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# IEEE Transactions on Reliability

## Filter Results

Displaying Results 1 - 20 of 20
• ### [Front cover]

Publication Year: 1972, Page(s): c1
| PDF (612 KB)
• ### IEEE Reliability Group

Publication Year: 1972, Page(s): nil1
| PDF (125 KB)
• ### [Breaker page]

Publication Year: 1972, Page(s): nil1
| PDF (125 KB)
• ### Preface

Publication Year: 1972, Page(s):127 - 128
| PDF (674 KB)
• ### Editorial

Publication Year: 1972, Page(s): 129
| PDF (142 KB)
• ### List of referees

Publication Year: 1972, Page(s): 130
| PDF (33 KB)
• ### The Philosophy and Mathematics of Bayes' Equation

Publication Year: 1972, Page(s):131 - 135
Cited by:  Papers (12)
| | PDF (1033 KB)

The rudiments of Bayesian philosophy are introduced, and the mathematics of its application are surveyed; there is no uniformity of thought concerning either. The more extreme Bayesian philosophy, which allows subjective probabilities, is a means of plausible reasoning, or of making inferences, through inductive logic. Because inferences concerning reliability concepts are important in the decisio... View full abstract»

• ### Bayes' Equation, Reliability, and Multiple Hypothesis Testing

Publication Year: 1972, Page(s):136 - 147
Cited by:  Papers (5)
| | PDF (2105 KB)

The rudiments of applying Bayes' Equation to hypotheses concerning reliability are introduced in a simple manner. The application is a means of obtaining posterior probabilities, for the reliability hypotheses, which are consistent with the prior beliefs and the available test results. The posterior distributions, from which decision theory could formally arrive at optimal estimates, are greatly d... View full abstract»

• ### Prior Distributions Fitted to Observed Reliability Data

Publication Year: 1972, Page(s):148 - 154
Cited by:  Papers (14)
| | PDF (1063 KB)

This paper describes methods of fitting prior distributions to equipment MTBF = θ, shows the priors fitted to different equipments, establishes data criteria for fitting prior distributions to θ, and presents the results of a robustness analysis performed on the fitted priors. Systematic procedures for fitting priors are shown for Type 1 data (number of failures in fixed time T) an... View full abstract»

• ### An Empirical Bayes Approach to Reliability

Publication Year: 1972, Page(s):155 - 158
Cited by:  Papers (7)
| | PDF (568 KB)

A Bayesian reliability estimation technique known as the empirical Bayes approach' is developed which uses previous experience nce to get a Bayesian point estimator. The techniques require no knowledge of the form of the unknown prior distribution and are robust to assumptions about its form. Empirical Bayes techniques are applicable to situations in which prior, independent observations of the ... View full abstract»

• ### Bayesian Decision Analysis of the Hazard Rate for a Two-Parameter Weibull Process

Publication Year: 1972, Page(s):159 - 169
Cited by:  Papers (6)
| | PDF (1759 KB)

A two-parameter Weibull distribution is assumed to be the appropriate statistical life-model of an engineering device. The hazard rate of this device is the relevant quantity in terms of which statistical decisions are to be made. A Bayesian decision model is constructed around a conjugate probability density function for the Weibull hazard rate. Prior, posterior, and preposterior analysis of this... View full abstract»

• ### Determining Optimum Burn-In and Replacement Times Using Bayesian Decision Theory

Publication Year: 1972, Page(s):170 - 175
Cited by:  Papers (20)
| | PDF (853 KB)

An important problem facing a manufacturer is the determination of the amount of time to burn-in items (in order to eliminate early failures) and the age at which to replace items (to avoid failures due to wearout). This problem becomes difficult to solve if the time-to-failure distribution of an item is unknown and must be estimated from test and operational data. This paper describes a method of... View full abstract»

• ### Bayesian Acceptance Sampling

Publication Year: 1972, Page(s):176 - 180
| | PDF (897 KB)

This tutorial paper shows, via an example, how optimum sampling plans can be derived using Bayesian decision theory. Both nonsequential and sequential sampling plans are described. The Bayesian method is contrasted with classical methods. The salient difference between Bayesian and classical methods is that the Bayesian approach allows one formally to pose and answer the question: How many shoul... View full abstract»

• ### Experience with Bayesian Reliability Measurement of Large Systems

Publication Year: 1972, Page(s):181 - 185
Cited by:  Papers (4)
| | PDF (870 KB)

Experience with two methods of Bayesian reliability measurement is described. An aerospace subsystem was evaluated assuming continuous gamma-distributed component failure rates. Priors were developed by conventional reliability prediction methods based on handbook data. The strength'' of the prior was expressed in terms of variance about a predicted mean. Comparative evaluation was also made by ... View full abstract»

• ### A Personal View of the Bayesian Controversy in Reliability and Statistics

Publication Year: 1972, Page(s):186 - 194
Cited by:  Papers (8)
| | PDF (2069 KB)

There appear to be two important developing trends in reliability. One is away from the use of statistics by reliability engineers; the other is toward increased use of Bayesian techniques. One source of the latter may be disillusionment with what is regarded as classical statistics; however, one source of the former may be dissatisfaction with what has been called Bayesian statistics. The purpose... View full abstract»

• ### Correction to Graphical Analysis of Accelerated Life Test Data with the Inverse Power Law Model''

Publication Year: 1972, Page(s): 195
| PDF (120 KB)
• ### Correction to On a Two-Unit Standby-Redundant System with Imperfect Switchover'' and Reliability Analysis of a Two-Unit Standby-Redundant System with Preventive Maintenance''

Publication Year: 1972, Page(s):196 - 197
| PDF (167 KB)
• ### Book Reviews

Publication Year: 1972, Page(s):197 - 198
| PDF (333 KB)

Publication Year: 1972, Page(s): nil2
| PDF (120 KB)
• ### [Front cover]

Publication Year: 1972, Page(s): c2
| PDF (640 KB)

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu