IEEE Design & Test of Computers

Issue 6 • Dec. 1987

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Displaying Results 1 - 24 of 24
  • IEEE Design & Test of Computers

    Publication Year: 1987, Page(s): c1
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  • Tables of contents

    Publication Year: 1987, Page(s):c2 - 1
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  • Editorial Board

    Publication Year: 1987, Page(s): 2
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  • D&T Letters

    Publication Year: 1987, Page(s): 3
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  • Correction

    Publication Year: 1987, Page(s): 3
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  • Metastable Behavior in Digital Systems

    Publication Year: 1987, Page(s):4 - 19
    Cited by:  Papers (58)  |  Patents (24)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (14279 KB)

    Fault-free digital circuits may malfunction when asynchronous inputs have critical timing combinations that result in metastable operation. This mode of failure is often overlooked in digital system design and reliability analysis. Here, we survey developments in the study of metastable behavior and identify their relevance to digital system design and reliability, and we describe and evaluate a n... View full abstract»

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  • Call for Papers

    Publication Year: 1987, Page(s): 20
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  • How to Write EDIF for Tutorials

    Publication Year: 1987, Page(s): 21
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  • Top-Down Layout for Hierarchical Custom Design

    Publication Year: 1987, Page(s):22 - 29
    Cited by:  Papers (3)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (7874 KB)

    Champ, a chip floor-plan program, and Alpha, an automatic cell placement and routing system, provide a method for hierarchical custom VLSI design that is highly automated and completely top-down. The system can handle standard cell blocks as well as macro cells such as RAMs, ROMs, PLAs. Champ consists of initial block placement and block packing Designers can execute initial block placement either... View full abstract»

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  • Testing And Applications of Inverter-Free PLAs

    Publication Year: 1987, Page(s):30 - 40
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (9846 KB)

    The testing properties of inverter-free PLAs make them ideal for application to totally self-checking and easily testable circuits. After a class of test patterns and masking relations for these new patterns are determined, a complete test set for single and multiple crosspoint faults can be easily generated. Moreover, the procedure does not require any fault simulation. The code space inputs dete... View full abstract»

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  • Parallel Discrete-Event Simulation

    Publication Year: 1987, Page(s):41 - 44
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (3167 KB)

    The availability of commercial multiprocessors gives a new importance to distributed simulation. However, while existing techniques exploit some levels of parallelism in the discrete-event simulation algorithm, they are usually targeted to specific applications and architectures. In the general scheme presented here, the algorithm is executed in parrallel using a compilation strategy that can be i... View full abstract»

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  • D&T Calendar

    Publication Year: 1987, Page(s):45 - 50
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  • D&T Scene

    Publication Year: 1987, Page(s):46 - 48
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  • Industry Briefs

    Publication Year: 1987, Page(s): 49
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  • New Products Design

    Publication Year: 1987, Page(s):51 - 53
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  • New Products Test

    Publication Year: 1987, Page(s):54 - 56
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  • D&T Conferences

    Publication Year: 1987, Page(s):57 - 58
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  • ICCD 87 Best Paper Awards

    Publication Year: 1987, Page(s): 58
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  • 1987 D&T Referees

    Publication Year: 1987, Page(s): 59
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  • Annual Index

    Publication Year: 1987, Page(s):60 - 63
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  • Advertiser/Product Index

    Publication Year: 1987, Page(s): 64
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  • IEEE Design & Test of Computers

    Publication Year: 1987, Page(s):64a - 64b
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  • The Computer Society

    Publication Year: 1987, Page(s): 64c
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  • Call for Papers

    Publication Year: 1987, Page(s): 64d
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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty