IEEE Design & Test of Computers

Issue 5 • Oct. 1988

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Displaying Results 1 - 4 of 4
  • Clock system design

    Publication Year: 1988, Page(s):9 - 27
    Cited by:  Papers (24)  |  Patents (19)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1351 KB)

    Provides a framework for understanding system timing and then describes how the computer clock system executes the timing specifications. He examines clock generation and the construction of clock-distribution networks, which are integral to any clock system. Examples from contemporary high-speed systems highlight several common methods of clock generation, distribution, and tuning. Tight control ... View full abstract»

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  • An expert system to automate timing design

    Publication Year: 1988, Page(s):28 - 40
    Cited by:  Papers (2)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (890 KB)

    Presents a novel approach for automating the timing design of interfaces between VLSI chips in microcomputer systems. The Prolog-based expert system, called TDS (for timing design system), incorporates the heuristic knowledge of the hardware designer. TDS is a rule-based system that interprets the specification sheets of VLSI chips and can synthesize, diagnose, and verify timing charts at the expe... View full abstract»

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  • A knowledge-based system for selecting test methodologies

    Publication Year: 1988, Page(s):41 - 59
    Cited by:  Papers (17)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1184 KB)

    A prototype knowledge-based system that helps select test methodologies for a particular type of logic structure is described. The system, called TDES, (testable design expert system), is a subsystem of Adam, an advanced design automation system. The system is being used to test programmable logic arrays, but its architecture is applicable to other types of structures such as RAMs, ROMs, and other... View full abstract»

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  • Test research in Japan

    Publication Year: 1988, Page(s):60 - 79
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1591 KB)

    Surveys recent research activities in test technology for computers, focusing on the results of university researchers. They cover test-pattern generation, fault simulation, design for testability, built-in self-test, and self-checking.<> View full abstract»

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This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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Krishnendu Chakrabarty