Review of Scientific Instruments
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Issue 10 • Date Oct 1994
Filter Results
Displaying Results 1 - 25 of 41
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MEVVA ion source for the ITEP synchrotron
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PDF (306 KB)
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The ‘‘TITAN’’ ion source
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PDF (939 KB)
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Metal vapor vacuum arc ion sources ‘‘Raduga’’
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PDF (1182 KB)
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Self‐starting femtosecond pulse generation from a Ti:sapphire laser synchronously pumped by a pointing‐stabilized mode‐locked Nd:YAG laser
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PDF (652 KB)
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A wide‐range ultraviolet lidar system for tropospheric ozone measurements: Development and application
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PDF (2944 KB)
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Implementation of a position sensitive detection system in a scattered electron‐Auger electron coincidence experiment
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PDF (693 KB)
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Electron optical benches for in‐line and branched systems. A new bench designed for mirror‐based aberration correction and low energy electron microscopy
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PDF (1701 KB)
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Efficient compensation method for reducing ripple of Cockcroft–Walton generator in an ultrahigh‐voltage electron microscope
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PDF (597 KB)
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Scanning tunneling microscope combined with scanning electron microscope for the study of grain boundaries
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PDF (785 KB)
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An ultrahigh vacuum scanning tunneling microscope for use at variable temperature from 10 to 400 K
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PDF (996 KB)
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A low temperature, ultrahigh vacuum, microwave‐frequency‐compatible scanning tunneling microscope
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PDF (791 KB)
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A new high‐resolution two‐dimensional micropositioning device for scanning probe microscopy applications
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PDF (544 KB)
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Aims & Scope
Review of Scientific Instruments, published by the American Institute of Physics, is devoted to scientific instruments, apparatus, and techniques.
Meet Our Editors
Editor
Albert T. Macrander
Argonne National Laboratory
