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IEEE Transactions on Reliability

Issue 4 • Dec. 2006

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Displaying Results 1 - 12 of 12
  • Table of contents

    Publication Year: 2006, Page(s): C1
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  • IEEE Transactions on Reliability publication information

    Publication Year: 2006, Page(s): C2
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  • Challenges Related to Reliability in Nano Electronics

    Publication Year: 2006, Page(s):569 - 570
    Cited by:  Papers (17)
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  • Reliability Modeling of Hardware and Software Interactions, and Its Applications

    Publication Year: 2006, Page(s):571 - 577
    Cited by:  Papers (17)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (230 KB) | HTML iconHTML

    We classify system failures into three categories: hardware failures, software failures, and hardware-software interaction failures. We develop a unified reliability model that accounts for failures in all three categories. Hardware, and software failures are accounted for with well-known modeling approaches. In this paper, we propose a modeling methodology using Markov processes to capture hardwa... View full abstract»

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  • Analytical Models for Architecture-Based Software Reliability Prediction: A Unification Framework

    Publication Year: 2006, Page(s):578 - 590
    Cited by:  Papers (59)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (488 KB) | HTML iconHTML

    Traditional approaches to software reliability modeling are black box-based; that is, the software system is considered as a whole, and only its interactions with the outside world are modeled without looking into its internal structure. The black box approach is adequate to characterize the reliability of monolithic, custom, built-to-specification software applications. However, with the widespre... View full abstract»

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  • Confidence Intervals for Reliability and Quantile Functions With Application to NASA Space Flight Data

    Publication Year: 2006, Page(s):591 - 601
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (745 KB) | HTML iconHTML

    This paper considers the construction of confidence intervals for a cumulative distribution function F(z), and its inverse quantile function F-1(u), at some fixed points z, and u on the basis of an i.i.d. sample Xlowbar={Xi}i=1 n, where n is relatively small. The sample is modeled as having a flexible, generalized gamma distribution with all three parame... View full abstract»

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  • Circular Layout Cutsets: An Approach for Improving Consecutive Cutset Bounds for Network Reliability

    Publication Year: 2006, Page(s):602 - 612
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (457 KB) | HTML iconHTML

    In this paper, we introduce a new type of parameterized class of cutsets for the 2-terminal network reliability problem, called the circular layout (CL) cutsets with parameter k, and devise a polynomial time algorithm for computing upper bounds from such structures. The CL cutsets, and the devised bounding method are characterized by the following aspects. 1) CL cutsets include the well known clas... View full abstract»

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  • Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring

    Publication Year: 2006, Page(s):613 - 614
    Cited by:  Papers (26)
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  • 2006 Index

    Publication Year: 2006, Page(s):615 - 623
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  • Reliability Society to Offer Scholarships

    Publication Year: 2006, Page(s): 624
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  • IEEE Transactions on Reliability institutional listings

    Publication Year: 2006, Page(s): C3
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  • IEEE Transactions on Reliability institutional listings

    Publication Year: 2006, Page(s): C4
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu