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Reliability, IEEE Transactions on

Issue 1 • Date March 1963

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Displaying Results 1 - 10 of 10
  • [Front cover]

    Page(s): c1
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  • IEEE Professional Technical Group on Reliability

    Page(s): nil1
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  • [Breaker page]

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  • The Reliability of Repairable Complex Systems Part B: The Dissimilar Machine Case

    Page(s): 1 - 8
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    A generalization of the reliability model given in Part A of this reliability study is made. The failure and repair rates are assumed to be exponential as in Part A, but the model equations are changed so that the following ramifications are possible. 1) The label case: it is necessary to know which of the similar machines are broken down in order to decide if a system failure has occurred. 2) The parameter case: the values of the failure and repair rates are not the same on each machine. 3) The type of failure case: the system goes from state i to i + j after a failure, j ¿ 1, and to i - k after a repair, k ¿ 1, whereas in Part A j = k = 1 only. A procedure for finding dissimilar machine model equations with time delays before failure and time restoration constraints after repair are given. View full abstract»

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  • High-Power Dynamic Life Tests of Transistors

    Page(s): 9 - 17
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    In an effort to correlate failure modes observed on field return transistor failures to life test results, Delco Radio initiated a new type power pulse life test program. The program was added to the normally accepted storage and dc operating programs which did not supply adequate information on burn-through or punch-through failures. The test matrix was designed around a unique three-dimensional dynamic failure rate graphical model. This paper describes the engineering and development of the high-power test equipment required to prove the model. A number of photographs and illustrations of the equipment developed have been included. The design of test circuits for maximum reliability for dynamic testing are also discussed. At the conclusion of the paper, the actual results of the program which are applicable to circuit designers are presented. View full abstract»

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  • Reliability, Democracy, and Man in Systems

    Page(s): 18 - 22
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    The paper discusses the question of man's value in systems and why the topic has arisen. Personnel impact on reliability of man-machine systems is discussed. What is presently being done, what remains to be accomplished, and methods for improving the reliability of people in systems are outlined. Suggestions for making use of man's inherent reliability to improve systems lead to a discussion of how management can enhance man's contribution to the reliability of the system in which he operates. A discussion of cost of this effort completes the presentation. View full abstract»

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  • Effectivity: Its Application to a Long-Lived Space System

    Page(s): 23 - 31
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    This paper proposes a measure of equipment dependability (reliability) that is related to statistical loss and is suitable for application to complex systems. The relation of this concept, termed effectivity, to other measures is explained and its use is illustrated by application to a specific space system. A prediction of effectivity is described and demonstrated using analytical means and also by applying a novel Monte-Carlo procedure. The results of testing are also presented and compared with the predicted values. View full abstract»

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  • A Model for the Reliability Estimation of Space Systems

    Page(s): 32 - 39
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    The general problem and need for reliability estimation and prediction is discussed. Various types of reliability estimates are considered. A general probabilistic model is defined in a set-theoretic framework. The model considers the operation of a system over several time-periods where the operating mode-of the system may change from period to period. A general expression is given for the reliability of a system and also upper and lower bounds. Several theoretical examples are shown by using the model and it is shown how particular applications yield different results depending on the physical situation considered. In addition brief mention is made of a particular reliability study, namely a certain phase of the 3-orbit mission of Project Mercury. View full abstract»

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  • Correction

    Page(s): 40
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  • Contributors

    Page(s): 41 - 42
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

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Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong