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IEEE Electrical Insulation Magazine

Issue 4 • Date July-Aug. 2009

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Displaying Results 1 - 19 of 19
  • IEEE Electrical Insulation Magazine - Front cover

    Publication Year: 2009, Page(s): C1
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  • Author's Guide

    Publication Year: 2009, Page(s): C2
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  • DEIS videotapes

    Publication Year: 2009, Page(s): C3
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  • Call for proposals - 2009 DEIS Graduate Fellowships

    Publication Year: 2009, Page(s): C4
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  • Table of contents

    Publication Year: 2009, Page(s): 1
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  • IEEE Electrical Insulation Magazine - [Exective committee]

    Publication Year: 2009, Page(s): 2
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  • Editorial

    Publication Year: 2009, Page(s): 3
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  • From the editor's desk

    Publication Year: 2009, Page(s):4 - 5
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  • Reliability and statistical lifetime- prognosis of motor winding insulation in low-voltage power drive systems

    Publication Year: 2009, Page(s):6 - 13
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1231 KB) | HTML iconHTML

    This paper discusses a statistical approach to calculate the reliability and lifetime of the motor insulation system in complex power drive system application statistical lifetime-prognosiss. View full abstract»

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  • Simple Time-to-Failure Estimation Techniques for Reliability and Maintenance of Equipment

    Publication Year: 2009, Page(s):14 - 18
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (848 KB) | HTML iconHTML

    Proper reliability and maintenance best practice processes have a direct impact on equipment availability, throughput capacity, and spare inventories. The purpose of the time-to-failure estimation (TTFE) technique is to provide a tool for engineers and technicians for risk-based reporting of condition- based maintenance tests and inspections. Through the proper application of this technique, corre... View full abstract»

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  • Nanocomposites-a review of electrical treeing and breakdown

    Publication Year: 2009, Page(s):19 - 25
    Cited by:  Papers (58)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (937 KB) | HTML iconHTML

    In this short review, we discussed some aspects of nanocomposites regarding electrical tree growth and breakdown. It appears that nanoparticles, properly mixed and dispersed in the polymer matrix, increase the breakdown strength and hinder the growth of electrical trees in the nanocomposite. Nanoparticles act as barriers obstructing electrical tree growth and delaying dielectric breakdown. This ar... View full abstract»

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  • Repetitive fast voltage stresses-causes and effects

    Publication Year: 2009, Page(s):26 - 39
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3249 KB) | HTML iconHTML

    In this article, we have seen how high-frequency system resonances, triggered by power electronic devices, may enhance both electrical and thermal stress on an insulation system. An important lesson from this study is that even an insulation system that is very well designed according to present standards may fail if it is subjected to stresses that were never considered in the design. The root ca... View full abstract»

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  • EIC vounteer profile

    Publication Year: 2009, Page(s):40 - 41
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  • DEIS News

    Publication Year: 2009, Page(s): 42
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  • D & EI folks [Obituary, Mark Lee Miller; Award, 2009 Power Medal to Bill McDermid]

    Publication Year: 2009, Page(s): 43
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  • News from Japan

    Publication Year: 2009, Page(s):44 - 45
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  • Book reviews [eight reviews]

    Publication Year: 2009, Page(s):46 - 49
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  • Meetings calendar

    Publication Year: 2009, Page(s):50 - 51
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  • IEEE Media advertising sales offices

    Publication Year: 2009, Page(s): 52
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Aims & Scope

The EI Magazine publishes articles written by authors from industry, research institutes and academia. The articles are more practical in content than the papers published in the Transactions.

Full Aims & Scope

Meet Our Editors

Co-Editor-in-Chief
Edward Cherney

Co-Editor-in-Chief
Robert Fleming