Review of Scientific Instruments
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Issue 6 • Date Jun 2007
Filter Results
Displaying Results 1 - 25 of 60
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Invited Article: Simultaneous mapping of temperature and stress in microdevices using micro-Raman spectroscopy
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PDF (652 KB)
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Transient two-dimensional IR spectrometer for probing nanosecond temperature-jump kinetics
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PDF (1028 KB)
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Dynamic photolytical actinometry of the vacuum-ultraviolet radiation produced by multichannel surface discharges of submicrosecond duration
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PDF (546 KB)
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Differential mode excitation photoacoustic spectroscopy: A new photoacoustic detection scheme
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PDF (271 KB)
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Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors
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PDF (737 KB)
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Detection of charged particles with charge injection devices
Fletcher, Kurtis A. ; Apker, Benjamin ; Hammond, Samantha ; Punaro, John ; Marshall, Frederic J. ; Laine, Jonathan ; Forties, Robert |
PDF (137 KB)
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Design and construction of uniform glow discharge plasma system operating under atmospheric condition
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PDF (135 KB)
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Reconstruction method of local density fluctuation for heavy ion beam probe measurements
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PDF (608 KB)
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Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR
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PDF (592 KB)
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Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes
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PDF (596 KB)
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Design of a scanning probe microscope with advanced sample treatment capabilities: An atomic force microscope combined with a miniaturized inductively coupled plasma source
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PDF (546 KB)
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Easy and direct method for calibrating atomic force microscopy lateral force measurements
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PDF (555 KB)
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Direct measurement of cantilever spring constants and correction for cantilever irregularities using an instrumented indenter
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PDF (489 KB)
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Resonator combined with a piezoelectric actuator for chemical analysis by force microscopy
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PDF (583 KB)
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Aberration-corrected multipole Wien filter for energy-filtered x-ray photoemission electron microscopy
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PDF (656 KB)
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Aims & Scope
Review of Scientific Instruments, published by the American Institute of Physics, is devoted to scientific instruments, apparatus, and techniques.
Meet Our Editors
Editor
Albert T. Macrander
Argonne National Laboratory
