Issue 2 • Date March-April 2007
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Displaying Results 1 - 25 of 29
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[Front cover]
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PDF (260 KB)
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IEEE Computer Society Membership Information
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PDF (284 KB)
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Call for Papers: Special Issue on Design and Test of RFIC Chips
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PDF (28 KB)
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Table of contents
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PDF (242 KB)
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Cocktail approach to functional verification
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PDF (224 KB)
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Masthead
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PDF (37 KB)
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Guest Editors' Introduction: Attacking Functional Verification through Hybrid Techniques
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PDF (101 KB)
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Call for Papers
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PDF (28 KB)
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Hybrid Verification of Protocol Bridges
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PDF (791 KB)
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Advertiser/Product Index
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PDF (131 KB)
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IEEE Computer Society Information
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PDF (193 KB)
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Economic Aspects of Memory Built-in Self-Repair
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PDF (1093 KB)
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CiSE Subscription Information
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PDF (259 KB)
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Roundtable: Envisioning the Future for Multiprocessor SoC
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PDF (938 KB)
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FSA SiP Market and Patent Analysis Report
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PDF (827 KB)
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On the cusp of a validation wall
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PDF (884 KB)
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Test Technology TC Newsletter
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PDF (108 KB)
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A textbook with two target audiences [review of VLSI Test Principles and Architecture by Laung-Terng Wang et al.; 2006]
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PDF (168 KB)
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CEDA Currents
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PDF (96 KB)
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Conference Reports
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PDF (358 KB)
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Panel Summaries
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PDF (96 KB)
Aims & Scope
IEEE Design & Test of Computers was published between 1984 and 2012. The latest title for this publication is IEEE Design & Test.
Meet Our Editors
Editor-in-Chief
Krishnendu Chakrabarty


