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IEEE Transactions on Reliability

Issue 1 • March 1964

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Displaying Results 1 - 14 of 14
  • [Front cover]

    Publication Year: 1964, Page(s): c1
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  • IEEE Professional Technical Group on Reliability

    Publication Year: 1964, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1964, Page(s): nil1
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  • Presentation of the 1963 IEEE PTGR Award

    Publication Year: 1964, Page(s):i - ii
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  • Reliability Today and Tomorrow

    Publication Year: 1964, Page(s):1 - 4
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (775 KB)

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  • Our National Space Program

    Publication Year: 1964, Page(s):5 - 7
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  • Guaranteed Reliability at a Minimum Cost

    Publication Year: 1964, Page(s):8 - 13
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  • Failure Time for a Redundant Repairable System of Two Dissimilar Elements

    Publication Year: 1964, Page(s):14 - 22
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1297 KB)

    The distribution of time to failure for a system consisting of two dissimilar elements or subsystems operating redundantly and susceptible to repair is discussed. It is assumed that the times to failure for the two system elements are independent random variables from possibly different exponential distributions, and that the repair times peculiar to each element are independently distributed in a... View full abstract»

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  • The Reliability of Redundant Multiple-Line Networks

    Publication Year: 1964, Page(s):23 - 33
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1568 KB)

    This paper develops a procedure for determining a lower bound to the reliability of multiple-line redundant networks. The procedure is general in that there are no restrictions on the interconnection pattern between the functions of the network, and it allows, within limitations, different parts of the network to take on different orders of redundancy. The approximation to reliability is very good... View full abstract»

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  • Empirical Parameter Variation Analysis for Electronic Circuits

    Publication Year: 1964, Page(s):34 - 40
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1077 KB)

    Procedures for empirical parameter variation analysis are presented which should be useful in practical programs of design analysis and reliability improvement for electronic circuits. The objective of the technique is to estimate the effect that drifts in component-part parameters will have upon circuit performance. This estimate is obtained by application of formal statistical and/or worst-case ... View full abstract»

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  • The Effectiveness of ``On-Board'' Maintenance

    Publication Year: 1964, Page(s):41 - 47
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1029 KB)

    ``On-board'' maintenance for offensive weapons systems and its relationship to the allocation of spare parts is discussed. A method for the selection of ``on-board'' spare parts is given and an expression for the increase in subsystem reliability through ``on-board'' repairs is derived. The concepts of effective reliability, combat effectiveness, and criticality of spare parts are examined. Curves... View full abstract»

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  • Correction [to "Approximation formulas for reliability with repair"]

    Publication Year: 1964, Page(s): 48
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (48 KB)

    Malcolm A. McGregor, author of "Approximation Formulas for Reliability with Repair," which appeared on pages 64-92 of the December, 1963, issue of these Transactions, has called a variety of problems to the attention of the Editor that are corrected herein. View full abstract»

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  • Contributors

    Publication Year: 1964, Page(s):49 - 51
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  • [Front cover]

    Publication Year: 1964, Page(s): c2
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu