By Topic

IEEE Design & Test of Computers

Issue 3 • Date May-June 2009

Filter Results

Displaying Results 1 - 22 of 22
  • [Front cover]

    Publication Year: 2009, Page(s): c1
    Request permission for commercial reuse | PDF file iconPDF (7878 KB)
    Freely Available from IEEE
  • Front Covers 
  • Table of Contents

    Publication Year: 2009, Page(s): c2
    Request permission for commercial reuse | PDF file iconPDF (77 KB)
    Freely Available from IEEE
  • Toc 
  • Departments [Table of Contents]

    Publication Year: 2009, Page(s): 1
    Request permission for commercial reuse | PDF file iconPDF (7836 KB)
    Freely Available from IEEE
  • Metamodeling for model- based system design

    Publication Year: 2009, Page(s): 2
    Request permission for commercial reuse | PDF file iconPDF (398 KB) | HTML iconHTML
    Freely Available from IEEE
  • Society Information

    Publication Year: 2009, Page(s): 3
    Request permission for commercial reuse | PDF file iconPDF (43 KB)
    Freely Available from IEEE
  • Call for Papers

    Publication Year: 2009, Page(s): 5
    Request permission for commercial reuse | PDF file iconPDF (35 KB)
    Freely Available from IEEE
  • Guest Editors' Introduction: The Status of IEEE Std 1500—Part 2

    Publication Year: 2009, Page(s): 4
    Request permission for commercial reuse | PDF file iconPDF (47 KB) | HTML iconHTML
    Freely Available from IEEE
  • Automating IEEE 1500 Core Test—An EDA Perspective

    Publication Year: 2009, Page(s):6 - 15
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2420 KB) | HTML iconHTML

    Standardized design and test practices enable automation. This article describes a methodology and corresponding tool set that combines automated support for IEEE Std 1500 and test data compression in one. In this article, we also provide some solutions to the problem of migrating core test patterns to the SoC design. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Are IEEE-1500-Compliant Cores Really Compliant to the Standard?

    Publication Year: 2009, Page(s):16 - 24
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (168 KB) | HTML iconHTML

    Functional verification of complex SoC designs is a challenging task, which fortunately is increasingly supported by automation. This article proposes a verification component for IEEE Std 1500, to be plugged into a commercial verification tool suite. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Test Data Volume Comparison: Monolithic vs. Modular SoC Testing

    Publication Year: 2009, Page(s):25 - 37
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (244 KB) | HTML iconHTML

    Containing production cost is a major concern for today's complex SoCs. One of the key contributors to production cost is test time and test data volume, for which numerous compression techniques were proposed. This article introduces a different approach to test data volume reduction, namely the use of modular test based on IEEE Std 1500 architecture, and it provides modeling, analysis, and quant... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Metamodels in Europe: Languages, Tools, and Applications

    Publication Year: 2009, Page(s):38 - 53
    Cited by:  Papers (7)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3734 KB) | HTML iconHTML

    This article provides an overview of current efforts in Europe for using metamodeling in the integrated development of critical systems such as automotive electronics. It distinguishes between lightweight versus heavyweight approaches, surveys a number of related current European projects, and gives details about the Speeds project to illustrate the role of metamodeling-driven system engineering. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Metamodeling: An Emerging Representation Paradigm for System-Level Design

    Publication Year: 2009, Page(s):54 - 69
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (208 KB) | HTML iconHTML

    The use of metamodeling in system design allows abstraction of concepts germane to a number of varying modeling domains, and provides the ability of exploiting meta-information for a variety of system design tasks such as analysis, verification, synthesis, and test generation. This article provides an overview of emerging metamodeling techniques and their applications. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Comprehensive Approach to High-Performance Server Chipset Debug

    Publication Year: 2009, Page(s):70 - 77
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (132 KB) | HTML iconHTML

    This article describes a comprehensive approach for silicon debug of a server chipset that includes a high-performance, third-generation chip-multithreaded (CMT) Sparc microprocessor. Efficiently debugging the chipset required a combination of debug features in silicon and system platforms, firmware support for debug, test generation tools, and debug data interpretation tools. Several useful lesso... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Core-Based Testing of Embedded Mixed-Signal Modules in a SoC

    Publication Year: 2009, Page(s):78 - 86
    Cited by:  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1115 KB) | HTML iconHTML

    This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • DATE 2009 Workshop on 3D Integration

    Publication Year: 2009, Page(s): 87
    Request permission for commercial reuse | PDF file iconPDF (79 KB) | HTML iconHTML
    Freely Available from IEEE
  • CEDA Currents

    Publication Year: 2009, Page(s):88 - 90
    Request permission for commercial reuse | PDF file iconPDF (496 KB) | HTML iconHTML
    Freely Available from IEEE
  • DATC Newsletter

    Publication Year: 2009, Page(s): 91
    Request permission for commercial reuse | PDF file iconPDF (317 KB)
    Freely Available from IEEE
  • Book Review: A book on system test, and testing systems also

    Publication Year: 2009, Page(s):92 - 93
    Request permission for commercial reuse | PDF file iconPDF (206 KB) | HTML iconHTML
    Freely Available from IEEE
  • Test Technology TC Newsletter

    Publication Year: 2009, Page(s):94 - 95
    Request permission for commercial reuse | PDF file iconPDF (792 KB)
    Freely Available from IEEE
  • Metamodeling: What is it good for?

    Publication Year: 2009, Page(s): 96
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (63 KB) | HTML iconHTML

    The past decade has seen a penchant for abstraction in hardware design. Papers and books have proliferated about how to elevate hardware design entry beyond HDLs. Various languages, transactional concepts, tools for synthesis, equivalence checking, and so forth have been brought to the market. Despite so much progress with design aids, another important way of enhancing design productivity was uni... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • [Advertisement - Back cover]

    Publication Year: 2009, Page(s): c3
    Request permission for commercial reuse | PDF file iconPDF (1908 KB)
    Freely Available from IEEE
  • [Advertisement - Back cover]

    Publication Year: 2009, Page(s): c4
    Request permission for commercial reuse | PDF file iconPDF (12835 KB)
    Freely Available from IEEE

Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty