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Reliability, IEEE Transactions on

Issue 1 • Date Feb. 1972

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Displaying Results 1 - 19 of 19
  • [Front cover]

    Publication Year: 1972 , Page(s): c1
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  • IEEE Reliability Group

    Publication Year: 1972 , Page(s): nil1
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  • [Breaker page]

    Publication Year: 1972 , Page(s): nil1
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  • Editorial

    Publication Year: 1972 , Page(s): 1
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  • Graphical Analysis of Accelerated Life Test Data with the Inverse Power Law Model

    Publication Year: 1972 , Page(s): 2 - 11
    Cited by:  Papers (39)
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    In this paper, graphical methods are presented for analyzing accelerated life test data with the inverse power law model, when all test units are run to failure. The inverse power law model is described, and graphical methods for estimating its parameters from such complete data are given. These methods are illustrated with accelerated test data on time to breakdown of an insulating fluid. While the methods are presented with the inverse power law model, they can be used for analyzing many other accelerated life test situations. These methods are presented so that they can be used by individuals with a limited statistical background. View full abstract»

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  • MOS Integrated Circuit Reliability

    Publication Year: 1972 , Page(s): 12 - 19
    Cited by:  Papers (8)
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    This paper presents information on the reliability of MOS integrated circuits based on p-channel enhancement-mode transistors, and describes their failure modes and mechanisms. The principal failure mechanisms were ion migration at the surface and oxide shorting. The results of experimental studies of the effects of variations in construction, processing, and levels of stress are presented, and are compared with other available information on MOS integrated circuit reliability. The failure rate for commercially available complex MOS arrays is on the order of 0.001 to 0.01 per 1000 h of operating life at 125°C for arrays containing approximately 600 p-channel transistors. This corresponds to a failure rate on the order of 5 × 10¿6 to 5 × 10¿5 per equivalent gate per 1000 h. The effects of device complexity, operating temperature, and other factors are discussed. A reliability prediction equation for MOS integrated circuits is derived from available information. An overall activation energy for functional failure mechanisms of approximately 5 kcal/mole (¿0.2 eV/molecule) is considered applicable to typical MOS integrated circuits. Thus, the failure rate of MOS devices operated at 50°C ambient temperature can be predicted to be on the order of 10¿6 to 10¿5 per equivalent gate per 1000 h. View full abstract»

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  • On a Two-Unit Standby-Redundant System with Imperfect Switchover

    Publication Year: 1972 , Page(s): 20 - 24
    Cited by:  Papers (11)
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    A standby-redundant repairable system having only two units and an imperfect switchover is considered. The Lapace-Stieltjes transform of the distribution of the time to first system faflure (TFSF) and the mean TFSF are derived. Numerical comparisons of the mean TFSF with both perfect and imperfect switching are made. All time distributions, except repair of the main units, are exponential. View full abstract»

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  • Reliability Analysis of a Two-Unit Standby-Redundant System with Preventive Maintenance

    Publication Year: 1972 , Page(s): 24 - 29
    Cited by:  Papers (11)
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    We consider a standby-redundant model of two units, where we assume that one unit is operative and the other unit is in standby at time t = 0. If the operative unit fails, a unit in standby is put into preventive maintenance policy of the operative unit to maintain our the preventive maintenance policy of the operative unit to maintain our system with high reliability. Our concern for the system is the time to the first system-down. The Laplace-Stieltjes transform of the time distribution to the first system-down and the mean time to the first system-down are derived by applying the relationship between Markov renewal processes and signal flow graph. Further, the behavior after the system-down is investigated by using the results of Markov renewal processes. Finally, numerical examples are presented for the k-Erlang failure time distributions. The optimal preventive maintenance time is discussed. View full abstract»

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  • A Simple Approach for Constrained Redundancy Optimization Problem

    Publication Year: 1972 , Page(s): 30 - 34
    Cited by:  Papers (18)
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    This paper provides a simple algorithm for the solution of the redundancy optimization problem in the presence of multiple linear constraints. Basicaily, the solution to an r-constraint problem is obtained successively from the solution of r-unconstrained problems. At each step, an active constraint is picked out, then the maximum gradient concept is used to find a closer point. The approach requires minimum effort and time for solution. View full abstract»

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  • Double Failure and Other Related Problems in Standby Redundancy

    Publication Year: 1972 , Page(s): 35 - 40
    Cited by:  Papers (3)
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    A branch and bound algorithm is extended to parallel standby redundancy wherein components are subject to both open and short circuit failures. The algorithm is then modified to consider parallel-series arrangememts of such standbys, and is also applied to solving problems where there is a choice of components at each stage. In the last section, the two types of failures are separated in the constraints of the problems. View full abstract»

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  • A Systematic Procedure for the Generation of Cost-Minimized Designs

    Publication Year: 1972 , Page(s): 41 - 45
    Cited by:  Papers (2)
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    We present a procedure for the generation of cost-minimized designs of circuits and systems. Suppose a designer has decided upon the topology of his product. Also suppose he knows the cost and quality of the different grades of the N components required to implement the product. The designer then faces the following problem: How should he proceed to find the combination of grades that will give him the desired manufacturing yield at minimum product cost? We discuss the problem and suggest a policy by which the designer, with a reasonable computational effort, can find a set of ``good'' implementations. The suggested policy is applied to an electronic amplifier. The results are quite encouraging. View full abstract»

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  • Estimation of the Parameters of the Weibull Distribution from Multicensored Samples

    Publication Year: 1972 , Page(s): 46 - 51
    Cited by:  Papers (10)
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    Monte Carlo simulations are used to investigate the maximum likelihood estimators for the parameters of the Weibull distribution using multicensored samples. For the case of unequal number of items censored, a single situation is considered. When the same number of items are removed at each test, several different estimators are compared for several values of the parameters. View full abstract»

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  • A Bayesian Approach to Parameter and Reliability Estimation in the Poisson Distribution

    Publication Year: 1972 , Page(s): 52 - 56
    Cited by:  Papers (1)
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    For life testing procedures, a Bayesian analysis is developed with respect to a random intensity parameter in the Poisson distribution. Bayes estimators are derived for the Poisson parameter and the reliability function based on uniform and gamma prior distributions of that parameter. A Monte Carlo procedure is implemented to make possible an empirical mean-squared error comparison between Bayes and existing minimum variance unbiased, as well as maximum likelihood, estimators. As expected, the Bayes estimators have mean-squared errors that are appreciably smaller than those of the other two. View full abstract»

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  • Parametric Representation of Probability in Two DimensionsߞA New Approach in System Reliability Evaluation

    Publication Year: 1972 , Page(s): 56 - 60
    Cited by:  Papers (13)
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    The evaluation of system reliability becomes very diffilcult when the number of components in a system is large or the system configuration is complex. This note presents a straightforward method for system reliability evaluation. Probability is treated as a point in a Cartesian frame and formulas are derived to evaluate the reliability of series, parallel, series-parallel, and bridge networks. The values obtained by the classical method agree closely with those obtained by this parametric method. View full abstract»

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  • Optimal Redundancy Allocation by Dynamic Programming

    Publication Year: 1972 , Page(s): 60 - 62
    Cited by:  Papers (5)
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    This tutorial paper presents the problem of optimal allocation of parallel redundancy under multiple linear constraints by the method of dynamic programming. The problem is approached with a standard dynamic programming formulation; the concept of dominating system configurations is introduced to reduce the number of computations involved; and a simple procedure is presented. Solutions to three numerical examples are presented. View full abstract»

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  • Book Review

    Publication Year: 1972 , Page(s): 62 - 63
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  • Contributors

    Publication Year: 1972 , Page(s): 63 - 64
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  • Information for Readers

    Publication Year: 1972 , Page(s): nil2
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  • [Front cover]

    Publication Year: 1972 , Page(s): c2
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong