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IEEE Transactions on Electrical Insulation

Issue 1 • Date March 1970

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Displaying Results 1 - 11 of 11
  • Table of contents

    Publication Year: 1970, Page(s): c1
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  • IEEE Electrical Insulation Group

    Publication Year: 1970, Page(s): c2
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  • Field of Interest

    Publication Year: 1970, Page(s): 1
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  • Editorial

    Publication Year: 1970, Page(s): 2
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  • Effects of Organic and Inorganic Dielectric Films on Semiconductor Devices

    Publication Year: 1970, Page(s):3 - 10
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (5205 KB)

    Departure of semiconductor-device performance from that expected on the basis of first-order models is often attributed to surface effects. One surface effect, channel conduction, is considered in terms of its relation to the electrical charge behavior of organic or inorganic dielectric films on semiconductor surfaces. Two cases of device failure due to charge instabilities in inorganic and organi... View full abstract»

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  • Insulating Materials for Semiconductor Surfaces

    Publication Year: 1970, Page(s):10 - 18
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2545 KB)

    A chart is given of comparative physical properties of silicon and the principal insulating films used with silicon, namely, silicon dioxide, silicon monoxide, silicon nitride, and aluminum oxide. The interplay of these physical characteristics is discussed. Included is a brief review of methods of forming these films, since the method of formation influences the physical properties of the final f... View full abstract»

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  • Reinforced Polymers for High-Temperature Microwave Applications

    Publication Year: 1970, Page(s):19 - 26
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2306 KB)

    The rapid progress of aerospace technology relative to ultrahigh-speed aircraft has necessitated a reevaluation of electronic insulation with respect to high-temperature environments. A description of the processes that contribute to polymer degradation is presented to alert the electronic system's engineer to the possible insulation problems arising from high frequency and elevated temperatures. ... View full abstract»

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  • Strip-Line Methods for Dielectric Measurements at Microwave Frequencies

    Publication Year: 1970, Page(s):26 - 32
    Cited by:  Papers (16)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3544 KB)

    Strip-line methods for measuring dielectric constants and loss tangent of sheet insulation, particularly of strip-line laminates, offer advantages for laboratory study and routine quality control of microwave dielectric properties at frequencies above 1 GHz. Theoretical and practical problems are discussed including possible strip circuit test patterns, effects of air gaps, correction for fringing... View full abstract»

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  • Contributors

    Publication Year: 1970, Page(s): 33
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  • Author index

    Publication Year: 1970, Page(s): 33a
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  • Subject index

    Publication Year: 1970, Page(s): 33b
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Aims & Scope

This Transactions ceased production in 1993. The current retitled publication is  IEEE Transactions on Dielectrics and Electrical Insulation.

Full Aims & Scope