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Computer-Aided Engineering Journal

Issue 4 • Date August 1987

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Displaying Results 1 - 12 of 12
  • News

    Publication Year: 1987 , Page(s): 150 - 151
    Save to Project icon | PDF file iconPDF (930 KB)  
    Freely Available from IEEE
  • TechAlert

    Publication Year: 1987 , Page(s): 152 - 153
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    Freely Available from IEEE
  • The SERC engineering design initiative

    Publication Year: 1987 , Page(s): 154 - 156
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (775 KB)  

    The SERC's engineering design initiative, launched as a result of the 1984 Lickley Report, aims to increase the amount of SERC-funded research directed at the needs of designers in industry. This article reviews the role of the initiative in promoting research in engineering design. View full abstract»

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  • Techniques for designing production systems

    Publication Year: 1987 , Page(s): 157 - 159
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (597 KB)  

    While individual production technologies are developing rapidly to meet modern manufacturing objectives, emphasis now needs to be directed towards finding ways of maximising their effectiveness when the various components are combined into systems. In supporting the optimal designs of complex systems like FMS, new tools are required that not only follow a systems approach but also attempt to prescribe a system design. This paper provides some background to FMS design, briefly reviews several supporting design techniques, and highlights the need for new tools that will lead to more effective systems. View full abstract»

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  • Evaluating the cost of using an ATE - a structured approach

    Publication Year: 1987 , Page(s): 160 - 166
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    Despite an increasing awareness of the fundamental role of test and testability in the production of electronic components, many organisations are unable to make an accurate assessment of the cost of a test operation or investment. By working through a mythical test installation case study, this paper presents a structured framework and methodology for determining the true cost of testing and suggests ways in which that cost could be reduced. View full abstract»

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  • Computer integrated manufacturing

    Publication Year: 1987 , Page(s): 167 - 174
    Cited by:  Papers (1)
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (1545 KB)  

    CADCAM alone is not CIM, but engineering data lies at the heart of CIM. This article discusses today's business challenges, the need for integration and one key element of CIM ¿ the engineering database. Finally, the financial implications and the necessary steps to implementation of a company-wide CIM strategy are described. View full abstract»

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  • Design for testability-the need for change

    Publication Year: 1987
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (159 KB)  

    There are at present very few higher educational establishments that are approaching the teaching of electronics design for testability in any realistic way. However, Brunel University has made efforts to include test topics in undergraduate, postgraduate and industrial courses, and for the future has plans to establish an Institute of Test Engineering. View full abstract»

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  • Test education for students and industry at Brunel University

    Publication Year: 1987 , Page(s): 176 - 178
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (631 KB)  

    There are at present very few higher educational establishments that are approaching the teaching of electronics design for testability in any realistic way. However, Brunel University has made efforts to include test topics in undergraduate, postgraduate and industrial courses, and for the future has plans to establish an Institute of Test Engineering. View full abstract»

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  • Undergraduate teaching at Southampton University - a preparation for industry

    Publication Year: 1987 , Page(s): 179 - 181
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (666 KB)  

    The emergence of testing as a significant separate problem in electronics means that test, and specifically design for testability, should form an integral part of an undergraduate electronics course. This articles reviews undergraduate teaching in this area at Southampton University and considers the industrial relevance of DFT. View full abstract»

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  • Design for testability - converting a graduate into a professional engineer

    Publication Year: 1987 , Page(s): 182 - 185
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    Many young graduates enter the electronics industry laden with technical misconceptions. By adopting the viewpoint of such a new graduate, this article aims to show how not to cope with testability, and then offers some advice on the testability topics that should be taught at higher-education level. View full abstract»

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  • Testability - getting the message across to the 'mature' engineer

    Publication Year: 1987 , Page(s): 186 - 187
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (288 KB)  

    The new graduate intake into the electronics industry tends to have had little or no formal teaching in design for testability. This article suggests ways of getting across the DFT message to both newly graduated and practising engineers. View full abstract»

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  • Products

    Publication Year: 1987 , Page(s): 188 - 190
    Save to Project icon | PDF file iconPDF (673 KB)  
    Freely Available from IEEE