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Reliability, IEEE Transactions on

Issue 4 • Date Oct. 1986

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Displaying Results 1 - 25 of 53
  • Table of contents

    Publication Year: 1986 , Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1986 , Page(s): c2
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  • The New Reliability Discipline

    Publication Year: 1986 , Page(s): 353
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  • The Product Knows

    Publication Year: 1986 , Page(s): 353
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  • New editorial structure - new editor

    Publication Year: 1986 , Page(s): 354
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  • Correspondence Items

    Publication Year: 1986 , Page(s): 354
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  • Reliability & Safety Analysis of a Fault-Tolerant Controller

    Publication Year: 1986 , Page(s): 355 - 362
    Cited by:  Papers (6)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (1571 KB)  

    This paper analyzes a fault-tolerant, microprocessor-based controller for an electric wheelchair. Two candidate architectures are considered, including reconfigurable duplication and stand-by sparing. The difference in the reliability and safety of the two candidates is determined through the use of Markov models. Safety is paramount in the wheelchair application because of the need to protect the... View full abstract»

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  • Data on, and Investigation of, The Relation between 345 kV Transmission Line Length and Outage Rate

    Publication Year: 1986 , Page(s): 363 - 368
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (1094 KB)  

    This paper presents the results of an analysis of outage data recorded over a 12-year period on 112 345-kV transmission lines of the Commonwealth Edison Company in Illinois; the lengths range from 3.5 to 188 miles. A linear relationship is developed between outage rate and line length; it does not pass through the origin but above it, indicating a residual outage rate corresponding to zero line le... View full abstract»

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  • Quality-Control Practices in Lead-Acid Battery Manufacturing to Improve Quality, Cost, Reliability

    Publication Year: 1986 , Page(s): 369 - 374
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (1421 KB)  

    This is a case study on the diagnosis of quality problems in a lead-acid battery plant. The study demonstrates the effectiveness of integrating statistical quality assurance programs with process and production control methods in improving the overall performance of the plant. It asserts that quality control is an integral part of process and production control methods. Process and production cont... View full abstract»

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  • Failure Analysis: The British Engine Technical Reports

    Publication Year: 1986 , Page(s): 374
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  • Burn-In of Incandescent Sign Lamps

    Publication Year: 1986 , Page(s): 375 - 376
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (498 KB)  

    This paper describes an experiment in which it was determined that properly designed burn-in can not only eliminate a weak subpopulation, but also stabilize the healthy one. Accelerated life tests have been carried out on 30W sign lamps to show that the time-to-failure pattern is bimodal. The accelerated life data have been used to design burn-in process parameters, and to determine the deteriorat... View full abstract»

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  • Mathematical Programming for Operations Researchers and Computer Scientists

    Publication Year: 1986 , Page(s): 376
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  • Effect of Uncertainty in Failure Rates on Memory System Reliability

    Publication Year: 1986 , Page(s): 377 - 379
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (575 KB)  

    This paper investigates the effect of uncertainty in chip failure rates on memory system reliability. It is shown, using real data on memory failures, that the dispersion in failure rates can be as large as 80%. An important consequence is to increase the unreliability of a memory system by up to 65%. Two simple models are proposed to evaluate the variability in memory reliability. The first is a ... View full abstract»

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  • 1987 Annual Reliability and Maintainability Symposium 1987 January 27-29

    Publication Year: 1986 , Page(s): 379
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  • Error-Correcting-Code Memory Reliability Calculations

    Publication Year: 1986 , Page(s): 380 - 384
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (729 KB)  

    The subject of this paper is the Mean Time to Failure (MTTF) calculation for a computer memory array with error correcting code (ECC) that detects and corrects 1-bit errors in memory words. The MTTF calculation is examined within the framework of the Whole Chip Failure Mode model. This paper has two main contributions: 1) The MTTF equation is derived in a way that is mathematically simpler and eas... View full abstract»

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  • An Alternative Integrated-Circuit Yield Model

    Publication Year: 1986 , Page(s): 385 - 390
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (1096 KB)  

    This paper develops a model to predict the number of good integrated circuits (the yield) from a semiconductor wafer processing line. The model is different from other published models and predicts observed outcomes better. Many models tend to predict lower yields than those actually achieved because those models are inherently incapable of predicting the average number of good chips per wafer. Th... View full abstract»

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  • Maximum Entropy and Reliability Distributions

    Publication Year: 1986 , Page(s): 391 - 395
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (1126 KB)  

    An effort is made to show the relevance and usefulness of the principle of maximum entropy to reliability considerations. The constraints entering into the maximum entropy principle are identified as a class of sufficient statistics which determine the unknown parameters in the probability densities that occur in the most commonly used reliability models. In this way, the maximum entropy principle... View full abstract»

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  • Annual Reliability and Maintainability Symposium

    Publication Year: 1986 , Page(s): 395
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  • Bayes Interval Estimation for the Shape Parameter of the Power Distribution

    Publication Year: 1986 , Page(s): 396 - 398
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (457 KB)  

    The power distribution is considered as failure model and uses a square-error loss function. Bayes credibility interval estimators for the shape parameter have been obtained assuming 1) the following priors for the shape parameter: Jeffrey's invariant prior, gamma, and inverted gamma; 2) the following priors for reliability: beta and log gamma function. It is straightforward to obtain estimators f... View full abstract»

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  • Managing Software Development and Maintenance

    Publication Year: 1986 , Page(s): 398
    Cited by:  Papers (1)
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  • Empirical-Bayes Estimation of Mean Life for a Censored Sample, Constant Hazard Rate Model

    Publication Year: 1986 , Page(s): 399 - 402
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (668 KB)  

    The estimation of mean life based on a censored sample from a population with a constant failure rate is considered in an empirical Bayes situation. Bayes risks of empirical Bayes estimates for various numbers of past samples are compared with the Bayes risk of the sample mean, and the minimum Bayes risk. A Monte Carlo simulation shows that the Bayes risk of the empirical Bayes estimator is very c... View full abstract»

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  • Design of Devices and Systems

    Publication Year: 1986 , Page(s): 402
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  • Classes of Discrete Decreasing and Increasing Mean-Residual-Life Distributions

    Publication Year: 1986 , Page(s): 403 - 405
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (482 KB)  

    Discrete failure-time distributions can be appropriate to model lifetimes. This paper represents two well-known non-parametric families of discrete distributions: decreasing and increasing mean-residual-life. It provides two parametric families of discrete distributions which are suitable for fitting decreasing and increasing mean-residual-life models to discrete life-test data. View full abstract»

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  • Prediction Intervals for Future Observations from the Inverse Gaussian Distribution

    Publication Year: 1986 , Page(s): 406 - 408
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (469 KB)  

    This paper discusses the problem of predicting a future observation from an inverse Gaussian distribution, based on a sample of size n from that same distribution. Two prediction intervals that have been proposed in the literature, one of which is an approximate prediction interval, are compared using Monte Carlo simulations. In many of the simulated cases the approximate prediction interval is su... View full abstract»

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  • 1987 International Reliability Physics Symposium

    Publication Year: 1986 , Page(s): 408
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong