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# IEEE Transactions on Reliability

## Filter Results

Displaying Results 1 - 20 of 20
• ### [Front cover]

Publication Year: 1972, Page(s): c1
| PDF (644 KB)
• ### IEEE Reliability Group

Publication Year: 1972, Page(s): nil1
| PDF (119 KB)
• ### [Breaker page]

Publication Year: 1972, Page(s): nil1
| PDF (119 KB)
• ### Editorial

Publication Year: 1972, Page(s): 199
| PDF (111 KB)
• ### Procedures for Selection of Semiconductor Diodes for Use in Undersea Cable Systems

Publication Year: 1972, Page(s):200 - 206
Cited by:  Papers (3)
| | PDF (1266 KB)

The nonredundant transistorized repeaters used in undersea cable systems are intended to operate on the ocean floor without maintenance for twenty years. To provide the best possible assurance that this high level of reliability is in fact attained, semiconductor transistors and diodes manufactured for cable use are screened to identify and eliminate the early failures. Devices surviving the scree... View full abstract»

• ### An Exact Analysis of the Method-One Maintainability Demonstration Plan in MIL-STD-471

Publication Year: 1972, Page(s):207 - 211
Cited by:  Papers (1)
| | PDF (532 KB)

The direct method in sequential analysis is used for an exact analysis of the Method-One maintainability demonstration plan in MIL-STD-471. Method-One is a nonparametric binomial sequential test and consists of three plans: A, B1, B2. View full abstract»

• ### A Bayes Analysis of Availability for a System Consisting of Several Independent Subsystems

Publication Year: 1972, Page(s):212 - 214
Cited by:  Papers (8)
| | PDF (395 KB)

A Bayes analysis of system availability A is carried out on the basis of snapshot data obtained on each of the N component subsystems. Application of Bayes formula, using a natural conjugate prior probability density function (pdf), yields the posterior pdf of subsystem availability. Determination of the posterior pdf of system availability requires the derivation of the pdf of the product of N in... View full abstract»

• ### A Method for Computing Complex System Reliability

Publication Year: 1972, Page(s):215 - 219
Cited by:  Papers (62)
| | PDF (832 KB)

The computation of reliability becomes quite tedious when one has to deal with a non series-parallel system. In this paper a proposed method is developed by taking the system as a probabilistic graph in which a component of the system is represented by a branch. The proposed method is composed of three phases: Phase 1 involves the reduction of all series, parallel, and series-parallel components t... View full abstract»

• ### A Proposed Methodology for Designing Real-Time Information Systems with Availability Constraints

Publication Year: 1972, Page(s):220 - 223
Cited by:  Papers (2)
| | PDF (685 KB)

This paper proposes a methodology for optimizing resource allocations within a real-time information system, given the availability constraints. In essence, the methodology reformulates the availability constraints into a state transition matrix. The state probabilities, computed from the transition matrix, form a portion of the input to the optimizing algorithm. This algorithm optimizes an arbitr... View full abstract»

• ### Multilayer Debugging Process (A New Method of Screening)

Publication Year: 1972, Page(s):224 - 229
| | PDF (966 KB)

In general, a small proportion of components will be substandard because of some imperfection in the control of the production process. Because no advance knowledge exists as to which are the substandard components, their presence affects the reliability. A great part of the substandard components can be eliminated by means of debugging procedures, but due to a nonzero proportion of defectives of ... View full abstract»

• ### Reliability Optimization of a Series-Parallel System

Publication Year: 1972, Page(s):230 - 238
Cited by:  Papers (33)
| | PDF (1469 KB)

A mathematical model is formulated for optimizing the reliability of a system subject to given linear constraints; the system has several stages in series; each stage has parallel redundancy to improve the reliability. Part I shows a new way to transform the model of constrained optimization to a saddle point problem by using Lagrange multipliers. Conditions are derived for maximizing the reliabil... View full abstract»

• ### Effects of Test Capability on System Reliability and Availability

Publication Year: 1972, Page(s):239 - 244
| | PDF (985 KB)

The impact, on system reliability and availability, of periodic testing with imperfect test equipment is analyzed. The proportion of the system tested, the frequency of testing, the accuracy of the tests, and the reliability of the test equipment are considered. The bivariate normal probability distribution is used to assess the effects of test equipment accuracy. A recursion model is developed to... View full abstract»

• ### Initial Provisioning of a Standby System with Deteriorating and Repairable Spares

Publication Year: 1972, Page(s):245 - 247
| | PDF (570 KB)

A technique is developed for finding the time dependent operating probabilities used by reliability systems designers for provisioning a system with N + k identical units, k of which are called spares and N called operating units, and s repair facilities. System failure occurs when less than N units are operational. Units fail with exponential interfailure times and are repaired with exponential s... View full abstract»

• ### Book Review

Publication Year: 1972, Page(s): 247
| PDF (188 KB)
• ### Correction to Reliability of Some Modularly Redundant Systems''

Publication Year: 1972, Page(s): 247
| PDF (188 KB)
• ### List of referees

Publication Year: 1972
| PDF (112 KB)
• ### Notices

Publication Year: 1972, Page(s): 249
| PDF (39 KB)
• ### 1972 Index IEEE Transactions on Reliability Vol. R-21

Publication Year: 1972, Page(s):251 - 254
| PDF (986 KB)

Publication Year: 1972, Page(s): nil2
| PDF (133 KB)
• ### [Front cover]

Publication Year: 1972, Page(s): c2
| PDF (642 KB)

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu