Issue 3 • Date March 2006
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Displaying Results 1 - 25 of 26
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Table of contents
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PDF (54 KB)
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IEEE Electron Device Letters publication information
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PDF (42 KB)
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Changes to the Editorial Board
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PDF (126 KB)
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Dual junction GaInP/GaAs solar cells grown on metamorphic SiGe/Si substrates with high open circuit voltage
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PDF (216 KB)
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Metal gate-HfO/sub 2/ MOS structures on GaAs substrate with and without Si interlayer
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PDF (148 KB)
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Memory performance of a thin-film device based on a conjugated copolymer containing fluorene and chelated europium complex
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PDF (176 KB)
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Charge trapping and degradation of HfO2/SiO2 MOS gate stacks observed with enhanced CAFM
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PDF (152 KB)
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Study of the hydrogenation mechanism by rapid thermal anneal of SiN:H in thin-film polycrystalline-silicon solar cells
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PDF (89 KB)
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Reliable extraction of cycling induced interface states implementing realistic P/E stresses in reference cell: comparison with flash memory cell
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PDF (149 KB)
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Temperature effects on trigate SOI MOSFETs
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PDF (112 KB)
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Hole mobility enhancement of pMOSFETs with strain channel induced by Ge pre-amorphization implantation for source/drain extension
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PDF (200 KB)
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An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature
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PDF (216 KB)
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Co-optimization of the metal gate/high-k stack to achieve high-field mobility >90% of SiO2 universal mobility with an EOT=∼1 nm
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PDF (744 KB)
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On the generation and recovery of hot carrier induced interface traps: a critical examination of the 2-D R-D model
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PDF (136 KB)
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Strained ultrahigh performance fully depleted nMOSFETs with ft of 330 GHz and sub-30-nm gate lengths
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PDF (208 KB)
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Exploration of a double-tapered disc-loaded circular waveguide for a wideband gyro-TWT
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PDF (160 KB)
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Corrections to "200-mm Wafer Scale Transfer of 0.18
m Dual-Damascene Cu/SiO
Interconnection System to Plastic Substrates"
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PDF (23 KB)
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IEEE Electron Devices Society meetings calendar for 2005
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PDF (1031 KB)
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IEEE Electron Device Letters Information for authors
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PDF (38 KB)
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Special issue on spintronics
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PDF (194 KB)
Aims & Scope
IEEE Electron Device Letters contains articles related to the theory, design, performance and reliability of electron devices.
Meet Our Editors
Editor-in-Chief
Yuan Taur
University of California at San Diego, ECE


