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IEEE Transactions on Reliability

Issue 2 • Date June 1964

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Displaying Results 1 - 13 of 13
  • [Front cover]

    Publication Year: 1964, Page(s): c1
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  • Reliability Group

    Publication Year: 1964, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1964, Page(s): nil1
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  • Reliability Programs and the Problem of Attaining High Probabilities of Mission Success in Space Exploration

    Publication Year: 1964, Page(s):1 - 4
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (864 KB)

    The major obstacles to attaining high probabilities of mission success in future space exploration are described to be as follows: dependence on large numbers of propulsive stages in a given vehicle development of relatively many more long-lived components and subsystems than has been possible to achieve to date heed to improve the development process so that a reletively much ower volume of groun... View full abstract»

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  • How much Reliability

    Publication Year: 1964, Page(s):5 - 7
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (468 KB)

    Individually, we may be concerned about a smal portion of the reliability program, Such as probability of success, or economic considerations, or systems effectiveness, or one of the many other reliablility factors, when we should be looking at the whole picture. Reliability is not something that you buy by the piece or pound erdezem and just attach to the equipment, it is something that is inhere... View full abstract»

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  • Environment-Resistant Connector Field Reliability Report

    Publication Year: 1964, Page(s):8 - 15
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1129 KB)

    For several years, a very intensive program has existed within the connector industry to attempt to define and measure connector reliability. One of the stumbling blocks in the way of this necessary work has been the lack of actual field application data and the correlation of connector failures to such data. Over the eleven months stretching from January, 1962 through November, 1962, the Boeing A... View full abstract»

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  • Quantized Probability Circuit Design Principles Applied to Linear Circuits

    Publication Year: 1964, Page(s):16 - 28
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1337 KB)

    A circuit design method for linear circuits is needed which will adequately predict circuit per formance as a function of component tolerances. This paper describes a method which weights the probable component variation from its nominal value into one of three groups; the group assignment depends on how seriously the component variation affects over-all performance This technique, identified as t... View full abstract»

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  • High Reliability Electronic Parts as Justified System Cost Elements

    Publication Year: 1964, Page(s):29 - 32
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (626 KB)

    The planned use of premium electronic parts in a forthcoming system is a logical means for assuring failure-free operation comensurate with the best state-of-the-art. However, an over-all analysis of the value of premium parts must show the net worth of improved system performance to more than offset the added initial parts cost. These costs may be in higher procurement costs, added test and evalu... View full abstract»

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  • A Quantitative Analysis of Semiconductor Device Failure Rates as Graphically Indicated in Military Handbook 217

    Publication Year: 1964, Page(s):33 - 41
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1311 KB)

    A graphical presentation of semiconductor device failure rates is made in Figs. 13B and 14B of Mil-Hdbk-217 (see Figs. 1 and 2). From this presentation, Equations may be derived which indicate interesting properties, to failure physicists, device engineers, and equipment designers. On the basis of the equations it may be concluded that: (1) extrapolating room temperature failure rates from failure... View full abstract»

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  • Digital Circuit Redundancy

    Publication Year: 1964, Page(s):42 - 61
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3249 KB)

    While some original work is presented, this paper is mainly of the nature of a survey of redundancy techniques to date. Several redundancy techniques are described in detail with mathematical models for estimating reliability improvement. The methods are compared on the basis of reliability improvement and general comments are made about applications. The reliability equations for Moore-Shannon, m... View full abstract»

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  • Letter to the Editor

    Publication Year: 1964, Page(s):62 - 63
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  • Contributors

    Publication Year: 1964, Page(s):64 - 65
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  • [Front cover]

    Publication Year: 1964, Page(s): c2
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu