Scheduled System Maintenance
On Friday, October 20, IEEE Xplore will be unavailable from 9:00 PM-midnight ET. We apologize for the inconvenience.

# IEEE Transactions on Reliability

## Filter Results

Displaying Results 1 - 25 of 29

Publication Year: 2009, Page(s):C1 - 1
| PDF (41 KB)
• ### IEEE Transactions on Reliability publication information

Publication Year: 2009, Page(s): C2
| PDF (35 KB)
• ### A General Neural Network Model for Estimating Telecommunications Network Reliability

Publication Year: 2009, Page(s):2 - 9
Cited by:  Papers (16)
| | PDF (291 KB) | HTML

This paper puts forth a new encoding method for using neural network models to estimate the reliability of telecommunications networks with identical link reliabilities. Neural estimation is computationally speedy, and can be used during network design optimization by an iterative algorithm such as tabu search, or simulated annealing. Two significant drawbacks of previous approaches to using neura... View full abstract»

• ### Incorporating Common-Cause Failures Into the Modular Hierarchical Systems Analysis

Publication Year: 2009, Page(s):10 - 19
Cited by:  Papers (17)
| | PDF (432 KB) | HTML

This paper considers the problem of evaluating the reliability of hierarchical systems subject to common-cause failures (CCF); and dynamic failure behavior such as spares, functional dependence, priority dependence, and dependence caused by multi-phased operations. We present a separable solution that has low computational complexity, and which is easy to integrate into existing analytical methods... View full abstract»

• ### A Decomposition-Based Modeling Framework for Complex Systems

Publication Year: 2009, Page(s):20 - 33
Cited by:  Papers (8)
| | PDF (568 KB) | HTML

Stochastic model-based approaches are widely used for performability evaluation of complex software/hardware systems. Many techniques have been developed to mitigate the complexity of the associated models, but most of them are domain-specific, and they support the analysis of a limited class of systems. This paper provides a contribution in the definition of a general modeling framework that adop... View full abstract»

• ### System Reliability Evaluation for a Multistate Supply Chain Network With Failure Nodes Using Minimal Paths

Publication Year: 2009, Page(s):34 - 40
Cited by:  Papers (32)
| | PDF (220 KB) | HTML

This work devotes to the application of network methods for the reliability of a complex supply chain system, which is a set of several factories with supply-demand relationship. Two characters are considered in the proposed network: 1) nodes, and arcs all have multiple possible capacities, and may fail; and 2) the capacity weight varies with arcs, nodes, and types of commodity. The purpose of thi... View full abstract»

• ### Discrete Repairable Systems With External and Internal Failures Under Phase-Type Distributions

Publication Year: 2009, Page(s):41 - 52
Cited by:  Papers (3)
| | PDF (407 KB) | HTML

We study a multi-component system subject to internal, and external failures. The external failures may be repairable, or not. The unit enters the repair channel when a repairable failure occurs and there is a repairman available. The random times involved in the study of the system are phase-type distributed. From this system, new ones are developed. General systems with internal, and external re... View full abstract»

• ### Variable Ordering to Improve BDD Analysis of Phased-Mission Systems With Multimode Failures

Publication Year: 2009, Page(s):53 - 57
Cited by:  Papers (14)
| | PDF (151 KB) | HTML

Recently, Z. Tang, and J. B. Dugan proposed a new algorithm (DEP-BDD) based on binary decision diagrams (BDD) for reliability analysis of phased-mission systems (PMS) with multimode failures. Although the variable ordering is very important from a practical point of view, it has not been treated directly. This paper develops four ordering heuristics for DEP-BDD based on two ordinary schemes, and e... View full abstract»

• ### Redundancy vs. Protection vs. False Targets for Systems Under Attack

Publication Year: 2009, Page(s):58 - 68
Cited by:  Papers (24)
| | PDF (331 KB) | HTML

A system consists of identical elements. The cumulative performance of these elements should meet a demand. The defender applies different actions to reduce a damage associated with system performance reduction below the demand that is caused by an external attack. There are three types of the defensive actions: providing system redundancy (deploying genuine system elements (GE) with cumulative pe... View full abstract»

• ### Evidential Networks for Reliability Analysis and Performance Evaluation of Systems With Imprecise Knowledge

Publication Year: 2009, Page(s):69 - 87
Cited by:  Papers (27)
| | PDF (1943 KB) | HTML

This paper deals with evidential networks to manage imprecise probabilities. Evidential networks are directed acyclic graphs that handle random, and epistemic uncertainties thanks to Dempster-Shafer structures. After we recall useful bases of the Dempster-Shafer theory, and the relation with probability intervals, we explain how to handle imprecision. Evidential networks are extended with imprecis... View full abstract»

• ### A Fast and Robust Reliability Evaluation Algorithm for Generalized Multi-State $k$ -out-of-$n$ Systems

Publication Year: 2009, Page(s):88 - 97
Cited by:  Papers (20)
| | PDF (238 KB) | HTML

The generalized multi-state k -out-of-n system model proposed recently provides more flexibility in describing practical systems. In this model, there are n components in the system where each component, as well as the system, can be in one of M+1 possible states: 0, 1,hellip, m. The system is in state j or above if there exists an integer value l(<... View full abstract»

• ### Simultaneous Quality and Reliability Optimization for Microengines Subject to Degradation

Publication Year: 2009, Page(s):98 - 105
Cited by:  Papers (30)
| | PDF (746 KB) | HTML

Micro-electro-mechanical systems (MEMS) represent an exciting new technology, but to achieve more widespread usage and wider adoption within more industrial applications, they must be highly reliable, and manufactured to stringent quality standards. Many challenging manufacturing issues are of concern during the fabrication of MEMS, such as precise dimensional inspection, reliability modeling, bur... View full abstract»

• ### Residual Life Predictions in the Absence of Prior Degradation Knowledge

Publication Year: 2009, Page(s):106 - 117
Cited by:  Papers (63)
| | PDF (581 KB) | HTML

Recent developments in degradation modeling have been targeted towards utilizing degradation-based sensory signals to predict residual life distributions. Typically, these models consist of stochastic parameters that are estimated with the aid of an historical database of degradation signals. In many applications, building a degradation database, where components are run-to-failure, may be very ex... View full abstract»

• ### A Discrete Stress-Strength Interference Model With Stress Dependent Strength

Publication Year: 2009, Page(s):118 - 122
Cited by:  Papers (19)
| | PDF (141 KB) | HTML

In structural reliability engineering, one often encounters situations where the strength of a structure is influenced by the stress, but the stress is irrelevant to the strength. This phenomenon can be called a unilateral dependency of strength on stress. To evaluate structural reliability in such cases, the stress on a structure is proposed to be a discrete random variable, and the stress depend... View full abstract»

• ### Parameter Identification in Degradation Modeling by Reversible-Jump Markov Chain Monte Carlo

Publication Year: 2009, Page(s):123 - 131
Cited by:  Papers (8)
| | PDF (698 KB) | HTML

In this work, the reversible-jump Markov chain Monte Carlo technique is applied for identifying the parameters governing stochastic processes of component degradation. Two case studies are examined concerning the evolution of deteriorating systems whose parameters undergo step changes in time. The method turns out to be capable of identifying the instances of change in behavior, and of estimating ... View full abstract»

• ### Order Restricted Inference for Exponential Step-Stress Models

Publication Year: 2009, Page(s):132 - 142
Cited by:  Papers (16)
| | PDF (288 KB) | HTML

In the context of multiple step-stress models, which is a special type of accelerated life-testing model, interest lies on the expected lifetimes of the experimental units under different stress levels. Although the expected lifetime is shortened as the stress level increases, this information has not been incorporated so far into the associated inferential procedures. For this reason, we develop ... View full abstract»

• ### General Distributional Properties of Discounted Warranty Costs With Risk Adjustment Under Minimal Repair

Publication Year: 2009, Page(s):143 - 151
Cited by:  Papers (3)
| | PDF (228 KB) | HTML

We study the distributional properties (mean, variance, characteristic function) of the discounted warranty cost (DWC) for general warranty programs including free replacement (FRW), pro rata (PRW), and FRW/PRW in the context of minimal repair. Because only failure times & types are needed in the derivation of these properties, the reliability of the systems is modeled according to a general c... View full abstract»

• ### A Non-Central Version of the Birnbaum-Saunders Distribution for Reliability Analysis

Publication Year: 2009, Page(s):152 - 160
Cited by:  Papers (29)
| | PDF (277 KB) | HTML

The Birnbaum-Saunders distribution has largely been applied to material fatigue and reliability studies to relate the time until failure to some type of cumulative damage. This damage is produced by the growth of a dominant crack in material specimens, the propagation of which is due to cyclic patterns of stress. However, the Birnbaum-Saunders model was constructed under restrictive conditions tha... View full abstract»

• ### Aging Properties of a Discrete-Time Failure and Repair Model

Publication Year: 2009, Page(s):161 - 171
Cited by:  Papers (5)
| | PDF (230 KB) | HTML

We introduce a failure and repair model that is a discrete-time version of the pure birth shock model. Its discrete lifetime is a random sum with support on N, and with geometric summands, that represent the number of successful tasks between consecutive shocks performed by an engineering system. We provide distributional properties and conditions that lead to the discrete aging properties of such... View full abstract»

• ### A Note on Some Functional Relationships Involving the Mean Inactivity Time Order

Publication Year: 2009, Page(s):172 - 178
Cited by:  Papers (11)
| | PDF (171 KB) | HTML

Stochastic comparisons from inactivity times have been used in several reliability problems. The inactivity time represents the interval time elapsed after an event occurs until the time of its observation, and it is useful to predict the exact times of occurrence of events. We obtain a characterization of the reversed hazard rate order, and a functional relationship involving the mean inactivity ... View full abstract»

• ### Application of a Failure Driven Test Profile in Random Testing

Publication Year: 2009, Page(s):179 - 192
Cited by:  Papers (10)
| | PDF (559 KB) | HTML

Random testing techniques have been extensively used in reliability assessment, as well as in debug testing. When used to assess software reliability, random testing selects test cases based on an operational profile; while in the context of debug testing, random testing often uses a uniform distribution. However, generally neither an operational profile nor a uniform distribution is chosen from t... View full abstract»

• ### Reliability of Single-Error Correction Protected Memories

Publication Year: 2009, Page(s):193 - 201
Cited by:  Papers (13)
| | PDF (379 KB) | HTML

Reliability is a critical factor for systems operating in radiation environments. Among the different components in a system, memories are one of the parts most sensitive to soft errors due to their relatively large area. Due to their large cost, traditional techniques like triple modular redundancy are not used to protect memories. A typical approach is to apply error correction codes to correct ... View full abstract»

• ### Call for papers

Publication Year: 2009, Page(s): 202
| PDF (136 KB)
• ### IEEE Transactions on Reliability information for authors

Publication Year: 2009, Page(s):203 - 204
| PDF (52 KB)

Publication Year: 2009, Page(s):205 - 206
| PDF (1065 KB)

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu