Journal of Applied Physics
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Issue 1 • Date Jan 2000
Filter Results
Displaying Results 1 - 25 of 103
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Series resistance and its effect on the maximum output power of 1.5 μm strained-layer multiple-quantum-well ridge waveguide InGaAsP lasers
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PDF (173 KB)
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Finite-cell-gap corrections to the capacitance analysis of liquid crystal displays with periodic interdigital electrodes
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PDF (90 KB)
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A scalar variational method for resonant modes of oxide-apertured vertical-cavity surface-emitting lasers
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PDF (194 KB)
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Excimer laser-induced temperature field in melting and resolidification of silicon thin films
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PDF (524 KB)
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Scanning tunneling microscopy and spectroscopy characterization of ion-beam-induced dielectric degradation in ultrathin
SiO2 films and its thermal recovery process |
PDF (319 KB)
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Elastic properties of nanoparticle chain aggregates of
TiO2, Al2O3, andFe2O3 generated by laser ablation |
PDF (1108 KB)
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Spatial and angle distribution of internal stresses in nano- and microstructured chemical vapor deposited diamond as revealed by Brillouin spectroscopy
Kruger, J.K. ; Embs, J.P. ; Lukas, S. ; Hartmann, U. ; Brierley, C.J. ; Beck, C.M. ; Jimenez, R. ; Alnot, P. ; Durand, O. |
PDF (225 KB)
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Electromigration-induced drift in damascene and plasma-etched Al(Cu). I. Kinetics of Cu depletion in polycrystalline interconnects
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PDF (591 KB)
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Electromigration-induced drift in damascene and plasma-etched Al(Cu). II. Mass transport mechanisms in bamboo interconnects
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PDF (354 KB)
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Zinc self-diffusion, electrical properties, and defect structure of undoped, single crystal zinc oxide
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PDF (95 KB)
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Effects of precursors and substrate materials on microstructure, dielectric properties, and step coverage of
(Ba, Sr)TiO3 films grown by metalorganic chemical vapor deposition |
PDF (713 KB)
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Structural characterization of oxidized allotaxially grown
CoSi2 layers by x-ray scatteringKaendler, I.D. ; Seeck, O.H. ; Schlomka, J.-P. ; Tolan, M. ; Press, W. ; Stettner, J. ; Kappius, L. ; Dieker, C. ; Mantl, S. |
PDF (153 KB)
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Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry
Slotte, J. ; Laakso, A. ; Ahlgren, T. ; Rauhala, E. ; Salonen, R. ; Raisanen, J. ; Simon, A. ; Uzonyi, I. ; Kiss, A.Z. ; Somorjai, E. |
PDF (365 KB)
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Relative importance of the Si–Si bond and Si–H bond for the stability of amorphous silicon thin film transistors
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PDF (152 KB)
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Stranski-Krastanov growth of Al on Cr layers during molecular-beam epitaxial growth and its influence on the structure of epitaxial (001) Al/Cr superlattices
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PDF (312 KB)
Aims & Scope
Journal of Applied Physics is the American Institute of Physics' (AIP) archival journal for significant new results in applied physics
Meet Our Editors
Editor
P. James Viccaro
Argonne National Laboratory
