# IEEE Transactions on Reliability

## Filter Results

Displaying Results 1 - 16 of 16
• ### [Front cover]

Publication Year: 1969, Page(s): c1
| PDF (699 KB)
• ### IEEE Reliability Group

Publication Year: 1969, Page(s): nil1
| PDF (837 KB)
• ### [Breaker page]

Publication Year: 1969, Page(s): nil1
| PDF (837 KB)
• ### Subjective Probability and Prior Knowledge

Publication Year: 1969, Page(s): 33
Cited by:  Papers (1)
| PDF (135 KB)
• ### The Effect of Ionic Contaminants on Silicon Transistor Stability

Publication Year: 1969, Page(s):34 - 38
Cited by:  Papers (3)
| | PDF (1004 KB)

The development of the beam-lead sealed-junction (BLSJ) technology (beam-lead contact metals-silicon nitride passivation) included many experiments to study the effects of various ionic contaminants on silicon transistor stability. Stress aging was performed on standard n-p-n silicon transistors (aluminum contacts and silicon dioxide protection) under various conditions of temperature, bias, conta... View full abstract»

• ### The Design of Multiple-Line Redundant Networks

Publication Year: 1969, Page(s):39 - 44
Cited by:  Papers (2)
| | PDF (1147 KB)

One means to assure high reliability in digital electronic equipment is to incorporate multiple-line redundancy in its design. This type of redundancy has been described frequently in the literature. This paper treats the problem of determining the design of a multiple-line redundant network which maximizes the reliability of the network. There is an extremely large number of feasible designs for ... View full abstract»

• ### A Generalized Limit Theorem for Reliability

Publication Year: 1969, Page(s):45 - 46
Cited by:  Papers (2)
| | PDF (341 KB)

A new and more general limit theorem is proposed in place of the exponential limit theorem of Drenick. First it is shown that as time goes to zero, the hazard rate can be made to approach an almost arbitrary function. Next it is pointed out that in the exponential limit theorem (and others) the only practical and necessary effect of having the number of elements go to infinity'' is to force time... View full abstract»

• ### Optimization by Integer Programming of Constrained Reliability Problems with Several Modes of Failure

Publication Year: 1969, Page(s):47 - 53
Cited by:  Papers (33)
| | PDF (1134 KB)

Reliability optimization problems with N stages or subsystems in series, utilizing parallel or series redundant units, can be formulated and solved as integer programming problems. The systems considered have subsystems with components which can fail in several modes and are subject to linear and nonlinear constraints. Two situations are considered in which components within the subsystem 1) all f... View full abstract»

• ### Management Decision Utilizing Cost-Effectiveness Modeling

Publication Year: 1969, Page(s):54 - 63
Cited by:  Papers (2)
| | PDF (1802 KB)

An example of how the specifics of a major subsystem are related to the decision rules developed from cost-effectiveness considerations is given. An extensive study of a subsystem for an advanced ship deployment system was conducted to select the cost-effective subsystem and specify the procurement parameters from many attractive subsystem alternatives. It is shown that for a subsystem whose perfo... View full abstract»

• ### Hazard Versus Renewal Rate of Electronic Items

Publication Year: 1969, Page(s):64 - 73
Cited by:  Papers (13)
| | PDF (2087 KB)

Two different indexes, the hazard rate and the renewal rate, which are implied by conventional uses of the bathtub-shaped curve, are often noted in reliability. The hazard rate is applicable for a single failure time of each item, such as that of a nonrepairable part; the renewal rate is applicable for multiple failure times of each item, such as those of repairable equipment. Occasionally, remark... View full abstract»

• ### Reliability in Digital Systems with Asymmetrical Failure Modes

Publication Year: 1969, Page(s):74 - 75
Cited by:  Papers (2)
| | PDF (248 KB)

Most present-day reliability schemes using redundancy to mask the failure of individual logic modules employ majority voting with the assumption that the replicated modules have symmetrical failure characteristics. An analysis is presented of such schemes when the modules exhibit asymmetrical failure modes; that is, the probability that a module fails with a 0 output is not equal to the probabilit... View full abstract»

• ### Conditional Maximum-Likelihood Estimation, from Singly Censored Samples, of the Shape Parameters of Pareto and Limited Distributions

Publication Year: 1969, Page(s):76 - 78
Cited by:  Papers (5)
| | PDF (553 KB)

Use of the functional relationship between the exponential and the Pareto and limited distributions enables one to obtain conditional maximum-likelihood (ML) estimators, from singly censored samples, of the shape parameters of the Pareto distribution F1(y,ϵ,K) = 1 - (y - ϵ)-K and the limited distribution F2(x,ω,K) = 1 - (ω - x)K by a... View full abstract»

• ### Unbiased Maximum-Likelihood Estimation of a Weibull Percentile when the Shape Parameter is Known

Publication Year: 1969, Page(s):78 - 79
Cited by:  Papers (7)
| | PDF (244 KB)

The maximum-likelihood (ML) estimator for a percentile of a Weibull distribution with a known shape parameter is considered. Multiplicative correction factors are listed for rendering the ML estimator mean or median unbiased in the cases where the samples are type II censored with or without replacement. The correction factors depend upon the number of failures and the shape parameter but are inde... View full abstract»

• ### Contributors

Publication Year: 1969, Page(s): 80
| PDF (224 KB)
• ### List of Contributors

Publication Year: 1969, Page(s): nil2
| PDF (586 KB)
• ### [Front cover]

Publication Year: 1969, Page(s): c2
| PDF (721 KB)

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu