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Solid-State and Electron Devices, IEE Proceedings I

Issue 6 • Date December 1980

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Displaying Results 1 - 7 of 7
  • Current mechanism of tunnel m.i.s. solar cells

    Publication Year: 1980 , Page(s): 301 - 307
    Click to expandAbstract | PDF file iconPDF (725 KB)  

    Dark current/voltage characteristics have been examined as a function of temperature for two structures of A1-pSi m.i.s. solar cells. The solar cells have been prepared with interfacial oxide thickness ranging from 10 Å to 20 Å. The results show that the diode saturation current Jo for all oxide thicknesses behave as a majority-carrier current, highly dependent on the effective metal-to-semicond... View full abstract»

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  • Use of VOC/JSC measurements for determination of barrier height under illumination and for fill-factor calculations in Schottky-barrier solar cells

    Publication Year: 1980 , Page(s): 308 - 311
    Click to expandAbstract | PDF file iconPDF (490 KB)  

    An experimental study has been made of metal-silicon solar cells, with thin Ag, Au, Cu, Fe and In electrodes. No intentional interfacial layers were introduced and the silicon surfaces were chemically prepared in such a way as to minimise the residual oxide layer. The characteristics of the devices were taken at various illumination levels and the effect of barrier height, series resistance and n-... View full abstract»

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  • Quasistatic and nonequilibrium phenomena in m.o.s. structures under the influence of a constant gate-current bias

    Publication Year: 1980 , Page(s): 312 - 316
    Click to expandAbstract | PDF file iconPDF (555 KB)  

    An experimental investigation is undertaken into the quasistatic and nonequilibrium response of an m.o.s. system to a constant gate-current bias. For the quasistatic condition, it is shown that the inverse total semiconductor capacitance can be extracted directly, in contrast to the slow-ramp quasistatic C/V measurement. Under nonequilibrium conditions the main aim has been to investigate the effe... View full abstract»

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  • Switching in m.i.s.m. structures

    Publication Year: 1980 , Page(s): 317 - 322
    Cited by:  Papers (2)
    Click to expandAbstract | PDF file iconPDF (572 KB)  

    Switching effects have been observed in metal-thin insulator-semiconductor structures in which a p-n junction is incorporated which plays a central role in the switching phenomenon. In this paper an alternative structure is considered in which the p-n junction is replaced by a Schottky barrier. Although the Schottky barrier is usually considered to be a majority carrier device, minority carrier in... View full abstract»

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  • Models of modelocking a laser diode in an external resonator

    Publication Year: 1980 , Page(s): 323 - 329
    Cited by:  Papers (4)
    Click to expandAbstract | PDF file iconPDF (730 KB)  

    A simple theory is developed for the modelocking of a laser diode in an external resonator, with inclusion of the composite Fabry-Perot resonator effect. The achievable pulsewidth is evaluated. The derivation is different from that of a previously published paper and leads to different conclusions. Reasons for the discrepancy are discussed. View full abstract»

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  • Leaky modes in active three-layer slab waveguides

    Publication Year: 1980 , Page(s): 330 - 336
    Cited by:  Papers (17)
    Click to expandAbstract | PDF file iconPDF (717 KB)  

    We present a comprehensive numerical mode calculation based on a phenomenological theory for a three-layer slab waveguide with a refractive-index depression but finite gain in the centre region (leaky modes). The leaking rays and the refraction loss of the modes are discussed as well as their influence on the threshold conditions for typical stripe-geometry laser structures. Special attention is p... View full abstract»

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  • Erratum: General model for defect formation in silicon dioxide

    Publication Year: 1980
    PDF file iconPDF (74 KB)  
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