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IEEE Instrumentation & Measurement Magazine

Issue 4 • Date August 2008

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Displaying Results 1 - 14 of 14
  • Front cover - IEEE Instrumentation & Measurement Magazine

    Publication Year: 2008, Page(s): c1
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  • Table of contents

    Publication Year: 2008, Page(s): 2
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  • From the Editor's Bench

    Publication Year: 2008, Page(s): 4
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  • Welcome to Autotestcon

    Publication Year: 2008, Page(s): 6
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  • IEEE I&M Society Technical Committee Listing

    Publication Year: 2008, Page(s): 8
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  • Statistical Measurement Analysis of Automated Test Systems

    Publication Year: 2008, Page(s):10 - 15
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2831 KB) | HTML iconHTML

    This paper addressed the application of the statistical paired t-test of observed parametric data, nested GR&R analysis for evaluating ATS and TPS capability, and ANOVA analysis on ATS instrument measurement variation. The applicability of these methods provides a sound approach for analyzing data results and can be further expanded across other TPSs with additional data for improved estimatio... View full abstract»

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  • Defect Prevention and Detection in Software for Automated Test Equipment

    Publication Year: 2008, Page(s):16 - 23
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2683 KB) | HTML iconHTML

    This paper describes a test application development tool designed with a high degree of defect prevention and detection built-in. While this tool is specific to a particular tester, the PT3800, the approach that it uses may be employed for other ATE. The PT3800 tester is the successor of a more than 20 year-old tester, the PT3300. The development of the PT3800 provided an opportunity to improve th... View full abstract»

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  • Design for Diagnosability Guidelines

    Publication Year: 2008, Page(s):24 - 32
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3285 KB) | HTML iconHTML

    In this paper, we will define some of the terminology, provide a model for the diagnostic process, and highlight areas of diagnostic complications. We will apply the diagnostic complications in a Venn diagram to get a better illustration and possibly create a basis for diagnosability metrics in future work. With the tools at hand, we will finally tackle the design issues by hypothesizing on variou... View full abstract»

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  • Prognostics in Battery Health Management

    Publication Year: 2008, Page(s):33 - 40
    Cited by:  Papers (105)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (4543 KB)

    In this article, we examine prognostics and health management (PHM) issues using battery health management of Gen 2 cells, an 18650-size lithium-ion cell, as a test case. We will show where advanced regression, classification, and state estimation algorithms have an important role in the solution of the problem and in the data collection scheme for battery health management that we used for this c... View full abstract»

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  • IEEE Autotestcon 2008 - "Surpassing The Limits - Forging Ahead"

    Publication Year: 2008, Page(s):41 - 43
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  • New products

    Publication Year: 2008, Page(s):44 - 50
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  • Calendar

    Publication Year: 2008, Page(s): 51
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  • Call For Papers

    Publication Year: 2008, Page(s): 52
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  • I&M Magazine Survey

    Publication Year: 2008, Page(s):53 - 54
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Aims & Scope

The magazine is a bimonthly publication.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org