Review of Scientific Instruments
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Issue 3 • Date Mar 2007
Filter Results
Displaying Results 1 - 25 of 70
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Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: “Atom-probe tomography” [Rev. Sci. Instrum. 78, 031101 (2007)]
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PDF (63 KB)
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Artificial submicron or nanometer speckle fabricating technique and electron microscope speckle photography
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PDF (385 KB)
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Quasi-Fourier-transform limited, scannable, high energy titanium-sapphire laser source for high resolution spectroscopy
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PDF (1027 KB)
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Feedback system for improving the performance of extended x-ray absorption fine structure measurements
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PDF (294 KB)
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A precise method to determine the angular distribution of backscattered light to high angles
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PDF (406 KB)
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Dead-time optimized time-correlated photon counting instrument with synchronized, independent timing channels
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PDF (350 KB)
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Mega-ampere submicrosecond generator GIT-32
Kovalchuk, B.M. ; Kharlov, A.V. ; Kiselev, V.N. ; Kumpyak, E.V. ; Zorin, V.B. ; Chupin, V.V. ; Morozov, A.V. |
PDF (212 KB)
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Modeling magnetic fields measured by surface probes embedded in a cylindrical flux conserver
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PDF (143 KB)
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Development of a microlateral force sensor and its evaluation using lateral force microscopy
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PDF (988 KB)
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In situ azimuthal rotation device for linear dichroism measurements in scanning transmission x-ray microscopy
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PDF (1331 KB)
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X-ray imaging with grazing-incidence microscopes developed for the LIL program
Rosch, R. ; Boutin, J.Y. ; le Breton, J.P. ; Gontier, D. ; Jadaud, J.P. ; Reverdin, C. ; Soullie, G. ; Lidove, G. ; Maroni, R. |
PDF (694 KB)
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Implementation of diffractive optical element in four-wave mixing scheme for ex situ characterization of hydride vapor phase epitaxy-grown GaN layers
Jarasiunas, K. ; Aleksiejunas, R. ; Malinauskas, T. ; Gudelis, V. ; Tamulevicius, T. ; Tamulevicius, S. ; Guobiene, A. ; Usikov, A. ; Dmitriev, V. ; Gerritsen, H.J. |
PDF (341 KB)
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Computer-controlled susceptometer for investigating the linear and nonlinear dielectric response
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PDF (133 KB)
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Portable chamber for the study of UHV prepared electrochemical interfaces by hard x-ray diffraction
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PDF (560 KB)
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Aims & Scope
Review of Scientific Instruments, published by the American Institute of Physics, is devoted to scientific instruments, apparatus, and techniques.
Meet Our Editors
Editor
Albert T. Macrander
Argonne National Laboratory
