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# IEEE Transactions on Reliability

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Displaying Results 1 - 14 of 14
• ### [Front cover]

Publication Year: 1968, Page(s): c1
| PDF (649 KB)
• ### IEEE Reliability Group

Publication Year: 1968, Page(s): nil1
| PDF (781 KB)
• ### [Breaker page]

Publication Year: 1968, Page(s): nil1
| PDF (781 KB)
• ### News

Publication Year: 1968, Page(s):185 - 186
Cited by:  Papers (1)
| PDF (110 KB)
• ### A Bayesian Reliability Growth Model

Publication Year: 1968, Page(s):187 - 198
Cited by:  Papers (10)
| | PDF (1890 KB)

A model is presented for the change (growth) in reliability of a system during a test program. Parameters of the model are assumed to be random variables with appropriate prior density functions. Expressions are then derived that enable estimates (in the form of expectations) and precision statements (in the form of variances) to be made of: 1) projected system reliability at time τ after ... View full abstract»

• ### A Generalized Reliability Function for Systems of Parallel Components

Publication Year: 1968, Page(s):199 - 201
Cited by:  Papers (3)
| | PDF (578 KB)

In systems of parallel components, the system reliability function Rp(t) is usually defined as the probability that not all the parallel components fail in a time interval t, given that all the components are operating at the beginning of the interval. This definition implies that if there is one component which operates throughout the whole interval in question, then the system reliability is per... View full abstract»

• ### Correction to "Physical Basis for Evaluating the Reliability of p-n Junction Devices'"

Publication Year: 1968, Page(s): 201
| PDF (154 KB)
• ### On the need for new reliability parameters

Publication Year: 1968, Page(s): 202
| | PDF (270 KB)

It is argued that we must decide which parameters are worthy of comparison not over a time span for one specimen, but among specimens derived from diferent times, different designs, and different configurations. View full abstract»

• ### Beware of the Weibull euphoria

Publication Year: 1968, Page(s):202 - 203
Cited by:  Papers (10)
| | PDF (486 KB)

First Page of the Article
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• ### Reply to Comments on System States Analysis and Flow Graph Diagrams in Reliability''

Publication Year: 1968, Page(s): 203
| | PDF (222 KB)

First Page of the Article
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• ### Comment on "Computerized analysis of non-linear magnetics''

Publication Year: 1968, Page(s): 204
| | PDF (251 KB)

First Page of the Article
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• ### Contributors

Publication Year: 1968, Page(s): 204
| PDF (251 KB)
• ### 1968 Index IEEE Transactions on Reliability Vol. R-17

Publication Year: 1968, Page(s):205 - 208
| PDF (536 KB)
• ### [Front cover]

Publication Year: 1968, Page(s): c2
| PDF (811 KB)

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu