page(s): 358 - 363
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (951 KB)  

    The method of synthesis for calculating the reliability of a complex network was developed by Woodcock. However, he experienced some difficulty in properly incorporating s-dependency, and this often necessitated considerable manipulation of the network beforehand. This difficulty is overcome in the present method by working with algebraic expressions involving component failure probabilities, and combining these expressions according to a simple set of rules. Experimental results are encouraging. View full abstract»

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  • Free proceedings

    Publication Year: 1979 , Page(s): 363
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  • Equivalence of a Nonoriented Line and a Pair of Oriented Lines in a Network

    Publication Year: 1979 , Page(s): 364 - 367
    Cited by:  Papers (9)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (539 KB)  

    Equivalence of a nonoriented line and a pair of oriented lines (in the reliability-sene) is examined for four types of networks. Type I has one input node and one output node; type II has one input node and two or more output nodes; type II' has two or more input nodes and one input node; type III has two or more input nodes and two or more output nodes. For types I, II, II', every non-oriented line is equivalent to a pair of oriented lines with equal line-reliability. The result corresponds to the presumption that almost every one has taken for granted. However equivalence of such a replacement is not true for a type III network. View full abstract»

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  • Complex System With Preemptive-Repeat Repair

    Publication Year: 1979 , Page(s): 367
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    This paper evaluates the reliability of a complex system consisting of two units under the assumption that the system fails if it remain inoperable for more than a fixed time interval. View full abstract»

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  • Evaluating the KTI Monte Carlo Method for System Reliability Calculations

    Publication Year: 1979 , Page(s): 368 - 372
    Cited by:  Papers (6)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (944 KB)  

    This paper describes and analyses the Kumamoto, Tanaka, Inoue (KTI) Monte Carlo method for estimating the reliability R of an s-coherent system by bracketing it between deterministic lower and upper bounds, and then positioning R between the bounds as a weighted average of the structure functions of Monte Carlo generated k-vectors. The procedure is illustrated with both a 2-out-of-3 system and a larger example. Some known alternatives are discussed: bracketing R as in KTI, but without Monte Carlo; exact methods; the Esary-Proschan min-cut lower bounds; and Monte Carlo that samples component reliabilities instead of successes or failures. Although KTI has interesting set-theoretic features and is apparently both variance reducing and s-unbiased, each of the alternatives mentioned above is more useful than KTI because it is easier to develop and uses existing general purpose software. View full abstract»

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  • Manuscripts Received

    Publication Year: 1979 , Page(s): 372
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  • Inverting and Minimizing Boolean Functions, Minimal Paths and Minimal Cuts: Noncoherent System Analysis

    Publication Year: 1979 , Page(s): 373 - 375
    Cited by:  Papers (12)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (504 KB)  

    An efficient technique is presented for inverting the minimal paths of a reliability logic diagram or fault tree, and then minimizing to obtain the minimal cuts, or else inverting the minimal cuts for the minimal paths. The method is appropriate for both s-coherent and s-noncoherent systems; it can also obtain the minimized dual inverse of any Boolean function. Inversion is more complex with s-noncoherence than with s-coherence because the minimal form (m.f.) is not unique. The result of inversion is the dual prime implicants (p.i.'s). The terms of a dual m.f., the dual minimal states, are obtained by a search process. First the dual p.i.'s are obtained; then a m.f. is found by an algorithmic search with a test for redundancy, reversal-absorption (r.a.). The dual p.i.'s are segregated into the ``core'' p.i.'s [8,9] essential for every m.f. and the ``noncore'' p.i.'s, by r.a. Then a m.f. is found by repeatedly applying r.a. to randomized rearrangements of the noncore terms. Examples are included, adapted from the fault-tree literature. View full abstract»

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  • Event-Altered Rate Models for General Reliability Analysis

    Publication Year: 1979 , Page(s): 376 - 381
    Cited by:  Papers (61)
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    Stochastic processes within the general Poisson family, but distinguished by having rates which are changed by events, rather than by time, accurately describe the software error detection process. Several promising new models of this general type have been developed by the author and apply to hardware and software reliability problems, especially during the bum-in and wear-out phases. The growth models which describe wear-out apply to software when, because of pervasive patching, the system inexorably degrades. Failure rates which are decreased at the occurrence of an event (such as an error detection and removal in the case of software debugging) by either a fixed amount, or to a fraction of the most recent rate are reviewed, and new applications are described or suggested. Additional related models in which the rates increase are described and some possible applications are suggested. View full abstract»

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  • Manuscripts Received

    Publication Year: 1979 , Page(s): 381
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  • A Simple Event-Definition Notation and Associated Computer Programs

    Publication Year: 1979 , Page(s): 382 - 385
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    A notation for defining events to a computer program is described. It has been used in weapon-effect simulation models. It is simple and can be efficiently processed by computer. Computer codes using the notation have been developed with small effort. View full abstract»

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  • Book Reviews

    Publication Year: 1979 , Page(s): 385
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  • Reliability Analysis of 3-State Systems

    Publication Year: 1979 , Page(s): 386 - 393
    Cited by:  Papers (10)
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    This paper describes a reliability analysis of a system where its components take one of three states-good, degraded, or bad. For this 3-state system, the analogy of 2-state system is investigated. The calculation of system reliability can be reduced to that of the reliability of a corresponding 2-state system, provided that it is a generalized S-P system, with or without artificial, degraded components. Consequently, methods for evaluating the exact system reliability and useful bounds on system reliability of 2-state s-coherent system directly apply to 3-state systems. Some basic properties of system reliability with s-independent components are then presented. Further, some reliability bounds on systems with s-associated components are derived. Finally, the method is extended to multi-state systems. This state reduction can be used somewhat in analyzing models where time plays a role. View full abstract»

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  • Landmarks in R&M Engineering: #4 On Equal Opportunity

    Publication Year: 1979 , Page(s): 393
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  • Optimal Scheduled-Maintenance Policy Based on Multiple-Criteria Decision-Making

    Publication Year: 1979 , Page(s): 394 - 399
    Cited by:  Papers (15)
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    Usually, more than one independent (conflicting) criterion is important in determining the replacement age of a critical item for a maintained system. In this study, mathematical models have been developed for three such criteria: 1) minimum replacement cost-rate, 2) maximum availability, and 3) lower-bound on mission reliability. The solutions are obtained using four methods for multiple criteria decision making: 1) strictest-selection, 2) lexicographic, 3) Waltz lexicographic, and 4) sequential multiple-objective problem-solving technique (SEMOPS). Using an aircraft engine as an example, the optimal replacement age has been found by the four different methods. The results and the implications of the methods are discussed. View full abstract»

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  • A Modified Block Replacement Policy Using Less Reliable Items

    Publication Year: 1979 , Page(s): 400 - 401
    Cited by:  Papers (8)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (356 KB)  

    A modified block replacement policy is examined with the purpose of excluding the wastefulness caused by the property that almost new items might be sometimes replaced at planned replacement times under the ordinary block replacement policy. This modified policy can be stated as follows: 1) Operating items are replaced by new items at times kT (k = 1,2,...), 2) If operating items fail in [(k - 1)T, kT - v), they are replaced by new items, and in [kT - v, kT), they are replaced by less reliable items than new items. Numerical comparisons between the proposed policy and the ordinary block replacement policy are carried out for Weibull distribution. View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong