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IEEE Transactions on Electrical Insulation

Issue 2 • Date June 1972

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Displaying Results 1 - 11 of 11
  • Table of contents

    Publication Year: 1972, Page(s): c1
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  • IEEE Electrical Insulation Group

    Publication Year: 1972, Page(s): c2
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  • Editorial

    Publication Year: 1972, Page(s): 57
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  • High-Density Conducting Mist Test for Insulator Evaluation

    Publication Year: 1972, Page(s):58 - 63
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3678 KB)

    A technique is described for rapid reproducible testing of contaminated outdoor insulators. The test parameters can be controlled to permit comparison of insulators under different conditions. Erosion and tracking resistance of polymeric insulators in functional designs can be studied by controlling the test parameters. A conductive mist is sprayed on the insulator while oscilloscope traces of the... View full abstract»

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  • Performance of Simple Insulator Shapes under Heavily Contaminated Conditions

    Publication Year: 1972, Page(s):64 - 78
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (4474 KB)

    Flashover voltage, scintillation current, resistance of a number of simple insulator geometries (rods, disks, and cones) have been measured under contaminated conditions. Results have been compared with porcelain suspension insulators. Tests were made in a high-density conducting mist and correlated with the resistivity of the contaminant solution. With such tests it seems possible to optimize ins... View full abstract»

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  • Nanosecond Breakdown in Hexane

    Publication Year: 1972, Page(s):78 - 83
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2020 KB)

    The electrical breakdown of hexane was investigated using nanosecond duration high-voltage pulses. An attempt was made to experimentally isolate the formative time lag contributions of the two major breakdown mechanisms: electron avalanche and streamer processes. The electrode area was kept constant at 2.85 cm2 throughout the study, and time resolution was on the order of 0.5 ns. The gap spacing a... View full abstract»

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  • Life Curves of Epoxy Resin under Impulses and the Breakdown Parameters

    Publication Year: 1972, Page(s):84 - 99
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3773 KB)

    Lives of pin-plane and sphere-plane configurations were investigated. The number of impulses required to produce breakdown depended on the applied stress, the specimen thickness and area, and the resin formulation. Theoretical models were constructed suggesting an avalanche or streamer type of breakdown destroying dielectric near the anode. Breakdown parameters were estimated. View full abstract»

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  • Analysis of Accelerated Life Test Data-Part III: Product Comparisons and Checks on the Validity of the Model and Data

    Publication Year: 1972, Page(s):99 - 119
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (10741 KB)

    This is Part III of a three-part series presenting statistical methods for planning and analyzing temperature-accelerated life tests with the Arrhenius model when all test units are run to failure. These methods are presented so they can be profitably used by individuals with a limited statistical background. In Part I, the Arrhenius model is described and graphical methods for analysis of such da... View full abstract»

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  • Contributors

    Publication Year: 1972, Page(s):119 - 120
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  • Editorial policies and criteria

    Publication Year: 1972, Page(s): 120-a
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  • Information for authors

    Publication Year: 1972, Page(s): 120b
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Aims & Scope

This Transactions ceased production in 1993. The current retitled publication is  IEEE Transactions on Dielectrics and Electrical Insulation.

Full Aims & Scope