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IEEE Transactions on Reliability

Issue 4 • Date Oct. 1975

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Displaying Results 1 - 25 of 30
  • [Front cover]

    Publication Year: 1975, Page(s): c1
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  • IEEE Reliability Group

    Publication Year: 1975, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1975, Page(s): nil1
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  • Confidence Intervals for Discrete Variables

    Publication Year: 1975, Page(s): 225
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  • The Misuse of Statistics

    Publication Year: 1975, Page(s): 225
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  • Accelerated Lifetest Results on Submarine-cable Transistors

    Publication Year: 1975, Page(s):226 - 229
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (672 KB)

    A computerized analysis is outlined; it uses a lognormal distribution that is fitted to the observed data by the maximum likelihood method. A typical computer output illustrates the failure levels at operational temperatures. The statistical curve fitting technique aids the analysis of accelerated lifetest data. Failure estimates at junction temperatures, much lower than those under accelerated li... View full abstract»

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  • The Type I Extreme-Value Distribution in Reliability

    Publication Year: 1975, Page(s): 229
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (169 KB)

    First Page of the Article
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  • Graphical Analysis of Accelerated Life Test Data with a Mix of Failure Modes

    Publication Year: 1975, Page(s):230 - 237
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1599 KB)

    An accelerated test of a product under high stress yields life data that are extrapolated to estimate the life distribution at low stress. When the data contain competing failure modes, the dominant modes under high stress may not dominate under low stress. This has made experimenters doubt the validity of tests yielding such data. This expository paper presents new graphical methods for estimatin... View full abstract»

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  • Rebuttal to 'Material Review BoardsߝGood or Bad?'

    Publication Year: 1975, Page(s): 237
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (197 KB)

    First Page of the Article
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  • Microcircuit Accelerated Testing Using High Temperature Operating Tests

    Publication Year: 1975, Page(s):238 - 250
    Cited by:  Papers (22)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (5761 KB)

    The general validity and effectiveness of accelerated tests of microcircuits using both temperature and voltage as accelerating stresses has been demonstrated. However, the inherent effectiveness of the accelerated tests can only be assured through careful selection of the life-test circuit-configuration, and test temperatures, and the effective analysis of the resulting failure data. Careful sele... View full abstract»

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  • Some Thoughts on Minimizing Cost of Arc-Furnace Transformers

    Publication Year: 1975, Page(s):251 - 254
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (907 KB)

    A series of failures of large arc-furnace transformers have caused users and manufacturers to reevaluate their traditional view of transformer reliability. The costs of outages are higher because arcfurnaces now produce a larger fraction of all steel in the Western world than in the past. The purpose of this paper is to present a model for minimizing the costs of failure including down time, cause... View full abstract»

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  • Reliability of Complementary MOS Integrated Circuits

    Publication Year: 1975, Page(s):255 - 259
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1945 KB)

    This paper describes the results of tests of the stability and reliability of complementary MOS (CMOS) integrated circuits (IC). Operating life-tests at 125°C indicated excellent stability of electrical characteristics of both n-channel and p-channel transistors. Over three million device-hours of accelerated operating life-tests indicated a calculated failure rate, at a 60-percent s-confidence l... View full abstract»

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  • Manuscripts Received

    Publication Year: 1975, Page(s): 259
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  • Voting Techniques for Fault Diagnosis from Frequency-Domain Test-Data

    Publication Year: 1975, Page(s):260 - 267
    Cited by:  Papers (14)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1448 KB)

    The basic voting technique, which estimates the posterior fault-probability from prior fault-probability plus test data, is developed from first principles and given a pattern-recognition interpretation. This leads to the philosophy that the technique is one of a family suitable for fault diagnosis, if necessary down to component level, using only input-output frequency-domain test-data. A simulat... View full abstract»

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  • Stabilization of Wearout ߝ Replacement Rate

    Publication Year: 1975, Page(s):268 - 270
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (505 KB)

    It is known that a perfectly maintained complex system of identical components, will, after an initial transient period, behave like a Poisson renewal process. In the present paper we present the results of a specific simulation which was carried out to find out how long the transient period lasts. View full abstract»

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  • Book Reviews

    Publication Year: 1975, Page(s): 270
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  • Estimating the Number of Items on Life Test

    Publication Year: 1975, Page(s):271 - 273
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (396 KB)

    If n items are on life test where n is unknown, and failures are observed either until time T has elapsed or until r failures have occurred, then an estimate of n can be obtained. Both maximum likelihood and Bayes estimates are obtained and both known and unknown failure distributions are considered. View full abstract»

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  • A 2-Dissimilar-Unit Redundant System With Repair And Preventive Maintenance

    Publication Year: 1975, Page(s): 274
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (179 KB)

    This paper presents the stochastic behaviour of a 2-dissimilar--unit cold-standby redundant system with repair and preventive maintenance. The Laplace-Stieltjes transform of (i) The first-passage time distribution to system failure, (ii) The expected number of system failures during (0, t], (iii) The probability that the system fails at time t, are all derived by using unique modifications of a Ma... View full abstract»

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  • A 2-Unit Warm-Standby Redundant System With Delay and One Repair Facility

    Publication Year: 1975, Page(s): 275
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (174 KB)

    This paper introduces the Delay Times (preparing/waiting time for repair). The Laplace-Stieltjes transform of 1) The first-passage time distribution to system failure, 2) The s-expected number of system failures during (0, t], 3) The probability that the system fails at time t, are all derived for a 2-unit warm-standby redundant system by unique modification of a Markov Renewal process. Three exam... View full abstract»

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  • Intermittent Complex Systems

    Publication Year: 1975, Page(s):276 - 277
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    Two models are given for a complex system; they depend on the demand of the system. In Model I, the system is stopped when there is no demand; in Model II, the system is always operable irrespective of the demand. Laplace transforms of the probabilities of the system states are obtained. View full abstract»

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  • Availability of a System Subject to Irregular Short Supervision

    Publication Year: 1975, Page(s):278 - 280
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (526 KB)

    The availability is analysed for a supervised system which has very short and arbitrarily distributed supervisory periods (supervision is a continuous monitoring to detect failures). The Markov model is continuous in time and alternates between two and three discrete states; it leads to an expression which can be used in an iterative calculation of availability. Optimisation of availability is use... View full abstract»

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  • Manuscripts Received

    Publication Year: 1975, Page(s): 280
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  • Algorithms for Solving Reliability Models of Systems Exposed to a 2-State Environment

    Publication Year: 1975, Page(s):281 - 285
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (821 KB)

    An algorithm is described for solving the reliability model of a repairable system of n identical components placed in a fluctuating 2-state environment. An important application is where the effects of alternating normal and severe weather conditions are to be evaluated. A modified version of the algorithm can accommodate the case where faults are followed by switching operations, as in power tra... View full abstract»

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  • Manuscripts Received

    Publication Year: 1975, Page(s): 285
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  • On Standby Redundancy with Delayed Repair

    Publication Year: 1975, Page(s):286 - 287
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (312 KB)

    This paper derives a) the Laplace-Stieltjes transform of the time-to-system-failure distribution, and b) the mean time-to-system-failure. The system consists of several elements with one repair facility which remains idle until a queue of failed units is built up. View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu