Issue 3 • Date Sept. 1984
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Table of contents
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PDF (136 KB)
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IEEE Instrumentation and Measurement Society
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PDF (347 KB)
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IMTC'84 Special Issue Editor's Review and Commentary
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PDF (1001 KB)
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IEEE Instrumentation and Measurement Society Centennial Award Recipients
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PDF (1049 KB)
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A Distributed Artifact Standard of Voltage
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PDF (1219 KB)
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Recent Advances in Precision AC Measurements
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PDF (1680 KB)
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Productivity Factors in Measurement Technology
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PDF (1757 KB)
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Effective Bits: Is That All There Is?
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PDF (441 KB)
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A Solid-State Reference Waveform Standard
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PDF (1795 KB)
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Analog Modeling Improves Test Programs
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PDF (713 KB)
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IBM PC-Based IEEE-488 Bus Controller
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PDF (1839 KB)
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Programs Designed to Help Small Businesses Commercialize Devices Invented by NASA, DOD, and Other Federal Agencies: A Case History
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PDF (912 KB)
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Correction to "Calibration and Use of a Reference Standard Directional Coupler for Measurement of Large Coupling Factors"
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PDF (106 KB)
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Contributors
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PDF (4670 KB)
Aims & Scope
IEEE Transactions on Instrumentation and Measurement provides innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications.
Meet Our Editors
Editor-in-Chief
Prof. Alessandro Ferrero
Dipartimento di Elettrotecnica


