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Electrical Insulation, IEEE Transactions on

Issue 4 • Date Dec. 1971

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Displaying Results 1 - 12 of 12
  • Table of contents

    Page(s): c1
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  • IEEE Electrical Insulation Group

    Page(s): c2
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  • Editorial

    Page(s): 147
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  • Computation of Electric Field Distributions in High-Voltage Equipment

    Page(s): 148 - 154
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    In an earlier paper two of the authors described a general-purpose digital computer program suitable for solving, with considerable precision, multidielectric fields in two dimensions or in three dimensions with at least one axis of symmetry. The program, after being rigorously checked, has been extensively used for several years to solve many practical multidielectric field problems; on all occasions it has been completely satisfactory. This paper, in addition to presenting supplementary program details, presents a few applications of the numerical method to high-voltage equipment design. View full abstract»

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  • Use of Magnetic Tape in the Numerical Solution of Electrostatic Field Problems

    Page(s): 155 - 157
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    A system of field analysis employing numerical methods on a digital computer is outlined. The system is centered on the use of a magnetic tape and the several facilities offered by the tape are described. View full abstract»

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  • Distribution of Relaxation Times in an Insulating Oil

    Page(s): 158 - 164
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    The dielectric constant and loss of a cable insulating oil has been measured as a function of frequency and temperature. The distribution of relaxation times derived from the data is close to a log-normal (Gaussian in log ¿) distribution and is found to be dependent on temperature. The activation energy for dielectric relaxation is non-Arrhenius, similar to the activation energy for viscosity. However, the temperature dependence of both activation energies is found to be significantly different. View full abstract»

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  • Analysis of Accelerated Life Test Data - Part I: The Arrhenius Model and Graphical Methods

    Page(s): 165 - 181
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    This is Part I of a three-part series presenting statistical methods for planning and analyzing temperature-accelerated life tests when all test units are run to failure. These methods are presented so they can be profitably used by individuals with a limited statistical background. In Part I, the Arrhenius model is described, and graphical methods for analysis of such complete data are given. In Part II, numerical methods for analysis of such data are given, and optimum and standard test plans are presented and compared. In Part III, graphical and numerical methods for comparing different products are given, and methods for assessing the validity of the data and the assumptions of the Arrhenius model are also given. These methods are illustrated throughout with accelerated life test data on insulation. While the methods are presented here with the Arrhenius model, they can be used for planning and analyzing many other accelerated life test situations. View full abstract»

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  • Contributors

    Page(s): 182
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  • Author index

    Page(s): 183 - 184
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  • Subject index

    Page(s): 184 - 185
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  • Editorial policies and criteria

    Page(s): [185]-a
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  • Information for authors

    Page(s): [185]b
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Aims & Scope

This Transactions ceased production in 1993. The current retitled publication is  IEEE Transactions on Dielectrics and Electrical Insulation.

Full Aims & Scope