Issue 4 • Date Nov. 1971
Filter Results
Displaying Results 1 - 25 of 26
-
[Front cover]
|
PDF (730 KB)
-
IEEE Reliability Group
|
PDF (134 KB)
-
[Breaker page]
|
PDF (134 KB)
-
Say What You Mean
|
PDF (136 KB)
-
-
Probability Limits for Life Test Data
|
PDF (882 KB)
-
Reliability Analysis of Systems Comprised of Units with Arbitrary Repair-Time Distributions
|
PDF (1195 KB)
-
-
The Maximum Error in System Reliability Calculations by Using a Subset of the Minimal States
|
PDF (717 KB)
-
Tables to Facilitate Calculation of an Asymptotically Optimal t Test for Equality of Location Parameters of a Certain Extreme-Value Distribution
|
PDF (932 KB)
-
Product Reliability and Random Fatigue
|
PDF (639 KB)
-
-
-
-
The Digital Computer in Medical Electronics
|
PDF (470 KB)
-
-
Author's reply
|
PDF (255 KB)
-
Comments on "Definitions of Reliability
|
PDF (255 KB)
-
-
Editor's Note
|
PDF (238 KB)
-
Book Reviews
|
PDF (760 KB)
-
Contributors
|
PDF (487 KB)
-
List of referees
|
PDF (85 KB)
-
1971 Index IEEE Transactions on Reliability Vol. R-20
|
PDF (1138 KB)
-
Information for Readers
|
PDF (126 KB)
Aims & Scope
IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.
Meet Our Editors
Editor-in-Chief
Way Kuo
University of Tennessee


