By Topic

IEE Proceedings G - Electronic Circuits and Systems

Issue 4 • August 1982

Filter Results

Displaying Results 1 - 14 of 14
  • Editorial. Tolerance analysis and design of electrical circuits

    Publication Year: 1982
    IEEE is not the copyright holder of this material | PDF file iconPDF (205 KB)
    Freely Available from IEEE
  • A modified objective function and a fast algorithm for design centering

    Publication Year: 1982, Page(s):110 - 114
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (653 KB)

    For a class of methods using minimax optimisation for design contering, a new objective function is proposed which gives improved performance. Then, a simplified approximate method of the same class is developed, using the new objective function and using a Taylor-series expansion to estimate the worst-case network response. Examples based on practical networks are given, which demonstrate that go... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • An unconstrained nonlinear programming approach to design centering

    Publication Year: 1982, Page(s):115 - 121
    Cited by:  Papers (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (792 KB)

    An algorithm for design centering linear electic networks with fixed tolerances is descibed. By assuming a linear relationship between the statistical deviations of the component values and the circuit response, an objective function based on failure probabilities ¿ the probabilities of violating specifications at the individual frequencies ¿ is introduced. The objective function is minimised by... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Yield enhancement realised for analogue integrated filters by design techniques

    Publication Year: 1982, Page(s):122 - 126
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (660 KB)

    In the fabrication of analogue integrated circuits the yield depends on the tolerances and defect density in mask generation and device fabrication. Yield optimisation, therefore, has to resolve two conflicting requirements. Whereas to reduce the influence of tolerances the device area has to be large, the larger the device area chosen, the higher will be the possible defect number. To determine t... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Estimating manufacturing yield by means of Jacobian of transformation

    Publication Year: 1982, Page(s):127 - 133
    Cited by:  Papers (2)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (940 KB)

    It has been known for many years that the Jacobian of transformation method could, at least in principle, be applied to the yield estimation problem. The fact that it has not, in the past, been applied to this problem is because its implementation requires the determination of multiple solutions to nonlinear equations. Recently, several methods of finding multiple solutions to nonlinear equations ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Design centering and tolerancing, considering environmental effects via a new type minimax optimisation

    Publication Year: 1982, Page(s):134 - 138
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (531 KB)

    A method for design centering and tolerancing of tuned circuits, subject to environmental disturbances, is described. The region of acceptability is explored statistically, using a new method of gradient-based minimax optimisation with randomly chosen initial points. Nominal values and tolerances of continuous or discrete valued elements are determined from historgrams, which are built up from the... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A sensitivity-based approach to tolerance assignment

    Publication Year: 1982, Page(s):139 - 149
    Cited by:  Papers (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1340 KB)

    A new and efficient algorithm is described for selecting the most economic set of component tolerances for a mass-produced electronic circuit, and is illustrated by application to two filter circuits. The algorithm is based on a statistical sampling of component space, and its efficiency is a consequence of using inexpensive sensitivity information to calculate response from a truncated Taylor-ser... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Tolerance design via cost minimisation

    Publication Year: 1982, Page(s):150 - 159
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (892 KB)

    A new method is described for the tolerance design of circuits, via minimisation of a cost function of the yield and tolerances. This problem is decomposed into the simpler problems of design centring with fixed tolerances, and tolerance assignment by efficient nonlinear optimisation based on a nonlinear approximation of the yield/tolerance dependence. Two algorithms are proposed, and their perfor... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Generalised cut map algorithms for tolerance and tolerance-tuning problems

    Publication Year: 1982, Page(s):160 - 168
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1114 KB)

    The problem considered is the choice of a set of system parameters, so that inequality constraints are satisfied or can be satisfied by tuning, for a specified variation of parameter values about their nominal value. Such problems occur when systems must be synthesised from components whose values are known only to certain tolerances. Fully implementable algorithms that are suitable for the genera... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Variability reduction: statistically based algorithms for reduction of performance variability of electrical circuits

    Publication Year: 1982, Page(s):169 - 180
    Cited by:  Papers (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1364 KB)

    A number of algorithms are presented for the reduction of circuit-response variability arising from component tolerances. A Monte Carlo analysis is carried out in the tolerance region and the responses F and differential response sensitivities ¿F/¿pi with respect to circuit parameters p calculated at each sample point. This enables both the variance of the responses and the circuit yield over th... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Specification sensitivity and its use in system design

    Publication Year: 1982, Page(s):181 - 185
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (570 KB)

    An algorithm is described which computes the sensitivity of the manufacturing yield of a circuit or a system with respect to changes in the specifications. Using the concept of specification sensitivity, the change of the yield due to different changes of the specifications can be calculated without performing a new Monte Carlo analysis or retesting the network function. Circuits designed to work ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Statistical modelling for integrated circuits

    Publication Year: 1982, Page(s):186 - 191
    Cited by:  Papers (7)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (713 KB)

    This contribution attempts to survey two alternative approaches to the characterisation of ICs for statistical design. The first is based on a direct description of the distributions of the electrical parameters of standard device models, while the second approach starts from distributions of more fundamental processing variables, and will be dealt with in more detail. After considering ways to en... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Variability analysis and design of an integrated circuit using sensitivity information

    Publication Year: 1982, Page(s):192 - 198
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (758 KB)

    A variability analysis of the open-loop DC gain G of an operational amplifier is carried out. DC sensitivities are used in the analysis, making the method economic compared to a Monte Carlo analysis. A novel way of using these sensitivities suggests choices for component matching in the integrated circuit, so as to reduce the variability of G. The analysis leads to a revision of the test limits of... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Correlation-coefficient optimisation in integrated-circuit design

    Publication Year: 1982, Page(s):199 - 203
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (555 KB)

    This paper reviews the accomplishments to date in the use of correlation coefficients between circuit elements as design variables in the computer-aided tolerance design of integrated circuits. Two optimisation schemes have been developed which make use of the interior-point and exterior-point penalty function methods. Each method requires a different set of constraint equations to provide a posit... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.