Issue 6 • Date Dec. 1970
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[Front cover]
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PDF (44 KB)
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IEEE Nuclear Science Group
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PDF (169 KB)
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Table of contents
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PDF (413 KB)
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Summary of 1970 IEEE Annual Conference on Nuclear and Space Radiation Effects
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PDF (822 KB)
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The Nucleus
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PDF (124 KB)
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IEEE Nuclear Science Group Radiation Effects Committee
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PDF (140 KB)
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1970 Outstanding Conference Paper Award
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PDF (795 KB)
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Electric Field Strength Dependence of Surface Damage in Oxde Passivated Silicon Planar Transistors
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PDF (1474 KB)
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The Use of Photoinjection to Determine Oxide Charge Distributions and Interface Properties in MOS Structures-Invited Paper
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PDF (954 KB)
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Radiation Induced Currents across AL2O3 Films
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PDF (870 KB)
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Investigation of the Surface Ionization Effect on Planar Silicon Bipolar Transistors and the Improvement of the Resistance to Radiation by an Irradiation-Annealing Treatment
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PDF (1541 KB)
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Radiation Hardened Registers
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PDF (3460 KB)
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Approaches to System Hardening
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PDF (1347 KB)
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Short-Term Annealing in p-Type Silicon
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PDF (501 KB)
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Aims & Scope
IEEE Transactions on Nuclear Science focuses on all aspects of the theory and application of nuclear science and engineering, including instrumentation, high-energy physics,reactor controls, and radiation effects.
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Editor-in-Chief
Paul Dressendorfer
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