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IEEE Design & Test of Computers

Issue 6 • Dec. 1986

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Displaying Results 1 - 25 of 33
  • IEEE Design & Test of Computers

    Publication Year: 1986, Page(s): c1
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  • The Only Built-In Test Evaluator [advertisement]

    Publication Year: 1986, Page(s):c2 - 1
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  • One Prototype Three Prototype Five Prototype Seven Prototype [advertisement]

    Publication Year: 1986, Page(s):2 - 3
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  • Editorial Board

    Publication Year: 1986, Page(s): 4
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  • Editorial Board

    Publication Year: 1986, Page(s): 5
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  • Design And Test in Europe

    Publication Year: 1986, Page(s):6 - 9
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  • The Original [advertisement]

    Publication Year: 1986, Page(s): 9
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  • D&T Scene

    Publication Year: 1986, Page(s): 10
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  • Call for Papers

    Publication Year: 1986, Page(s): 11
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  • Stretch Your Diagnostic Skills [advertisement]

    Publication Year: 1986, Page(s): 12
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  • Cathedral-II: A Silicon Compiler for Digital Signal Processing

    Publication Year: 1986, Page(s):13 - 25
    Cited by:  Papers (94)  |  Patents (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (9869 KB)

    The article describes the status of work at IMEC on the Cathedral-II silicon compiler. The compiler was developed to synthesize synchronous multiprocessor system chips for digital signal processing. It is a continuation of work on the Cathedral-I operational silicon compiler for bit-serial digital filters. Cathedral-II is based on a ??meet in the middle?? design method that encourages a total sepa... View full abstract»

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  • Macro Testing: Unifying IC And Board Test

    Publication Year: 1986, Page(s):26 - 32
    Cited by:  Papers (62)  |  Patents (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (4811 KB)

    Historically, IC testing and board testing have been considered two separate subjects. However, today's increasing complexity in both design and technology has given rise to a number of efforts to produce a consistent test strategy that smoothly couples both types of testing. This article describes one such effort by Philips, a design for testability methodology for semicustom VLSI circuits. The m... View full abstract»

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  • MACSYMA Solves Mathematical Problems Analytically [advertisement]

    Publication Year: 1986, Page(s): 33
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  • The Seventeenth International Symposium on Fault-Tolerant Computing

    Publication Year: 1986, Page(s): 34
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  • Self-Test in a Standard Cell Environment

    Publication Year: 1986, Page(s):35 - 41
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (6718 KB)

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  • Second Call for Papers

    Publication Year: 1986, Page(s): 42
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  • A D&T Tutorial

    Publication Year: 1986, Page(s):43 - 50
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  • ATE Seminars

    Publication Year: 1986, Page(s): 50
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  • D&T Referees

    Publication Year: 1986, Page(s): 51
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  • New Products Design

    Publication Year: 1986, Page(s): 52
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  • New Products Test

    Publication Year: 1986, Page(s): 53
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  • D&T Standards

    Publication Year: 1986, Page(s): 54
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  • D&T Conferences

    Publication Year: 1986, Page(s):55 - 56
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  • D&T Calendar

    Publication Year: 1986, Page(s): 56
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  • Now, Your Computer And Communications Network Analysis Simplified [advertisement]

    Publication Year: 1986, Page(s): 57
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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty