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IEEE Transactions on Reliability

Issue 3 • Date Dec. 1966

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Displaying Results 1 - 15 of 15
  • [Front cover]

    Publication Year: 1966, Page(s): c1
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  • IEEE Reliability Group

    Publication Year: 1966, Page(s): nil1
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  • IEEE Reliability Group [Breaker page]

    Publication Year: 1966, Page(s): nil1
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  • System States Analysis and Flow Graph Diagrams in Reliability

    Publication Year: 1966, Page(s):85 - 94
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1472 KB)

    A method is described which permits rapid evaluation of reliability functions and some probabilistic parameters related to the operation of systems. The method is based on the concept of system states and on the observation that, in terms of such states, the probabilistic behavior of systems is well described by the Markov process in infinitesimal dt, whenever subsystems behave independently of ea... View full abstract»

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  • A Causal Redefinition of Failure Rate-Theorems, Stress Dependence, and Application to Devices and Distributions

    Publication Year: 1966, Page(s):95 - 114
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3778 KB)

    A formalism is established for calculating the reliability of devices starting from causal, physical analysis of the devices' operational and failure modes. A measured device quantity qi is expressed in terms of basic material properties pj, which in turn may depend on time t and stresses sk. Then defining a kinetic sensitivity θj = (∂q... View full abstract»

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  • Using Specifications

    Publication Year: 1966, Page(s):115 - 119
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1142 KB)

    Some simple rules are given for obtaining the precise definition of a component or manufacturing process from a set of documents. Examples are quoted to show how specifications should be used while at the same time providing a warning against giving too much blind faith to this form of printed word. The difficulties facing specification writers are mentioned and examples of unusable or misleading ... View full abstract»

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  • Correction [to "System operational readiness and equipnlent dependability"]

    Publication Year: 1966, Page(s): 119
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (187 KB)

    The author of the above-named paper, which appeared on pp. 1-6 of the May 1966 issue of these Transactions, has requested that Equation (7) be corrected as noted herein. View full abstract»

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  • Point and Interval Estimation, From One-Order Statistic, of the Location Parameter of an Extreme-Value Distribution with Known Scale Parameter and of the Scale Parameter of a Weibull Distribution with Known Shape Parameter

    Publication Year: 1966, Page(s):120 - 126
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1206 KB)

    This paper derives a one-order statistic estimator ¿mn b for the location parameter of the (first) extreme-value distribution of smallest values with cumulative distribution function F(x;u,b) = 1 - exp {-exp[(x-u)/b]} using the minimum-variance unbiased one-order statistic estimator for the scale parameter of an exponential distribution, as was done in an earlier paper for the scale parameter of ... View full abstract»

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  • The Analysis of a Class of Non-Series Parallel Redundant Systems

    Publication Year: 1966, Page(s):127 - 132
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1037 KB)

    Two analysis techniques for use in the study of a class of non-series parallel, dual channel systems are presented. The first technique is a method for obtaining an approximate solution for the system. It is based on a systematic analysis of first- and second-order failure modes and involves the use of matrix algebra. The second technique is a method for generating the exact solution from the appr... View full abstract»

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  • Comments on "System operational readiness and equipment dependability''

    Publication Year: 1966, Page(s): 132
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (167 KB)

    First Page of the Article
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  • Availability of the Standardized Weibull Distribution

    Publication Year: 1966, Page(s):132 - 133
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  • Contributors

    Publication Year: 1966, Page(s):133 - 134
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  • Editor's Note

    Publication Year: 1966, Page(s): 134
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  • Information for authors

    Publication Year: 1966, Page(s): nil2
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  • [Front cover]

    Publication Year: 1966, Page(s): c2
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu