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IEEE Design & Test of Computers

Issue 4 • April 2006

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  • [Front cover]

    Publication Year: 2006, Page(s): c1
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  • [Inside front cover]

    Publication Year: 2006, Page(s): c2
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  • IEEE Computer Society Celebrates Two 60-Year Anniversaries

    Publication Year: 2006, Page(s): 257
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  • Table of contents

    Publication Year: 2006, Page(s):258 - 259
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  • Masthead

    Publication Year: 2006, Page(s): 260
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  • Vision from the Top

    Publication Year: 2006, Page(s): 261
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  • Conference Reports

    Publication Year: 2006, Page(s):262 - 265
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  • Call for Award Nominations

    Publication Year: 2006, Page(s): 266
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  • Call for Papers: Special Issue on IR-Drop and Power Supply Noise Effects on Design and Test of Very Deep-Submicron Designs

    Publication Year: 2006, Page(s): 267
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  • On-Chip Testing Techniques for RF Wireless Transceivers

    Publication Year: 2006, Page(s):268 - 277
    Cited by:  Papers (43)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (163 KB) | HTML iconHTML

    This article describes a set of on-chip testing techniques and their application to integrated wireless RF transceivers. The objective is to reduce final product cost and accelerate time to market by providing means of testing the entire transceiver system as well as its major building blocks without using off-chip analog or RF instrumentation. On-chip test devices fabricated in a standard CMOS pr... View full abstract»

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  • Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method

    Publication Year: 2006, Page(s):278 - 293
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1340 KB) | HTML iconHTML

    Increasing leakage current makes single-threshold IDDQ testing ineffective for differentiating defective and detect-free chips. Quiescent-signal analysis is a new detection and diagnosis technique that uses IDDQ measurement at multiple chip supply ports, reducing the leakage component in each measurement and significantly improving detection of subtle detects. In this article, we apply linear regr... View full abstract»

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  • Survey of Test Vector Compression Techniques

    Publication Year: 2006, Page(s):294 - 303
    Cited by:  Papers (246)  |  Patents (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (136 KB) | HTML iconHTML

    Test data compression consists of test vector compression on the input side and response, compaction on the output side. This vector compression has been an active area of research. This article summarizes and categories these techniques. The focus is on hardware-based test vector compression techniques for scan architectures. Test vector compression schemes fall broadly into three categories: cod... View full abstract»

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  • Sociology of Design and EDA

    Publication Year: 2006, Page(s):304 - 310
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (79 KB) | HTML iconHTML

    The author addresses system-level design in a product introduction. It was a tool that allowed us to analyze an instruction stream being executed by embedded processors on a chip. The author describes the sociology of design and EDA. It's a very complex and perplexing ecosystem. We have the suppliers, the users, and we have a whole branch of areas that could benefit from automation of design tools View full abstract»

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  • IEEE Computer Society Information

    Publication Year: 2006, Page(s): 311
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  • IEEE Computer Society Membership Information

    Publication Year: 2006, Page(s): 312
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  • 2006 IEEE Computer Society Professional Membership/Subscription Application

    Publication Year: 2006, Page(s):313 - 314
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  • Panel Summaries: Real-Time Volume Diagnostics--Requirements and Challenges

    Publication Year: 2006, Page(s): 315
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  • Standards: The P1685 IP-XACT IP Metadata Standard

    Publication Year: 2006, Page(s):316 - 317
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (285 KB) | HTML iconHTML

    The paper aims to develop an XML-based standard for describing electronic intellectual property - that is, blocks of electronic logic suitable for inclusion in complex integrated circuits, commonly know as systems on chips (SoCs). This work, which is based on the Spirit Consortium's IP-XACT specification, has transferred to the IEEE for standardization. The IP-XACT specification provides a metadat... View full abstract»

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  • Book Reviews: Plumbing the Depths of Leakage

    Publication Year: 2006, Page(s):318 - 319
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  • Test Technology TC Newsletter

    Publication Year: 2006, Page(s):320 - 323
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  • CEDA Currents

    Publication Year: 2006, Page(s):322 - 325
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  • IEEE Computer Society Digital Library Packages for Institutions

    Publication Year: 2006, Page(s): 327
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  • Who Reads This Stuff Anyway?

    Publication Year: 2006, Page(s): 328
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  • [Back inside cover]

    Publication Year: 2006, Page(s): c3
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  • [Back cover]

    Publication Year: 2006, Page(s): c4
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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty