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Nuclear Science, IEEE Transactions on

Issue 2 • Date April 1970

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Displaying Results 1 - 15 of 15
  • Table of contents

    Page(s): c1
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  • IEEE Nuclear Science Group

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  • The Nucleus

    Page(s): 1
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  • Erratum

    Page(s): 2
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  • Magnbeic Recording of Neutron Cross-Section Data from an Undergrolund Nuclear Explosive Source

    Page(s): 3 - 6
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    A high-resolution magnetic data recording system has been successfully used as part of the Los Alamos program of time-of-flight neutron cross-section measurements that use an underground nuclear explosion source. The data received were recorded in frequency modulation form on a rotating hard-surfaced magnetic disc. This is a novel way of recording these data. Magnetic recording facilitates electronic digitizing of the data, since there is no need for time-consuming film reading. View full abstract»

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  • Parallel Tunnel Diode Coincidence Circuit

    Page(s): 7 - 17
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    A fast coincidence circuit which operates reliably over a wide range of input-pulse amplitudes is described. The ratio of the current which is applied to the main tunnel diode when the circuit receives a noncoincident input-pulse to that when both inputs of the circuit receive coincident input-pulses, is always one to four, independent of input-pulse amplitudes. The value of the current to be applied to the main tunnel diode by input pulses is decided by the bias current of the circuit. The resolving time of the circuit is measured as 2 ns in the typical operation of the circuit and as 400 ps by adjusting input-pulse amplitudes and the bias current. View full abstract»

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  • Stability Analysis of a Nonlinear Reactor Control System

    Page(s): 18 - 25
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    A method for testing control system stability is presented, which is useful for finding the limit cycles of high order systems with multiple nonlinearities. The presented method is applied to the analysis of the control system of a material testing reactor, and a comparison with the method in a current literature is given. View full abstract»

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  • Lifetime in Neutron Irradiated Silicon - Application to Devices

    Page(s): 26 - 33
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    Detailed measurements on special gated Si p+n diodes yield the damage parameters associated with the three basic current components in p-n junctions. Recombination in the neutral bulk, recombination and generation in the space-charge region, and recombination and generation at the surface are characterized over a wide range of neutron doses and injection levels. For recombination in the neutral bulk, the lifetime damage constant is about 3 x 105 n-sec/cm2 at high injection levels and varies with dose between 103 and 104 n-sec/cm2 for low injection levels. The damage constant for the space-charge region recombination lifetime is about 5 x 105 n-sec/cm2 for forward biases in the range of 0.1 to 0.3 V and the damage constant for the generation lifetime in the space-charge region is 5 x 107 n-sec/cm2 both nearly independent of dose. The surface generation and recombination velocities are process dependent and are not a linear function of the dose. The surface generation velocity increases from about 10 cm/sec at 2 x 1011 n/cm2 to saturate at about 100 cm/sec at 1014 n/cm2 in the diodes studied here. Using these data, the grounded emitter current gain (hFE) for a Si pnp transistor (2N4872) is predicted as a function of dose and current density. Both the dose and the current density dependence of hFE, as predicted by our V-I characteristics and deduced lifetimes, are in reasonable agreement with the published specifications. View full abstract»

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  • New Design Techniques of Variable Prescaling Counters for Spaceborne Experiments

    Page(s): 34 - 39
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    The design techniques of prescaling counters for the automatic compression of particle measure ment data on board of spacecrafts are reviewed and new criteria are proposed, which are illustrated by examples. The standard technique of realizing logarithmic counters is criticized and alternative procedures are proposed that take into account both the effect of the statistical error, when counting events from random sources, and the efficient use of all the apriori information available about the expected counts. The resulting structure consist of a prescaling counter, where the number of stages of the prescaler that are inserted does not coincide anymore with the content of the exponent section, but is an arbitrary function of that number. View full abstract»

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  • Measurevent of the Transient Effects of a Gamtma-Flux on the Energy Resolution of Surface-Barrier Silicon Detectors

    Page(s): 40 - 51
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    The energy resolutions of surface barrier n-type silicon detectors counting al pha-particles were measured under the disturbance of 1.25 MeV gamma-fluxes ranging from 2.3 x 107 to 3.8 x 108 photons cm-2 sec-1 and for detectors having different total thicknesses and resistivities. The results obtained confirm the existence of a zone about 100 micron wide and external to the depletion layer of partially depleted detectors which contributes to worsen the energy resolution of the gamma-irradiated detectors by diffusion rrocesses. It is also pointed out that the energy resolution of the detectors under gamma irradiation varies with the time constants of the amplifying circuit quite differently from what is obser ved in the absence of gamma irradiation. View full abstract»

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  • Predicted Effects of Neutron Irradiation on GaAs Junction Field Effect Transistors

    Page(s): 52 - 54
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    The fast-neutron-induced degradation of the properties of n-channel GaAs junction field effect transistors (JFET) is estimated and the results are compared with the effects produced in n-and p-channel silicon field effect transistors. The estimated degradation of the maximum transconductance, maximum drain current, pinch-off voltage, and cutoff frequency is based on electrical measurement data taken for fast-neutron-irradiated bulk n-type GaAs samples. It is concluded that n-channel GaAs JFET's should be at least as resistant to fast neutrons as either n-or p-channel Si JFET's. View full abstract»

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  • 1970 IEEE Annual Conference Nuclear and Space Radiation Effects

    Page(s): 55
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  • Contributors

    Page(s): 57 - 59
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  • Information for authors

    Page(s): 59a
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  • Affiliate Plan of the IEEE Nuclear Science Group

    Page(s): 59-b
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Aims & Scope

IEEE Transactions on Nuclear Science focuses on all aspects of the theory and applications of nuclear science and engineering, including instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.

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