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Reliability, IEEE Transactions on

Issue 4 • Date Dec. 1968

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Displaying Results 1 - 14 of 14
  • [Front cover]

    Publication Year: 1968 , Page(s): c1
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    Freely Available from IEEE
  • IEEE Reliability Group

    Publication Year: 1968 , Page(s): nil1
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    Freely Available from IEEE
  • [Breaker page]

    Publication Year: 1968 , Page(s): nil1
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    Freely Available from IEEE
  • News

    Publication Year: 1968 , Page(s): 185 - 186
    Cited by:  Papers (1)
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    Freely Available from IEEE
  • A Bayesian Reliability Growth Model

    Publication Year: 1968 , Page(s): 187 - 198
    Cited by:  Papers (7)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (1890 KB)  

    A model is presented for the change (growth) in reliability of a system during a test program. Parameters of the model are assumed to be random variables with appropriate prior density functions. Expressions are then derived that enable estimates (in the form of expectations) and precision statements (in the form of variances) to be made of: 1) projected system reliability at time ¿ after the sta... View full abstract»

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  • A Generalized Reliability Function for Systems of Parallel Components

    Publication Year: 1968 , Page(s): 199 - 201
    Cited by:  Papers (3)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (578 KB)  

    In systems of parallel components, the system reliability function Rp(t) is usually defined as the probability that not all the parallel components fail in a time interval t, given that all the components are operating at the beginning of the interval. This definition implies that if there is one component which operates throughout the whole interval in question, then the system reliability is per... View full abstract»

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  • Correction to "Physical Basis for Evaluating the Reliability of p-n Junction Devices'"

    Publication Year: 1968 , Page(s): 201
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  • On the need for new reliability parameters

    Publication Year: 1968 , Page(s): 202
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (270 KB)  

    It is argued that we must decide which parameters are worthy of comparison not over a time span for one specimen, but among specimens derived from diferent times, different designs, and different configurations. View full abstract»

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  • Beware of the Weibull euphoria

    Publication Year: 1968 , Page(s): 202 - 203
    Cited by:  Papers (7)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (486 KB)  

    First Page of the Article
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  • Reply to ``Comments on System States Analysis and Flow Graph Diagrams in Reliability''

    Publication Year: 1968 , Page(s): 203
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (222 KB)  

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  • Comment on "Computerized analysis of non-linear magnetics''

    Publication Year: 1968 , Page(s): 204
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    First Page of the Article
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  • Contributors

    Publication Year: 1968 , Page(s): 204
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    Freely Available from IEEE
  • 1968 Index IEEE Transactions on Reliability Vol. R-17

    Publication Year: 1968 , Page(s): 205 - 208
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    Freely Available from IEEE
  • [Front cover]

    Publication Year: 1968 , Page(s): c2
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    Freely Available from IEEE

Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong