Issue 5 • Date Dec. 1978
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Displaying Results 1 - 25 of 56
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[Front cover]
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PDF (849 KB)
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IEEE Reliability Group
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PDF (161 KB)
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[Breaker page]
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PDF (161 KB)
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Inclusion and Exclusion
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PDF (161 KB)
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Bayes vs. Whim
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PDF (161 KB)
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A Reliability Growth Model
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PDF (304 KB)
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Book Reviews
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PDF (169 KB)
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Book Reviews
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PDF (217 KB)
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Book Reviews
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PDF (201 KB)
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Estimation of Reliability from Multiple Independent Grouped Censored Samples with Failure Times Known
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PDF (408 KB)
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Manuscripts Received
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PDF (142 KB)
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Manuscripts Received
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PDF (193 KB)
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Free proceedings
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PDF (149 KB)
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Aims & Scope
IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.
Meet Our Editors
Editor-in-Chief
Way Kuo
University of Tennessee


