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Instrumentation & Measurement Magazine, IEEE

Issue 4 • Date August 2008

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Displaying Results 1 - 14 of 14
  • Front cover - IEEE Instrumentation & Measurement Magazine

    Page(s): c1
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  • Table of contents

    Page(s): 2
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  • From the Editor's Bench

    Page(s): 4
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  • Welcome to Autotestcon

    Page(s): 6
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  • IEEE I&M Society Technical Committee Listing

    Page(s): 8
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  • Statistical Measurement Analysis of Automated Test Systems

    Page(s): 10 - 15
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (2831 KB) |  | HTML iconHTML  

    This paper addressed the application of the statistical paired t-test of observed parametric data, nested GR&R analysis for evaluating ATS and TPS capability, and ANOVA analysis on ATS instrument measurement variation. The applicability of these methods provides a sound approach for analyzing data results and can be further expanded across other TPSs with additional data for improved estimation. In addition, further research should address the additional instruments and UUTs to model the entire the ATS. View full abstract»

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  • Defect Prevention and Detection in Software for Automated Test Equipment

    Page(s): 16 - 23
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (2683 KB) |  | HTML iconHTML  

    This paper describes a test application development tool designed with a high degree of defect prevention and detection built-in. While this tool is specific to a particular tester, the PT3800, the approach that it uses may be employed for other ATE. The PT3800 tester is the successor of a more than 20 year-old tester, the PT3300. The development of the PT3800 provided an opportunity to improve the test application development experience. The result was the creation of a test application development tool known as the PT3800 AM creation, revision and archiving tool, or PACRAT (AM refers to automated media, specifically test application source code). This paper details the built-in defect prevention and detection techniques employed by PACRAT. View full abstract»

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  • Design for Diagnosability Guidelines

    Page(s): 24 - 32
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (3285 KB) |  | HTML iconHTML  

    In this paper, we will define some of the terminology, provide a model for the diagnostic process, and highlight areas of diagnostic complications. We will apply the diagnostic complications in a Venn diagram to get a better illustration and possibly create a basis for diagnosability metrics in future work. With the tools at hand, we will finally tackle the design issues by hypothesizing on various causes of each diagnostic complication and providing some (though not exhaustive) DFD guidelines. View full abstract»

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  • Prognostics in Battery Health Management

    Page(s): 33 - 40
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    In this article, we examine prognostics and health management (PHM) issues using battery health management of Gen 2 cells, an 18650-size lithium-ion cell, as a test case. We will show where advanced regression, classification, and state estimation algorithms have an important role in the solution of the problem and in the data collection scheme for battery health management that we used for this case study. View full abstract»

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  • New products

    Page(s): 44 - 50
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  • Calendar

    Page(s): 51
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  • Call For Papers

    Page(s): 52
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  • I&M Magazine Survey

    Page(s): 53 - 54
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Aims & Scope

IEEE Instrumentation and Measurement Magazine contains applications-oriented and tutorial articles on topics in the broadly based areas of instrumentation system design and measurement techniques.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org