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Computer

Issue 10 • Date Oct. 1979

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Displaying Results 1 - 25 of 40
  • Computer

    Publication Year: 1979, Page(s): c1
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  • Another GE Power House...10 Amp Hour Sealed Lead Batteries from General Electric

    Publication Year: 1979, Page(s): c2
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  • Table of contents

    Publication Year: 1979, Page(s):1 - 2
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  • Special Message

    Publication Year: 1979, Page(s): 3
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  • About the cover

    Publication Year: 1979, Page(s): 4
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  • Test your EQ

    Publication Year: 1979, Page(s): 5
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  • From DeAnza Systems RGB Color and Monochrome Monitors with up to 1,000 Line Resolution

    Publication Year: 1979, Page(s): 6
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  • Hardware Test Technology

    Publication Year: 1979, Page(s):7 - 8
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2821 KB)

    The testing of digital systems has grown increasingly complex. LSI circuits, commonplace in today's systems, require thorough testing at the component level. VLSI adds even more complexity. How are these challenges being met? This special issue surveys the state-of-the-art and attempts to answer the question. View full abstract»

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  • Testing Logic Networks and Designing for Testability

    Publication Year: 1979, Page(s):9 - 21
    Cited by:  Papers (39)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (15176 KB)

    VLSI has brought exciting increases in circuit density and performance capability. But it has also aggravated the problem of chip, component and system testing. Here are some approaches to dealing with that problem. View full abstract»

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  • Call for Papers

    Publication Year: 1979, Page(s): 22
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  • Techniques for Memory Testing

    Publication Year: 1979, Page(s):23 - 31
    Cited by:  Papers (3)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (10715 KB)

    Semiconductor memory production relies hedvily on test technology. One testing technique—real-time bit mapping—offers more advantages than any other. View full abstract»

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  • Micro Datatizer™

    Publication Year: 1979, Page(s): 29
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  • The Effects of the Microelectronics Revolution on Systems and Board Test

    Publication Year: 1979, Page(s):32 - 38
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (9238 KB)

    Increasing device complexity has brought increased responsibility both for test engineers and design engineers: design engineers must create testable designs; test engineers must report testability problems back to the designers. View full abstract»

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  • Proceedings, 1979 International Conference on Parallel Processing

    Publication Year: 1979, Page(s): 39
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  • Automatic Analog Testing - 1979 Style

    Publication Year: 1979, Page(s):40 - 47
    Cited by:  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (11644 KB)

    The bewildering changes currently facing designers and users of analog test equipment are leading to new techniques and improved hardware that should reduce test time by a factor of four within the next decade. View full abstract»

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  • Call for Papers

    Publication Year: 1979, Page(s): 48
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  • Self-Testing Computers

    Publication Year: 1979, Page(s):49 - 59
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (12506 KB)

    Built-in-test techniques exploit hardware redundancy to provide continuous on-line monitoring of computer performance. Hardware's declining cost makes these techniques attractive, especially for modular computers. View full abstract»

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  • Tutorial Week79

    Publication Year: 1979, Page(s): 56
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  • Sixth Data Communications Symposium — 1979

    Publication Year: 1979, Page(s): 60
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  • Microdare Special Feature Microdare: A Fast, Direct-Executing High-level Language System for Small Computers

    Publication Year: 1979, Page(s):61 - 71
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (15124 KB)

    Embedded in an advanced Basic dialect, this system promises to simplify end-user applications in areas such as simulation and laboratory automation. View full abstract»

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  • Call for Papers

    Publication Year: 1979, Page(s):72 - 73
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  • 1979 International Micro & Mini Computer Conference

    Publication Year: 1979, Page(s): 74
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  • Special Feature Learning with Computer Simulations

    Publication Year: 1979, Page(s):75 - 84
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (9759 KB)

    For successful classroom use, simulations must be integrated with other educational materials. The examples and methods described here have all been used in large introductory courses. View full abstract»

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  • 1980-1981 IEEE Computer Society Scholarships for Members of Student Branch Chapters of the Computer Society

    Publication Year: 1979, Page(s):85 - 86
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  • The Open Channel

    Publication Year: 1979, Page(s):87 - 88
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Aims & Scope

Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed articles written for and by computer researchers and practitioners representing the full spectrum of computing and information technology, from hardware to software and from emerging research to new applications. 

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Sumi Helal
University of Florida
sumi.helal@gmail.com