IEEE Electrical Insulation Magazine

Issue 6 • November-December 2008

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Displaying Results 1 - 17 of 17
  • Front cover - IEEE Electrical Insulation Magazine

    Publication Year: 2008, Page(s): C1
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  • Table of contents

    Publication Year: 2008, Page(s): 1
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  • IEEE Electrical Insulation Magazine Staff

    Publication Year: 2008, Page(s): 2
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  • Editorial

    Publication Year: 2008, Page(s): 3
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  • Raman nanotechnology - the Lycurgus Cup - Letter to the Editor

    Publication Year: 2008, Page(s): 4
    Cited by:  Papers (2)
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  • From the Editor's desk

    Publication Year: 2008, Page(s):5 - 6
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  • Envisaging links between fundamental research in electrical insulation and electrical asset management

    Publication Year: 2008, Page(s):7 - 21
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (6831 KB) | HTML iconHTML

    There is an increasing gap of misperception between the contribution of fundamental research to applications of technologies for electrical apparatus and systems and this paper aims at highlighting the contribution of base research to electrical asset management, referring to some of the major research themes in recent years, from partial discharge to space charge measurements. View full abstract»

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  • The duval triangle for load tap changers, non-mineral oils and low temperature faults in transformers

    Publication Year: 2008, Page(s):22 - 29
    Cited by:  Papers (69)  |  Patents (7)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (2290 KB) | HTML iconHTML

    New versions of the Duval triangle for equipment filled with mineral oil are proposed for load tap changers of the oil type, equipment filled with non- mineral oils, and for low-temperature faults where stray gassing of oils may interfere with diagnostics. View full abstract»

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  • Automatic breakdown voltage measurement of polymer films

    Publication Year: 2008, Page(s):30 - 34
    Cited by:  Papers (12)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1917 KB) | HTML iconHTML

    Automatic breakdown tester for film samples which employs metalized film electrodes has been developed and demonstrated. Using this system, up to 600 breakdowns have been carried out automatically on capacitor film with a Weibull characteristic breakdown voltage in the range of 5 kV. Breakdown data measured with this system agree with data measured manually using the same test method. Measurements... View full abstract»

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  • Controlling conductor motion with interphase spacers in regions of contamination

    Publication Year: 2008, Page(s):35 - 42
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (2681 KB) | HTML iconHTML

    Overhead lines with severe conductor motion activity that are located in areas with harshly-contaminated conditions compound the problem for utilities. One of the most effective solutions to severe conductor motion requires the use of insulating devices installed between phases and/or between a phase and an overhead ground wire. In these instances, it is imperative that the addition of the insulat... View full abstract»

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  • EIC Volunteer profile

    Publication Year: 2008, Page(s): 43
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  • EIC profile: Featuring member companies of the EIC

    Publication Year: 2008, Page(s): 44
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  • DEIS News

    Publication Year: 2008, Page(s): 46
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  • Japan ae power systems develops environmentally friendly fire retardant transformers with low- viscosity silicone oil - News from Japan

    Publication Year: 2008, Page(s):48 - 49
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  • Book Reviews [9 book reviews]

    Publication Year: 2008, Page(s):50 - 54
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  • Meetings Calendar

    Publication Year: 2008, Page(s):55 - 56
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  • Year End Index

    Publication Year: 2008, Page(s):57 - 62
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Aims & Scope

The EI Magazine publishes articles written by authors from industry, research institutes and academia. The articles are more practical in content than the papers published in the Transactions.

Full Aims & Scope

Meet Our Editors

Co-Editor-in-Chief
Edward Cherney

Co-Editor-in-Chief
Robert Fleming