Journal of Applied Physics
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Issue 7 • Date Oct 2003
Filter Results
Displaying Results 1 - 25 of 85
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Remote hydrogen plasma processing of ZnO single crystal surfaces
Strzhemechny, Yuri M. ; Nemergut, John ; Smith, Phillip E. ; Bae, Junjik ; Look, David C. ; Brillson, L.J.
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PDF (231 KB)
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Emission and reflection spectra from
AlxGa1-xN/GaN single heterostructuresReynolds, D.C. ; Hoelscher, J. ; Litton, C.W. ; Collins, T.C. ; Fitch, R. ; Via, G.D. ; Gillespie, J. ; Crespo, A. ; Jenkins, T.J. ; Saxler, A. |
PDF (69 KB)
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Spontaneous emission, light–current characteristics, and polarization bistability range in vertical-cavity surface-emitting lasers
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PDF (100 KB)
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Structural and optical characterization of porous anodic aluminum oxide
Galca, Aurelian C. ; Kooij, E.Stefan ; Wormeester, Herbert ; Salm, C. ; Leca, V. ; Rector, Jan H. ; Poelsema, Bene |
PDF (367 KB)
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Cathodoluminescence characterization of dislocations in gallium nitride using a transmission electron microscope
Yamamoto, N. ; Itoh, H. ; Grillo, V. ; Chichibu, S.F. ; Keller, S. ; Speck, J.S. ; DenBaars, S.P. ; Mishra, U.K. ; Nakamura, S. ; Salviati, G. |
PDF (299 KB)
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Crystalline orientation of polycrystalline silicon with disklike grains produced by silicide-mediated crystallization of amorphous silicon
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PDF (508 KB)
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Compositional dependence of Raman scattering and photoluminescence emission in
CuxGaySe2 thin filmsXue, C. ; Papadimitriou, D. ; Raptis, Y.S. ; Esser, N. ; Richter, W. ; Siebentritt, S. ; Lux-Steiner, M.Ch. |
PDF (132 KB)
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Monte Carlo simulation of organic light-emitting devices under alternating applied field
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PDF (116 KB)
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Complementary infrared and transmission electron microscopy studies of the effect of high temperature–high pressure treatments on oxygen-related defects in irradiated silicon
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PDF (196 KB)
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Infrared spectroscopic study on the Langmuir–Blodgett films of merocyanine dye–arachidic acid–n-octadecane ternary system
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PDF (122 KB)
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Three-dimensional simulation of rapid melting and resolidification of thin Si films by excimer laser annealing
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PDF (349 KB)
Aims & Scope
Journal of Applied Physics is the American Institute of Physics' (AIP) archival journal for significant new results in applied physics
Meet Our Editors
Editor
P. James Viccaro
Argonne National Laboratory
