IEEE Design & Test of Computers

Issue 1 • Feb. 1984

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  • [Front cover]

    Publication Year: 1984, Page(s): c1
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  • [Advertisement]

    Publication Year: 1984, Page(s):2 - 3
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  • IEEE Computer Society

    Publication Year: 1984, Page(s): 4
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  • Tables of contents

    Publication Year: 1984, Page(s):4 - 5
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  • [Breaker page]

    Publication Year: 1984, Page(s):4 - 5
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  • Editorial Board

    Publication Year: 1984, Page(s): 5
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  • [Advertisement]

    Publication Year: 1984, Page(s):6 - 7
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  • From the Editor-in-Chief

    Publication Year: 1984, Page(s):8 - 9
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  • Introducing the IEEE Design&Test of Computers Editorial Board

    Publication Year: 1984, Page(s):9 - 11
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  • Information for authors

    Publication Year: 1984, Page(s):10 - 12
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  • About the cover

    Publication Year: 1984, Page(s): 13
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  • [Advertisement]

    Publication Year: 1984, Page(s):14 - 15
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  • Guest Editor's Introduction Design Automation

    Publication Year: 1984, Page(s):16 - 17
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  • Improving color CAD Systems for Users: Some Suggestions from Human Factors Studies

    Publication Year: 1984, Page(s):18 - 27
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (5987 KB)

    Human factors studies reveal that users' perceptions of a CAD system may be quite different from the developers' concepts. View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s):28 - 29
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  • IBM'S Engineering Design System Support for VLSI Design and Verification

    Publication Year: 1984, Page(s):30 - 40
    Cited by:  Papers (15)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (7863 KB)

    VLSI has fundamentally changed the relationship of the design automation tool developer and the product designer. IBM's design and verification subsystem responds to that change. View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s):41 - 43
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  • N.mPc: A Study in University-Industry Technology Transfer

    Publication Year: 1984, Page(s):44 - 56
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (5628 KB)

    A good idea-in this case, new, practical techniques for the design of multiple-microprocessor and VLSI systems-and industry/academia cooperation can lead to unexpected commercial success. View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s):57 - 59
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  • The VLSI Design Automation Assistant: An IBM System/370 Design

    Publication Year: 1984, Page(s):60 - 69
    Cited by:  Papers (14)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (7199 KB)

    The Design Automation Assistant speeds VLSI chip design. More Importantly, perhaps, it makes explicit some of the intuition and common sense that are important elements of expertise. View full abstract»

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  • 1984 IEEE International Conference on Computer-Aided Design

    Publication Year: 1984, Page(s): 70
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  • Fast Pass-Transistor Simulation for Custom MOS Circuits

    Publication Year: 1984, Page(s):71 - 81
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (7124 KB)

    This approach uses the Yorktown Simulation Engine to bridge the gap between electrical and gate-level simulators. It is well-suited to fault simulation and design verification. View full abstract»

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  • [Advertisement]

    Publication Year: 1984, Page(s): 81
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  • ACM IEEE 21st Design Automation Conference

    Publication Year: 1984, Page(s): 82
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  • Critical Path Tracing: An Alternative to Fault Simulation

    Publication Year: 1984, Page(s):83 - 93
    Cited by:  Papers (120)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (7746 KB)

    Critical path tracing determines fault detection without explicit. fault simulation. It appears to be a more efficient alternative to conventional methods. View full abstract»

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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty