IEEE Design & Test of Computers

Issue 2 • May 1984

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  • [Front cover]

    Publication Year: 1984, Page(s): c1
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  • [Advertisement]

    Publication Year: 1984, Page(s):nil1 - 3
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  • IEEE Computer Society

    Publication Year: 1984, Page(s): 4
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  • Tables of contents

    Publication Year: 1984, Page(s):4 - 5
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  • [Breaker page]

    Publication Year: 1984, Page(s):4 - 5
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  • Editorial Board

    Publication Year: 1984, Page(s): 5
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  • [Advertisement]

    Publication Year: 1984, Page(s):6 - 9
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  • From the Editor-in-Chief

    Publication Year: 1984, Page(s): 10
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  • [Advertisement]

    Publication Year: 1984, Page(s):11 - 13
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  • D&T Scene

    Publication Year: 1984, Page(s):14 - 24
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  • [Advertisement]

    Publication Year: 1984, Page(s):17 - 26
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  • Linking Design&Test

    Publication Year: 1984, Page(s):27 - 31
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3696 KB)

    First Page of the Article
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  • [Advertisement]

    Publication Year: 1984, Page(s): 32
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  • Self-Testing the Motorola MC6804P2

    Publication Year: 1984, Page(s):33 - 41
    Cited by:  Papers (28)  |  Patents (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (8898 KB)

    The internal serial architecture of the MC6804P2??Motorola's smallest 8-bit, single-chip microcomputer??and the need to minimize test costs led to development of a built-in self-test scheme. The self test is based on a ROM-driven signature analysis technique that utilizes polynomial division to compress lengthy output responses (or signatures) to much smaller results. On-chip signature analysis is... View full abstract»

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  • A Digital Polarity Correlator with Built-in Self Test and Self Repair

    Publication Year: 1984, Page(s):42 - 49
    Cited by:  Papers (2)
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    Correlation techniques are widely used in communications, instrumentation, computers, telemetry, and other signal processing systems to detect a desired signal in the presence of noise, to recognize patterns, and to measure time delays. With the development of VLSI, correlation can be performed efficiently with a minimal number of components. The correlator chip presented in this article consists ... View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s):50 - 51
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  • Design for Testability and Self-Testing Approaches for Bit-Serial signal Processors

    Publication Year: 1984, Page(s):52 - 59
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (5889 KB)

    This article presents design for testability and self-testing approaches for bit-serial signal processors??specifically, for an integrated circuit consisting of bit-serial data paths whose integration level requires approximately 120,000 transistors packaged in a 68-pin chip carrier. The bit-serial architecture lends itself to a scan-type approach for functional testing with minimum design modific... View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s): 59
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  • Call for Papers

    Publication Year: 1984, Page(s): 60
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  • Testability Emphasis in the General Electric A/VLSI Program

    Publication Year: 1984, Page(s):61 - 65
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1519 KB)

    General Electric's Aerospace Business Group has initiated an extensive Advanced Very Large Scale Integration Program to generate the technology needed to produce 1.25-micron integrated circuits that will substantially improve its military products. This article emphasizes practical real-world experiences encountered in designing for testability. It discusses test-oriented macrocells, design rules,... View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s):65 - 67
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  • CATA: A Computer-Aided Test Analysis System

    Publication Year: 1984, Page(s):68 - 79
    Cited by:  Papers (21)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (7226 KB)

    The computer-aided test analysis system helps engineers design systems for testability, both in manufacturing and field maintenance situations. CATA provides test program specifications automatically, and supplies both the information paths through the system and a top-down organization of test procedures. CATA can be applied at various levels of description (from behavioral to register transfer) ... View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s):80 - 81
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  • IEEE Design&Test of Computers

    Publication Year: 1984, Page(s): 82
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  • Hitest: A Knowledge-Based Test Generation System

    Publication Year: 1984, Page(s):83 - 92
    Cited by:  Papers (26)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (5543 KB)

    Efforts to develop computer-based automatic test generation for digital circuits have been generally unsuccessful, except in the case of combinational circuitry. Current ATPG methods for sequential circuits often require a considerable amount of computer time and generate unstructured test waveforms of limited value. Experienced human test programmers, on the other hand, appear to have little diff... View full abstract»

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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty