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Reliability, IEEE Transactions on

Issue 4 • Date Nov. 1972

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Displaying Results 1 - 20 of 20
  • [Front cover]

    Publication Year: 1972, Page(s): c1
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  • IEEE Reliability Group

    Publication Year: 1972, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1972, Page(s): nil1
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  • Editorial

    Publication Year: 1972, Page(s): 199
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  • Procedures for Selection of Semiconductor Diodes for Use in Undersea Cable Systems

    Publication Year: 1972, Page(s):200 - 206
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1266 KB)

    The nonredundant transistorized repeaters used in undersea cable systems are intended to operate on the ocean floor without maintenance for twenty years. To provide the best possible assurance that this high level of reliability is in fact attained, semiconductor transistors and diodes manufactured for cable use are screened to identify and eliminate the early failures. Devices surviving the scree... View full abstract»

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  • An Exact Analysis of the Method-One Maintainability Demonstration Plan in MIL-STD-471

    Publication Year: 1972, Page(s):207 - 211
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (532 KB)

    The direct method in sequential analysis is used for an exact analysis of the Method-One maintainability demonstration plan in MIL-STD-471. Method-One is a nonparametric binomial sequential test and consists of three plans: A, B1, B2. View full abstract»

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  • A Bayes Analysis of Availability for a System Consisting of Several Independent Subsystems

    Publication Year: 1972, Page(s):212 - 214
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (395 KB)

    A Bayes analysis of system availability A is carried out on the basis of snapshot data obtained on each of the N component subsystems. Application of Bayes formula, using a natural conjugate prior probability density function (pdf), yields the posterior pdf of subsystem availability. Determination of the posterior pdf of system availability requires the derivation of the pdf of the product of N in... View full abstract»

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  • A Method for Computing Complex System Reliability

    Publication Year: 1972, Page(s):215 - 219
    Cited by:  Papers (34)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (832 KB)

    The computation of reliability becomes quite tedious when one has to deal with a non series-parallel system. In this paper a proposed method is developed by taking the system as a probabilistic graph in which a component of the system is represented by a branch. The proposed method is composed of three phases: Phase 1 involves the reduction of all series, parallel, and series-parallel components t... View full abstract»

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  • A Proposed Methodology for Designing Real-Time Information Systems with Availability Constraints

    Publication Year: 1972, Page(s):220 - 223
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (685 KB)

    This paper proposes a methodology for optimizing resource allocations within a real-time information system, given the availability constraints. In essence, the methodology reformulates the availability constraints into a state transition matrix. The state probabilities, computed from the transition matrix, form a portion of the input to the optimizing algorithm. This algorithm optimizes an arbitr... View full abstract»

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  • Multilayer Debugging Process (A New Method of Screening)

    Publication Year: 1972, Page(s):224 - 229
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (966 KB)

    In general, a small proportion of components will be substandard because of some imperfection in the control of the production process. Because no advance knowledge exists as to which are the substandard components, their presence affects the reliability. A great part of the substandard components can be eliminated by means of debugging procedures, but due to a nonzero proportion of defectives of ... View full abstract»

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  • Reliability Optimization of a Series-Parallel System

    Publication Year: 1972, Page(s):230 - 238
    Cited by:  Papers (21)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1469 KB)

    A mathematical model is formulated for optimizing the reliability of a system subject to given linear constraints; the system has several stages in series; each stage has parallel redundancy to improve the reliability. Part I shows a new way to transform the model of constrained optimization to a saddle point problem by using Lagrange multipliers. Conditions are derived for maximizing the reliabil... View full abstract»

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  • Effects of Test Capability on System Reliability and Availability

    Publication Year: 1972, Page(s):239 - 244
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (985 KB)

    The impact, on system reliability and availability, of periodic testing with imperfect test equipment is analyzed. The proportion of the system tested, the frequency of testing, the accuracy of the tests, and the reliability of the test equipment are considered. The bivariate normal probability distribution is used to assess the effects of test equipment accuracy. A recursion model is developed to... View full abstract»

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  • Initial Provisioning of a Standby System with Deteriorating and Repairable Spares

    Publication Year: 1972, Page(s):245 - 247
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (570 KB)

    A technique is developed for finding the time dependent operating probabilities used by reliability systems designers for provisioning a system with N + k identical units, k of which are called spares and N called operating units, and s repair facilities. System failure occurs when less than N units are operational. Units fail with exponential interfailure times and are repaired with exponential s... View full abstract»

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  • Book Review

    Publication Year: 1972, Page(s): 247
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  • Correction to ``Reliability of Some Modularly Redundant Systems''

    Publication Year: 1972, Page(s): 247
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  • List of referees

    Publication Year: 1972
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  • Notices

    Publication Year: 1972, Page(s): 249
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  • 1972 Index IEEE Transactions on Reliability Vol. R-21

    Publication Year: 1972, Page(s):251 - 254
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  • Information for Readers

    Publication Year: 1972, Page(s): nil2
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  • [Front cover]

    Publication Year: 1972, Page(s): c2
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

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Meet Our Editors

Editor-in-Chief
Jeffrey Voas
US National Institute of Standards and Technology (NIST)