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IEEE Transactions on Reliability

Issue 3 • Date Aug. 1970

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Displaying Results 1 - 22 of 22
  • [Front cover]

    Publication Year: 1970, Page(s): c1
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  • IEEE Reliability Group

    Publication Year: 1970, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1970, Page(s): nil1
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  • News: Call for papers 1972 Annual Symposium on Reliability

    Publication Year: 1970, Page(s): i
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  • 1971 Reliability Physics Symposium

    Publication Year: 1970, Page(s): ii
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  • The Reliability Discipline

    Publication Year: 1970, Page(s): 81
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  • On Determining the Reliability of Protective Relay Systems

    Publication Year: 1970, Page(s):82 - 85
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (742 KB)

    This paper lays the ground work for the statistical determination of the reliability of protective relay systems found in electric power systems. The reliability problem has two conflicting requirements: 1) failure to operate in the presence of a fault and 2) unnecessary operation when a fault occurs that the relay or relay system was set to ignore. It is not often treated in reliability literatur... View full abstract»

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  • Random Failure

    Publication Year: 1970, Page(s):86 - 88
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (626 KB)

    Random failure is perhaps the most abused term in reliability and related engineering interests. Past definitions, being logically more descriptive than constructive, have not been truly definitive. An attempt is made here to offer one that is: the class of failures statistically independent of past history. This definition is based upon the mutual implication between the stochastic processes prod... View full abstract»

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  • Reliability of MgAI Semiconductor Interconnects

    Publication Year: 1970, Page(s):89 - 94
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1034 KB)

    Data are presented comparing 1-percent MgAI wire with 1-percent SiAI wire for ultrasonically bonded interconnects on semiconductor devices. The effects of annealing time and temperature on the strength of the wire demonstrate the mechanical superiority of the 1-percent MgAI wire. The effects of ultrasonic power and time on wire deformation and bond pull strength demonstrate similar behavior for bo... View full abstract»

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  • Optimal Reliability of a Complex System

    Publication Year: 1970, Page(s):95 - 100
    Cited by:  Papers (40)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1005 KB)

    In a complex system where the redundant units cannot be reduced to a purely parallel or series configuration, the reliability is obtained by using Bayes' theorem. A mathematical model is formulated for the reliability of a system with nonlinear constraints. The system reliability is optimized based on the model and the solution is obtained by using the sequential unconstrained minimization techniq... View full abstract»

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  • Resistance Changes on Absorption and Desorption of Hydrogen from Evanohm Resistors

    Publication Year: 1970, Page(s):100 - 105
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    Hydrogen gas, the foaming agent in RTV-5370 silicone foam encapsulating plastic, caused resistance increases in thin-film Evanohm resistors. The hydrogen is a byproduct of the polymerization of hydrosiloxane groups with polymeric hydroxy functional siloxanes. The hydrogen gas is produced over an extended time period and trapped in the sealed circuit box. The gas then diffuses through the silicone ... View full abstract»

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  • Renewal Theoretic Aspects of Two-Unit Redundant Systems

    Publication Year: 1970, Page(s):105 - 110
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (928 KB)

    This expository paper discusses four two-unit redundant systems: 1) parallel redundancy; 2) standby redundancy; 3) standby redundancy with priority; 4) standby redundancy with noninstantaneous switchover. In models 1), 2), and 3) the switchover time is instantaneous. The integral equation of renewal theory is applied by using the concept of a cycle. Applying the integral equation of renewal theory... View full abstract»

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  • On the Usefulness of the Maximum Entropy Principle in the Bayesian Estimation of Reliability

    Publication Year: 1970, Page(s):110 - 115
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1063 KB)

    The use of the maximum entropy principle for determining prior distribution is compared with other techniques in statistical-decision theory for estimating reliability. The comparison is made in the context of estimating the parameter representing the probability of success in a binomial model and the parameter representing the mean time to failure in a simple exponential model. The existence of p... View full abstract»

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  • Reliability of Thermoelectric Couple Networks Based Upon Couple Catastrophic Failures

    Publication Year: 1970, Page(s):116 - 119
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (615 KB)

    A limited reliability mathematical model for series-parallel configurations of semiconductor couples used in radioisotopic thermoelectric generators (RTGs) is constructed. The model represents catastrophic failure reliability, which is only one important part of the total effective reliability mathematical model. It is deliberately narrow; two other major components of couple reliability, drift an... View full abstract»

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  • Minimization of Misclassification of Component Failures in a Two-Component System

    Publication Year: 1970, Page(s):120 - 122
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (471 KB)

    In this paper we assume we are repairing two-component series systems that have failed or are malfunctioning. It is further assumed that when a system is brought into the repair shop, it is not known with certainty which component has failed. If the repairman begins repairing the wrong component, a misclassification cost is incurred. It is also assumed that some resources are available for the pur... View full abstract»

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  • Psychological Reliability

    Publication Year: 1970, Page(s): 122
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  • Comment on "A Diffusion Method for Reliability Prediction"

    Publication Year: 1970, Page(s): 122
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  • Authors' reply

    Publication Year: 1970, Page(s): 123
    Cited by:  Papers (1)
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  • Comment on Editorial

    Publication Year: 1970, Page(s):123 - 124
    Cited by:  Papers (1)
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  • Contributors

    Publication Year: 1970, Page(s):124 - 125
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  • List of Contributors

    Publication Year: 1970, Page(s): nil3
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  • [Front cover]

    Publication Year: 1970, Page(s): c2
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu