Issue 6 • Date Nov 1991
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Displaying Results 1 - 25 of 175
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Issue Table of Contents
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PDF (1178 KB)
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Oxidation sharpening of silicon tips
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PDF (918 KB)
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Desorption from oxide films made by plasma enhanced chemical vapor deposition using tetraethylorthosilicate
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PDF (521 KB)
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Influence of silicon nitride deposition conditions on the electrical properties of oxide‐nitride (ON) dielectrics on smooth and as‐deposited rugged polycrystalline silicon
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PDF (754 KB)
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Detailed measurements and simplified modeling of wafer charging in different barrel reactor configurations
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PDF (1084 KB)
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Thermodynamics of the homogeneous and heterogeneous decomposition of trimethylaluminum, monomethylaluminum, and dimethylaluminumhydride: Effects of scavengers and ultraviolet‐laser photolysis
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PDF (1607 KB)
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Novel method for measuring and analyzing surface roughness on semiconductor laser etched facets
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PDF (1155 KB)
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Improving projection lithography image illumination by using sources far from the optical axis
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PDF (525 KB)
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Novel indices characterizing resolution power of photoresist for half‐micron feature size photolithography
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PDF (836 KB)
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Molecular beam epitaxy growth and physical characterization of precise, narrow, triangular heterostructures using an analog grading algorithm
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PDF (1522 KB)
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Resolution limits of optical lithography
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PDF (629 KB)
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Facetless Bragg reflector surface‐emitting AlGaAs/GaAs lasers fabricated by electron‐beam lithography and chemically assisted ion‐beam etching
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PDF (748 KB)
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Nanofabrication techniques for 100 nm‐scale silicon metal oxide semiconductor field effect transistor
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PDF (1038 KB)
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Fabrication of electroplated T gates with 60 nm gate length for pseudomorphic high electron mobility transistor devices
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PDF (796 KB)
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First step towards application of high‐temperature superconductors for planar magnetic lenses
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PDF (769 KB)
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Aims & Scope
The Journal of Vacuum Science and Technology B is devoted to reports of original research, review articles, and Critical Review articles.
Meet Our Editors
Editor
Gary E. McGuire
International Technology Center


