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IEEE Transactions on Reliability

Issue 1 • Date April 1986

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Displaying Results 1 - 25 of 55
  • Table of contents

    Publication Year: 1986, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1986, Page(s): c2
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  • Concept vs Implementation

    Publication Year: 1986, Page(s): 1
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  • Two Kinds of People?

    Publication Year: 1986, Page(s): 1
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  • New editorial structure - new editor

    Publication Year: 1986, Page(s): 2
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  • Our Past Editors

    Publication Year: 1986, Page(s): 2
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  • Benefits of Integrated-Circuit Burn-In to Obtain High Reliability Parts

    Publication Year: 1986, Page(s):3 - 6
    Cited by:  Papers (6)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (682 KB)

    The technique of integrated circuit (IC) burn-in is applied industry-wide with the assumption that burned-in ICs have a much lower failure rate during operating life than ICs which are not burned-in. Several years ago this approach was valid for all ICs, but today burn-in procedures for some ICs provide little, if any, benefit. However, some customers still request burned-in ICs, assuming that thi... View full abstract»

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  • List of Referees

    Publication Year: 1986, Page(s):6 - 125
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  • A Highly Reliable Memory Subsystem Design Employing SECDED, Column Sparing, and Paging

    Publication Year: 1986, Page(s):7 - 11
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (909 KB)

    This paper develops a reliability model for a paged memory system wherein the pages of memory are physically distributed among several arrays of memory chips. Any of the available pages can be used to satisfy the required memory capacity. This paper also develops a reliability model for a page or block of memory words imbedded in an array. The model assumes that memory chips have failure modes tha... View full abstract»

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  • The Statistical Analysis of Failure Data

    Publication Year: 1986, Page(s): 11
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  • A Software Technique for Diagnosing and Correcting Memory Errors

    Publication Year: 1986, Page(s):12 - 18
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1125 KB)

    A software diagnostic that eliminates 2-bit and some 3-bit errors is described. The diagnostic procedure tests memory for errors that cannot be corrected by ECC (error correcting code): single error correct, double error detect. When an uncorrectable error is found, the diagnostic attempts to reduce it to a I-bit error. This is done either by reconfiguring the memory to distribute failing bits acr... View full abstract»

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  • Software Reliability Growth Models with Testing-Effort

    Publication Year: 1986, Page(s):19 - 23
    Cited by:  Papers (47)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (760 KB)

    Many software reliability growth models have been proposed in the past decade. Those models tacitly assume that testing-effort expenditures are constant throughout software testing. This paper develops realistic software reliability growth models incorporating the effect of testing-effort. The software error detection phenomenon in software testing is modeled by a nonhomogeneous Poisson process. T... View full abstract»

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  • Corrections: Element Importance and System Failure Frequency of a 2-State System

    Publication Year: 1986, Page(s): 23
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  • A Program for Reliability Evaluation of Undirected Networks via Polygon-to-Chain Reductions

    Publication Year: 1986, Page(s):24 - 29
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1081 KB)

    This paper discusses the design and implementation of PolyChain, a FORTRAN program for reliability evaluation of undirected networks of a special structure via polygon-to-chain reductions. Theoretical results presented by Satyanarayana & Wood are reviewed. The program's design and its implementation in FORTRAN are described. A small problem is tested illustrating the code's output. Several large p... View full abstract»

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  • A Computational Algorithm for Reliability Bounds in Probabilistic Design

    Publication Year: 1986, Page(s):30 - 31
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (390 KB)

    Kapur formulated quadratic programming problems for determining bounds on the design reliability, given some bounds on the probabilities of the stress and strength random variables. We modify Kapur's formulation to improve its accuracy, and present a solution to the resulting quadratic programming problems that can be evaluated manually. View full abstract»

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  • System Reliability in the Presence of Common-Cause Failures

    Publication Year: 1986, Page(s):32 - 35
    Cited by:  Papers (20)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (614 KB)

    This paper presents a method for calculating the reliability of a system depicted by a reliability block diagram, with identically distributed components, in the presence of common-cause failures. To represent common-cause failures, we use the Marshall & Olkin formulation of the multivariate exponential distribution. That is, the components are subject to failure by Poisson failure processes that ... View full abstract»

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  • Corrections: A Probability Bound Estimation Method in Markov Reliability Analysis

    Publication Year: 1986, Page(s): 35
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  • A Recursive Algorithm for Computing Exact Reliability Measures

    Publication Year: 1986, Page(s):36 - 40
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (767 KB)

    An algorithm is presented to find source-to-K-terminal reliability in a directed graph with independent arc failures. The algorithm is based on a discrete-time Markov chain with two absorbing states. The Markov chain has an upper triangular transition probability matrix, thus the probability of absorption in a state can be found by back-substitution. We show: 1) The source-to-K-terminal reliabilit... View full abstract»

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  • Correction: Asymptotic Distribution of Bayes Estimators in Censored Type-I Samples from a Mixed Exponential Population

    Publication Year: 1986, Page(s): 40
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  • Reliability Evaluation for Optimally Operated, Large, Electric Power Systems

    Publication Year: 1986, Page(s):41 - 47
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1211 KB)

    This paper presents a combined optimization/reliability technique to evaluate the reliability of large power systems. It uses Monte Carlo simulation for the individual operation/failure random performance of elements of a power network. This simulation overcomes the difficulty in constructing the many possible states for large power systems of complex topology. A simplified power-flow representati... View full abstract»

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  • Practical papers - computer programs

    Publication Year: 1986, Page(s): 47
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  • PAFT F77, Program for the Analysis of Fault Trees

    Publication Year: 1986, Page(s):48 - 50
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (528 KB)

    PAFT F77, a program for the analysis of fault trees, is coded in Fortran 77. Given the structure of a fault tree and the probability or failure rates of its basic events, PAFT F77 calculates the probabilities of the top and all intermediate events, as well as the marginal importance of all basic events. When the input is in terms of failure rates instead of probabilities, the marginal occurrence r... View full abstract»

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  • Corrections: On Multistate System Analysis

    Publication Year: 1986, Page(s): 50
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  • Evaluation of Large Fault-Trees with Repeated Events Using an Efficient Bottom-Up Algorithm

    Publication Year: 1986, Page(s):51 - 58
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1186 KB)

    In current fault-tree analysis of systems, the usual algorithms for evaluation of fault-trees with repeated events apply the method of minimal cuts. Since the number of minimal cuts increases exponentially with the number of system components, truncation as well as optimization techniques have to be performed for the evaluation of large fault-trees. This paper presents an algorithm which combines ... View full abstract»

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  • FREE Proceedings [advertisement]

    Publication Year: 1986, Page(s): 58
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu