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IEEE Design & Test of Computers

Issue 1 • Date Feb. 1986

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Displaying Results 1 - 25 of 28
  • IEEE Design & Test of Computers

    Publication Year: 1986, Page(s): c1
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  • Finally, a Logic Simulator That Keeps up with the Times [advertisement]

    Publication Year: 1986, Page(s): c2
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  • Starting a New Project? New Job? In a New Field? [advertisement]

    Publication Year: 1986, Page(s): 1
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  • Choose LASAR Logic Simulation And Win the Board Game

    Publication Year: 1986, Page(s):2 - 3
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  • IEEE Computer Society

    Publication Year: 1986, Page(s): 4
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  • Editorial Board

    Publication Year: 1986, Page(s): 5
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  • D&T Scene

    Publication Year: 1986, Page(s):6 - 9
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  • Erratum

    Publication Year: 1986, Page(s): 9
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  • Sampling Quality

    Publication Year: 1986, Page(s):10 - 11
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  • WEAVER: A Knowledge-Based Routing Expert

    Publication Year: 1986, Page(s):12 - 23
    Cited by:  Papers (31)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (12349 KB)

    WEAVER, a channel/switchbox knowledge-based routing program, simultaneously considers all the important routing metrics including 100 percent routability, minimum routing area, minimum wire length, and the minimum number of vias. It allows prerouted nets and user interaction throughout the entire routing process, while relaxing the unnecessary contraints of assigning different directions¿constrai... View full abstract»

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  • Magic's Circuit Extractor

    Publication Year: 1986, Page(s):24 - 34
    Cited by:  Papers (13)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (4251 KB)

    This fast hierarchical circuit extractor for the Magic VLSI layout system derives its speed from its ability to handle hiearchical arrays, and from a new algorithm based on corner-stitching, a geometrical data structure for representing Manhattan shapes. Corner-stitching's ability to find adjacent mask information is critical to the basic extractor speed, and its ability to search areas makes the ... View full abstract»

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  • The CMU-CAM System

    Publication Year: 1986, Page(s):35 - 44
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (10545 KB)

    In developing a system for computeraided manufacturing of VLSI circuits at Carnegie-Mellon University, we devoted a major effort to the computational efficiency of algorithms implemented. The resulting software can be used for a variety of real-life tasks such as optimal process design, process diagnosis, and process control in commercial fabrication lines¿providing an attractive externsion for C... View full abstract»

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  • An Automatic DFT System for the Silc Silicon Compiler

    Publication Year: 1986, Page(s):45 - 57
    Cited by:  Papers (23)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (13017 KB)

    This article discusses design for testability automation for the Silc silicon compiler under development at GTE Laboratories, Inc. Our modular design for testability uses both built-in self-test and scan-path techniques for Slic's full custom VLSI designs. A test controller coordinates the testing of the chip's modules. Testability evaluation is performed using controllability/observability method... View full abstract»

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  • Automatic Generation of Digital System Schematic Diagrams

    Publication Year: 1986, Page(s):58 - 65
    Cited by:  Papers (14)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (8787 KB)

    A systematic approach to the automatic generation of schematic diagrams for digital systems¿diagrams described as networks of modules¿provides useful CAD applications. This approach transforms guidelines. traditionally followed in manual drawings of schematic diagrams, into quantitative objectives. In view of the complex relationship between these objectives, the schematic design process is brok... View full abstract»

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  • A New Periodical from the IEEE Computer Society

    Publication Year: 1986, Page(s): 65
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  • Hierarchical Analysis of IC Artwork with User-Defined Rules

    Publication Year: 1986, Page(s):66 - 74
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (6637 KB)

    Hierarchical design rule check and component extract offer many advantages, but no single form of hierarchical analysus fits al situations. However, we will deal with hierarchical analyses which allow the user to specify how abstract representations of cells are formed, how they are checked, and how to respond if a violation is detected. This allows one analysis fits all situations. However, we wi... View full abstract»

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  • The VIVID Symbolic Design System: Current Overview And Future Directions

    Publication Year: 1986, Page(s):75 - 81
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (5657 KB)

    VIVID, the vertically integrated VLSI design system developed at the Microelectronics Center of North Carolina, was first released in January 1985. Since that time feedback from wide industrial and academic exposure has been positive, confirming the need for symbolic design tools and providing research and development insignts¿illuminating insights that should also be of interest to the CAD commu... View full abstract»

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  • D&T Conferences

    Publication Year: 1986, Page(s):82 - 87
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  • New Products Test

    Publication Year: 1986, Page(s):88 - 90
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  • New Products Design

    Publication Year: 1986, Page(s):91 - 92
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  • Solutions to Automatic Testing [advertisement]

    Publication Year: 1986, Page(s): 92
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  • Calendar

    Publication Year: 1986, Page(s): 93
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  • D&T Education

    Publication Year: 1986, Page(s): 94
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  • Book Reviews

    Publication Year: 1986, Page(s): 95
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  • Advertiser Index - February 1986

    Publication Year: 1986, Page(s): 96
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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty