Issue 3 • Date May-June 2009
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Displaying Results 1 - 22 of 22
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[Front cover]
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PDF (7878 KB)
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[Front cover]
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PDF (77 KB)
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Contents
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PDF (7836 KB)
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Metamodeling for model- based system design
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PDF (398 KB)
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Society Information
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PDF (43 KB)
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Call for Papers
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PDF (35 KB)
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Guest Editors' Introduction: The Status of IEEE Std 1500—Part 2
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PDF (47 KB)
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Automating IEEE 1500 Core Test—An EDA Perspective
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PDF (2420 KB)
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DATE 2009 Workshop on 3D Integration
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PDF (79 KB)
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CEDA Currents
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PDF (496 KB)
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DATC Newsletter
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PDF (317 KB)
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Book Review: A book on system test, and testing systems also
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PDF (206 KB)
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Test Technology TC Newsletter
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PDF (792 KB)
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Metamodeling: What is it good for?
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PDF (63 KB)
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[Advertisement - Back cover]
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PDF (1908 KB)
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[Advertisement - Back cover]
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PDF (12835 KB)
Aims & Scope
IEEE Design & Test of Computers was published between 1984 and 2012. The latest title for this publication is IEEE Design & Test.
Meet Our Editors
Editor-in-Chief
Krishnendu Chakrabarty


